{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T03:50:29Z","timestamp":1783914629004,"version":"3.55.0"},"reference-count":44,"publisher":"Royal Society of Chemistry (RSC)","issue":"1","license":[{"start":{"date-parts":[[2021,11,24]],"date-time":"2021-11-24T00:00:00Z","timestamp":1637712000000},"content-version":"vor","delay-in-days":0,"URL":"http:\/\/creativecommons.org\/licenses\/by\/3.0\/"}],"funder":[{"DOI":"10.13039\/100010665","name":"H2020 Marie Sk\u0142odowska-Curie Actions","doi-asserted-by":"publisher","award":["101022257"],"award-info":[{"award-number":["101022257"]}],"id":[{"id":"10.13039\/100010665","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001711","name":"Schweizerischer Nationalfonds zur F\u00f6rderung der Wissenschaftlichen Forschung","doi-asserted-by":"publisher","award":["BSCGI0-157705"],"award-info":[{"award-number":["BSCGI0-157705"]}],"id":[{"id":"10.13039\/501100001711","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["rsc.org"],"crossmark-restriction":true},"short-container-title":["Phys. Chem. Chem. Phys."],"abstract":"<jats:p>\n                    Raman tensor of zinc phosphide (Zn\n                    <jats:sub>3<\/jats:sub>\n                    P\n                    <jats:sub>2<\/jats:sub>\n                    ) is determined using angle-resolved polarization Raman measurements and first principles calculations. These results provide a platform for future characterization of the defects in this material.\n                  <\/jats:p>","DOI":"10.1039\/d1cp04322f","type":"journal-article","created":{"date-parts":[[2021,11,24]],"date-time":"2021-11-24T09:20:45Z","timestamp":1637745645000},"page":"63-72","update-policy":"https:\/\/doi.org\/10.1039\/rsc_crossmark_policy","source":"Crossref","is-referenced-by-count":10,"title":["Raman tensor of zinc-phosphide (Zn\n                    <sub>3<\/sub>\n                    P\n                    <sub>2<\/sub>\n                    ): from polarization measurements to simulation of Raman spectra"],"prefix":"10.1039","volume":"24","author":[{"given":"Mischa","family":"Fl\u00f3r","sequence":"first","affiliation":[{"name":"Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1079-8063","authenticated-orcid":false,"given":"Elias Z.","family":"Stutz","sequence":"additional","affiliation":[{"name":"Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Santhanu P.","family":"Ramanandan","sequence":"additional","affiliation":[{"name":"Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mahdi","family":"Zamani","sequence":"additional","affiliation":[{"name":"Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Rajrupa","family":"Paul","sequence":"additional","affiliation":[{"name":"Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jean-Baptiste","family":"Leran","sequence":"additional","affiliation":[{"name":"Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Alexander P.","family":"Litvinchuk","sequence":"additional","affiliation":[{"name":"Texas Center for Superconductivity and Department of Physics, University of Houston, Houston, Texas 77204-5002, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5070-2196","authenticated-orcid":false,"given":"Anna","family":"Fontcuberta i Morral","sequence":"additional","affiliation":[{"name":"Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"},{"name":"Institute of Physics, Faculty of Basic Sciences, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9439-1019","authenticated-orcid":false,"given":"Mirjana","family":"Dimitrievska","sequence":"additional","affiliation":[{"name":"Laboratory of Semiconductor Materials, Institute of Materials, Faculty of Engineering, Ecole Polytechnique F\u00e9d\u00e9rale de Lausanne, 1015 Lausanne, Switzerland"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"292","published-online":{"date-parts":[[2022]]},"reference":[{"key":"D1CP04322F\/cit1\/1","doi-asserted-by":"crossref","first-page":"11","DOI":"10.1016\/0040-6090(93)90400-J","volume":"229","author":"Bryja","year":"1993","journal-title":"Thin Solid Films"},{"key":"D1CP04322F\/cit2\/1","doi-asserted-by":"crossref","first-page":"xxiii","DOI":"10.1016\/0026-2692(94)90078-7","volume":"25","author":"Misiewicz","year":"1994","journal-title":"Microelectron. 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