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We present a complementary metal-oxide-semiconductor (CMOS)-based platform\u2014ITEMS (Integrated Time-of-Evaporation Measurement System)\u2014designed to monitor binary mixtures via high-resolution capacitive sensing of evaporation dynamics. ITEMS employs an integrated capacitive sensor to detect time-resolved dielectric changes during droplet evaporation under controlled temperatures. By extracting features such as intermediate evaporation time (\u0394t\u2082), total evaporation time (ToE), and capacitance variation (\u0394Cap), ITEMS provides multidimensional insights into solvent composition. We validated the system across ethanol\u2013water, methanol\u2013water, and methanol\u2013ethanol mixtures, with concentrations from 0 to 100% and temperatures between 25\u00a0\u00b0C and 60\u00a0\u00b0C. Our analysis reveals that evaporation time and dielectric response exhibit nonlinear dependencies on solvent concentration, particularly at elevated temperatures. Comparative modeling using linear regression and LOESS confirms LOESS\u2019s superiority in capturing these trends, yielding lower Root Mean Square Error (RMSE) values across all datasets. The CMOS integration enables compact packaging, low sample volume requirements (&lt;\u20091\u202f\u03bcL), and direct digital interfacing via a microcontroller and graphical user interface (GUI). 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