{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,11,13]],"date-time":"2026-11-13T04:59:44Z","timestamp":1794545984635,"version":"4.9.1"},"reference-count":63,"publisher":"Springer Science and Business Media LLC","issue":"1","license":[{"start":{"date-parts":[[2026,2,18]],"date-time":"2026-02-18T00:00:00Z","timestamp":1771372800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0"},{"start":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T00:00:00Z","timestamp":1774310400000},"content-version":"vor","delay-in-days":34,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0"}],"funder":[{"name":"Higher Education Key Scientific Research Program Funded of by Henan Province","award":["24A520008"],"award-info":[{"award-number":["24A520008"]}]},{"name":"Doctoral Cultivation Fund Project of Henan University of Engineering","award":["D2022030 and D2022032"],"award-info":[{"award-number":["D2022030 and D2022032"]}]},{"name":"Henan Province Science and Technology Research Projects","award":["232102210118.6"],"award-info":[{"award-number":["232102210118.6"]}]}],"content-domain":{"domain":["link.springer.com"],"crossmark-restriction":false},"short-container-title":["Sci Rep"],"DOI":"10.1038\/s41598-026-40568-6","type":"journal-article","created":{"date-parts":[[2026,2,18]],"date-time":"2026-02-18T12:56:26Z","timestamp":1771419386000},"update-policy":"https:\/\/doi.org\/10.1007\/springer_crossmark_policy","source":"Crossref","is-referenced-by-count":1,"title":["MFDH-Net: defect detection network for multi-level feature fusion and cross-sensing decoupling head"],"prefix":"10.1038","volume":"16","author":[{"given":"Laomo","family":"Zhang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zeyu","family":"Yang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ying","family":"Ma","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tianrui","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guowei","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shilong","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tingrui","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"297","published-online":{"date-parts":[[2026,2,18]]},"reference":[{"key":"40568_CR1","doi-asserted-by":"publisher","DOI":"10.3390\/app11167657","volume":"11","author":"Y Chen","year":"2021","unstructured":"Chen, Y. et al. Surface defect detection methods for industrial products: A review. Appl. Sci. 11, 7657 (2021).","journal-title":"Appl. Sci."},{"key":"40568_CR2","doi-asserted-by":"crossref","unstructured":"Enoiu, E., Sundmark, D., \u010cau\u0161evi\u010d, A. & Pettersson, P. A comparative study of manual and automated testing for industrial control software. 2017 IEEE International Conference On Software Testing, Verification And Validation (ICST). 412\u2013417 (2017).","DOI":"10.1109\/ICST.2017.44"},{"key":"40568_CR3","doi-asserted-by":"publisher","first-page":"753","DOI":"10.1016\/j.jmsy.2021.05.008","volume":"62","author":"Y Gao","year":"2022","unstructured":"Gao, Y., Li, X., Wang, X., Wang, L. & Gao, L. A review on recent advances in vision-based defect recognition towards industrial intelligence. J. Manuf. Syst. 62, 753\u2013766 (2022).","journal-title":"J. Manuf. Syst."},{"key":"40568_CR4","doi-asserted-by":"publisher","DOI":"10.1016\/j.compind.2023.103911","volume":"148","author":"S Jha","year":"2023","unstructured":"Jha, S. & Babiceanu, R. Deep CNN-based visual defect detection: Survey of current literature. Comput. Ind. 148, 103911 (2023).","journal-title":"Comput. Ind."},{"key":"40568_CR5","doi-asserted-by":"publisher","first-page":"1066","DOI":"10.1016\/j.procs.2022.01.135","volume":"199","author":"P Jiang","year":"2022","unstructured":"Jiang, P., Ergu, D., Liu, F., Cai, Y. & Ma, B. A review of Yolo algorithm developments. Procedia Comput. Sci. 199, 1066\u20131073 (2022).","journal-title":"Procedia Comput. Sci."},{"key":"40568_CR6","unstructured":"Zhu, X., et al. Deformable detr: Deformable transformers for end-to-end object detection. arXiv Preprint ArXiv:2010.04159. (2020)."},{"key":"40568_CR7","doi-asserted-by":"crossref","unstructured":"Girshick, R. Fast r-cnn. Proceedings Of The IEEE International Conference On Computer Vision.\u00a01440\u20131448 (2015).","DOI":"10.1109\/ICCV.2015.169"},{"key":"40568_CR8","doi-asserted-by":"crossref","unstructured":"He, K., Gkioxari, G., Doll\u00e1r, P. & Girshick, R. Mask r-cnn. Proceedings Of The IEEE International Conference On Computer Vision. 2961\u20132969 (2017).","DOI":"10.1109\/ICCV.2017.322"},{"key":"40568_CR9","unstructured":"Vaswani, A., et al. Attention is all you need. Advances In Neural Information Processing Systems. 30, (2017)."},{"key":"40568_CR10","doi-asserted-by":"publisher","DOI":"10.1109\/access.2024.3374869","author":"C Li","year":"2024","unstructured":"Li, C., Xu, A., Zhang, Q. & Cai, Y. Steel surface defect detection method based on improved YOLOX. IEEE Access https:\/\/doi.org\/10.1109\/access.2024.3374869 (2024).","journal-title":"IEEE Access"},{"key":"40568_CR11","doi-asserted-by":"publisher","first-page":"1093","DOI":"10.1007\/s00170-023-11087-9","volume":"126","author":"F Akhyar","year":"2023","unstructured":"Akhyar, F., Liu, Y., Hsu, C., Shih, T. & Lin, C. FDD: A deep learning\u2013based steel defect detectors. Int. J. Adv. Manuf. Technol. 126, 1093\u20131107 (2023).","journal-title":"Int. J. Adv. Manuf. Technol."},{"key":"40568_CR12","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.101882","volume":"55","author":"H Shang","year":"2023","unstructured":"Shang, H., Sun, C., Liu, J., Chen, X. & Yan, R. Defect-aware transformer network for intelligent visual surface defect detection. Adv. Eng. Inform. 55, 101882 (2023a).","journal-title":"Adv. Eng. Inform."},{"key":"40568_CR13","doi-asserted-by":"crossref","unstructured":"Zhihui, L. & Liqiang, W. Defect Detection of Photovoltaic Cells Based on an Improved YOLOv8. International Journal Of Advanced Computer Science Applications. 16, (2025).","DOI":"10.14569\/IJACSA.2025.0160349"},{"key":"40568_CR14","doi-asserted-by":"publisher","first-page":"565","DOI":"10.1007\/s12559-022-10061-z","volume":"15","author":"Y Xie","year":"2023","unstructured":"Xie, Y., Hu, W., Xie, S. & He, L. Surface defect detection algorithm based on feature-enhanced YOLO. Cogn. Comput. 15, 565\u2013579 (2023).","journal-title":"Cogn. Comput."},{"key":"40568_CR15","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2023.121726","volume":"238","author":"J Tang","year":"2024","unstructured":"Tang, J. et al. A lightweight surface defect detection framework combined with dual-domain attention mechanism. Expert Systems With Applications. 238, 121726 (2024).","journal-title":"Expert Systems With Applications."},{"key":"40568_CR16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112614","volume":"211","author":"J Wang","year":"2023","unstructured":"Wang, J., Xu, G., Yan, F., Wang, J. & Wang, Z. Defect transformer: An efficient hybrid transformer architecture for surface defect detection. Measurement 211, 112614 (2023).","journal-title":"Measurement"},{"key":"40568_CR17","volume":"38","author":"F Guo","year":"2024","unstructured":"Guo, F., Liu, J., Qian, Y. & Xie, Q. Rail surface defect detection using a transformer-based network. J. Ind. Inf. Integr. 38, 100584 (2024).","journal-title":"J. Ind. Inf. Integr."},{"key":"40568_CR18","doi-asserted-by":"publisher","first-page":"56","DOI":"10.20544\/HORIZONS.B.04.1.17.P05","volume":"4","author":"V Nasteski","year":"2017","unstructured":"Nasteski, V. An overview of the supervised machine learning methods. Horizons. B. 4, 56 (2017).","journal-title":"Horizons. B."},{"key":"40568_CR19","doi-asserted-by":"publisher","first-page":"81","DOI":"10.48161\/qaj.v1n2a50","volume":"1","author":"D Abdullah","year":"2021","unstructured":"Abdullah, D. & Abdulazeez, A. Machine learning applications based on SVM classification a review. Qubahan Acad. J. 1, 81\u201390 (2021).","journal-title":"Qubahan Acad. J."},{"key":"40568_CR20","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112776","volume":"214","author":"C Zhao","year":"2023","unstructured":"Zhao, C., Shu, X., Yan, X., Zuo, X. & Zhu, F. RDD-YOLO: A modified YOLO for detection of steel surface defects. Measurement 214, 112776 (2023).","journal-title":"Measurement"},{"key":"40568_CR21","first-page":"1","volume":"73","author":"M Yuan","year":"2024","unstructured":"Yuan, M. et al. YOLO-HMC: An improved method for PCB surface defect detection. IEEE Transactions On Instrumentation And Measurement. 73, 1\u201311 (2024a).","journal-title":"IEEE Transactions On Instrumentation And Measurement."},{"key":"40568_CR22","doi-asserted-by":"publisher","DOI":"10.1115\/1.4063860","volume":"24","author":"Y Wang","year":"2024","unstructured":"Wang, Y., Wang, X., Hao, R., Lu, B. & Huang, B. Metal surface defect detection method based on improved cascade r.-cnn. Journal Of Computing And Information Science In Engineering 24, 041002 (2024).","journal-title":"Journal Of Computing And Information Science In Engineering"},{"key":"40568_CR23","volume":"2002","author":"J Fan","year":"2021","unstructured":"Fan, J., Ling, X. & Liang, J. Detection of surface defects of steel plate based on vit. Journal Of Physics: Conference Series. 2002, 012039 (2021).","journal-title":"Journal Of Physics: Conference Series."},{"key":"40568_CR24","doi-asserted-by":"publisher","first-page":"166","DOI":"10.1109\/TCPMT.2023.3344096","volume":"14","author":"Y Liu","year":"2023","unstructured":"Liu, Y. & Wu, H. Automatic solder defect detection in electronic components using transformer architecture. IEEE Trans. Compon. Packag. Manuf. Technol. 14, 166\u2013175 (2023).","journal-title":"IEEE Trans. Compon. Packag. Manuf. Technol."},{"key":"40568_CR25","doi-asserted-by":"publisher","first-page":"4863","DOI":"10.1109\/JSEN.2023.3346470","volume":"24","author":"H Liu","year":"2024","unstructured":"Liu, H. et al. CGTD-net: Channel-wise global transformer-based dual-branch network for industrial strip steel surface defect detection. IEEE Sens. J. 24, 4863\u20134873 (2024).","journal-title":"IEEE Sens. J."},{"key":"40568_CR26","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ae140a","author":"S Li","year":"2025","unstructured":"Li, S., Chen, Z., Zhang, X., Yang, T. & Gong, D. STCNet: A hybrid Transformer and CNN network for surface defect detection of steel continuous casting billets. Meas. Sci. Technol. https:\/\/doi.org\/10.1088\/1361-6501\/ae140a (2025).","journal-title":"Meas. Sci. Technol."},{"key":"40568_CR27","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2025.3540846","author":"J He","year":"2025","unstructured":"He, J. et al. Multi-scale CNN-transformer hybrid network for rail fastener defect detection. IEEE Trans. Intell. Transp. Syst. https:\/\/doi.org\/10.1109\/TITS.2025.3540846 (2025).","journal-title":"IEEE Trans. Intell. Transp. Syst."},{"key":"40568_CR28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2025.3589704","author":"C Guo","year":"2025","unstructured":"Guo, C. et al. MCTNet: Defect detection in Aluminum alloy die-casting using a multi-level CNN-Transformer interaction network. IEEE Trans. Instrum. Meas. https:\/\/doi.org\/10.1109\/TIM.2025.3589704 (2025).","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"40568_CR29","first-page":"1","volume":"73","author":"M Yuan","year":"2024","unstructured":"Yuan, M. et al. YOLO-HMC: An improved method for PCB surface defect detection. IEEE Transactions On Instrumentation And Measurement. 73, 1\u201311 (2024b).","journal-title":"IEEE Transactions On Instrumentation And Measurement."},{"key":"40568_CR30","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0280363","volume":"18","author":"L Wang","year":"2023","unstructured":"Wang, L., Huang, X. & Zheng, Z. Surface defect detection method for electronic panels based on attention mechanism and dual detection heads. PLoS One 18, e0280363 (2023).","journal-title":"PLoS One"},{"key":"40568_CR31","first-page":"1","volume":"73","author":"Y Zhao","year":"2024","unstructured":"Zhao, Y. et al. Attention-based multiscale feature fusion for efficient surface defect detection. IEEE Transactions On Instrumentation And Measurement. 73, 1\u201310 (2024a).","journal-title":"IEEE Transactions On Instrumentation And Measurement."},{"key":"40568_CR32","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ad296d","volume":"35","author":"W Xie","year":"2024","unstructured":"Xie, W., Sun, X. & Ma, W. A light weight multi-scale feature fusion steel surface defect detection model based on YOLOv8. Meas. Sci. Technol. 35, 055017 (2024).","journal-title":"Meas. Sci. Technol."},{"key":"40568_CR33","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2024.103073","volume":"64","author":"H Xiao","year":"2025","unstructured":"Xiao, H. et al. WFF-Net: Trainable weight feature fusion convolutional neural networks for surface defect detection. Adv. Eng. Inform. 64, 103073 (2025).","journal-title":"Adv. Eng. Inform."},{"key":"40568_CR34","doi-asserted-by":"publisher","DOI":"10.1109\/TITS.2024.3421331","author":"M Ma","year":"2024","unstructured":"Ma, M., Yang, L., Liu, Y. & Yu, H. A transformer-based network with feature complementary fusion for crack defect detection. IEEE Trans. Intell. Transp. Syst. https:\/\/doi.org\/10.1109\/TITS.2024.3421331 (2024).","journal-title":"IEEE Trans. Intell. Transp. Syst."},{"key":"40568_CR35","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.107677","volume":"130","author":"G Li","year":"2024","unstructured":"Li, G., Zhao, S., Li, M., Zhou, M. & Ying, Z. IDP-Net: Industrial defect perception network based on cross-layer semantic information guidance and context concentration enhancement. Eng. Appl. Artif. Intell. 130, 107677 (2024).","journal-title":"Eng. Appl. Artif. Intell."},{"key":"40568_CR36","doi-asserted-by":"crossref","unstructured":"Han, K., et al. Ghostnet: More features from cheap operations. Proceedings Of The IEEE\/CVF Conference On Computer Vision And Pattern Recognition. 1580\u20131589 (2020).","DOI":"10.1109\/CVPR42600.2020.00165"},{"key":"40568_CR37","doi-asserted-by":"crossref","unstructured":"Lin, T., et al. Feature pyramid networks for object detection. Proceedings Of The IEEE Conference On Computer Vision And Pattern Recognition. 2117\u20132125 (2017).","DOI":"10.1109\/CVPR.2017.106"},{"key":"40568_CR38","doi-asserted-by":"crossref","unstructured":"Liu, S., Qi, L., Qin, H., Shi, J. & Jia, J. Path aggregation network for instance segmentation. Proceedings Of The IEEE Conference On Computer Vision And Pattern Recognition. 8759\u20138768 (2018).","DOI":"10.1109\/CVPR.2018.00913"},{"key":"40568_CR39","doi-asserted-by":"crossref","unstructured":"Tan, M., Pang, R. & Le, Q. Efficientdet: Scalable and efficient object detection. Proceedings Of The IEEE\/CVF Conference On Computer Vision And Pattern Recognition. 10781\u201310790 (2020).","DOI":"10.1109\/CVPR42600.2020.01079"},{"key":"40568_CR40","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.107134","volume":"126","author":"S Zhao","year":"2023","unstructured":"Zhao, S., Li, G., Zhou, M. & Li, M. ICA-Net: Industrial defect detection network based on convolutional attention guidance and aggregation of multiscale features. Eng. Appl. Artif. Intell. 126, 107134 (2023).","journal-title":"Eng. Appl. Artif. Intell."},{"key":"40568_CR41","first-page":"1","volume":"73","author":"Y Zhao","year":"2024","unstructured":"Zhao, Y. et al. Attention-based multiscale feature fusion for efficient surface defect detection. IEEE Transactions On Instrumentation And Measurement. 73, 1\u201310 (2024b).","journal-title":"IEEE Transactions On Instrumentation And Measurement."},{"key":"40568_CR42","doi-asserted-by":"crossref","unstructured":"Koonce, B. MobileNetV3. Convolutional Neural Networks With Swift For Tensorflow: Image Recognition And Dataset Categorization. In Convolutional Neural Networks with Swift for Tensorflow: Image Recognition and Dataset Categorization 125\u2013144 (2021).","DOI":"10.1007\/978-1-4842-6168-2_11"},{"key":"40568_CR43","doi-asserted-by":"crossref","unstructured":"Wan, W., Zhong, Y., Li, T. & Chen, J. Rethinking feature distribution for loss functions in image classification. Proceedings Of The IEEE Conference On Computer Vision And Pattern Recognition. 9117\u20139126 (2018).","DOI":"10.1109\/CVPR.2018.00950"},{"key":"40568_CR44","doi-asserted-by":"publisher","first-page":"146","DOI":"10.1016\/j.neucom.2022.07.042","volume":"506","author":"Y Zhang","year":"2022","unstructured":"Zhang, Y. et al. Focal and efficient IOU loss for accurate bounding box regression. Neurocomputing 506, 146\u2013157 (2022).","journal-title":"Neurocomputing"},{"key":"40568_CR45","unstructured":"Northeast University. http:\/\/faculty.neu.edu.cn\/songkechen\/zh-CN\/zhym\/263269\/list\/index.htm."},{"key":"40568_CR46","doi-asserted-by":"crossref","unstructured":"Varghese, R. & Sambath, M. Yolov8: A novel object detection algorithm with enhanced performance and robustness. 2024 International Conference On Advances In Data Engineering And Intelligent Computing Systems (ADICS).\u00a0 1\u20136 (2024).","DOI":"10.1109\/ADICS58448.2024.10533619"},{"key":"40568_CR47","unstructured":"Ge, Z., Liu, S., Wang, F., Li, Z. & Sun, J. Yolox: Exceeding yolo series in 2021. arXiv Preprint ArXiv:2107.08430. (2021)."},{"key":"40568_CR48","doi-asserted-by":"crossref","unstructured":"Dai, X., et al. Dynamic head: Unifying object detection heads with attentions. Proceedings Of The IEEE\/CVF Conference On Computer Vision And Pattern Recognition.\u00a07373\u20137382 (2021).","DOI":"10.1109\/CVPR46437.2021.00729"},{"key":"40568_CR49","doi-asserted-by":"crossref","unstructured":"Lin, T., Goyal, P., Girshick, R., He, K. & Doll\u00e1r, P. Focal loss for dense object detection. Proceedings Of The IEEE International Conference On Computer Vision. 2980\u20132988 (2017).","DOI":"10.1109\/ICCV.2017.324"},{"key":"40568_CR50","unstructured":"Jocher, G., et al. ultralytics\/yolov5: v3. 0. Zenodo. (2020)."},{"key":"40568_CR51","unstructured":"Xu, S., et al. PP-YOLOE: An evolved version of YOLO. arXiv Preprint ArXiv:2203.16250. (2022)."},{"key":"40568_CR52","doi-asserted-by":"publisher","first-page":"1137","DOI":"10.1109\/TPAMI.2016.2577031","volume":"39","author":"S Ren","year":"2016","unstructured":"Ren, S., He, K., Girshick, R. & Sun, J. Faster R-CNN: Towards real-time object detection with region proposal networks. IEEE Transactions On Pattern Analysis And Machine Intelligence 39, 1137\u20131149 (2016).","journal-title":"IEEE Transactions On Pattern Analysis And Machine Intelligence"},{"key":"40568_CR53","unstructured":"Cai, H., Li, J., Hu, M., Gan, C. & Han, S. Efficientvit: Multi-scale linear attention for high-resolution dense prediction. arXiv Preprint ArXiv:2205.14756. (2022)."},{"key":"40568_CR54","unstructured":"Tian, Y., Ye, Q. & Doermann, D. Yolov12: Attention-centric real-time object detectors. arXiv Preprint ArXiv:2502.12524. (2025)."},{"key":"40568_CR55","unstructured":"Li, J., et al. Next-vit: Next generation vision transformer for efficient deployment in realistic industrial scenarios. arXiv Preprint ArXiv:2207.05501. (2022)."},{"key":"40568_CR56","doi-asserted-by":"crossref","unstructured":"Zhao, Y., et al. Detrs beat yolos on real-time object detection. Proceedings Of The IEEE\/CVF Conference On Computer Vision And Pattern Recognition. 16965\u201316974 (2024).","DOI":"10.1109\/CVPR52733.2024.01605"},{"key":"40568_CR57","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.101882","volume":"55","author":"H Shang","year":"2023","unstructured":"Shang, H., Sun, C., Liu, J., Chen, X. & Yan, R. Defect-aware transformer network for intelligent visual surface defect detection. Adv. Eng. Inform. 55, 101882 (2023b).","journal-title":"Adv. Eng. Inform."},{"key":"40568_CR58","unstructured":"Zhu, X., et al. Deformable detr: Deformable transformers for end-to-end object detection. arXiv Preprint ArXiv:2010.04159. (2020)."},{"key":"40568_CR59","unstructured":"Beijing University, P., PKU-Market-PCB. https:\/\/robotics.pkusz.edu.cn\/re-sources\/dataset."},{"key":"40568_CR60","doi-asserted-by":"crossref","unstructured":"He, K., Zhang, X., Ren, S. & Sun, J. Deep residual learning for image recognition. Proceedings Of The IEEE Conference On Computer Vision And Pattern Recognition. 770\u2013778 (2016).","DOI":"10.1109\/CVPR.2016.90"},{"key":"40568_CR61","doi-asserted-by":"crossref","unstructured":"Liu, Z., et al. A convnet for the 2020s. Proceedings Of The IEEE\/CVF Conference On Computer Vision And Pattern Recognition. 11976\u201311986 (2022).","DOI":"10.1109\/CVPR52688.2022.01167"},{"key":"40568_CR62","unstructured":"Mehta, S. & Rastegari, M. Mobilevit: light-weight, general-purpose, and mobile-friendly vision transformer. arXiv Preprint ArXiv:2110.02178. (2021)."},{"key":"40568_CR63","volume":"2218","author":"K Wang","year":"2022","unstructured":"Wang, K., Teng, Z. & Zou, T. Metal defect detection based on Yolov5. Journal Of Physics: Conference Series. 2218, 012050 (2022).","journal-title":"Journal Of Physics: Conference Series."}],"container-title":["Scientific Reports"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.nature.com\/articles\/s41598-026-40568-6","content-type":"text\/html","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/www.nature.com\/articles\/s41598-026-40568-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/www.nature.com\/articles\/s41598-026-40568-6.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T09:58:39Z","timestamp":1774346319000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.nature.com\/articles\/s41598-026-40568-6"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2,18]]},"references-count":63,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2026,12]]}},"alternative-id":["40568"],"URL":"https:\/\/doi.org\/10.1038\/s41598-026-40568-6","relation":{},"ISSN":["2045-2322"],"issn-type":[{"value":"2045-2322","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2,18]]},"assertion":[{"value":"14 October 2025","order":1,"name":"received","label":"Received","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"13 February 2026","order":2,"name":"accepted","label":"Accepted","group":{"name":"ArticleHistory","label":"Article History"}},{"value":"18 February 2026","order":3,"name":"first_online","label":"First Online","group":{"name":"ArticleHistory","label":"Article History"}},{"order":1,"name":"Ethics","group":{"name":"EthicsHeading","label":"Declarations"}},{"value":"The authors declare no competing interests.","order":2,"name":"Ethics","group":{"name":"EthicsHeading","label":"Competing interests"}}],"article-number":"9750"}}