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Phys."],"abstract":"<jats:p>\n                    First-principles calculations are used to comparatively reveal the fundamental effects of tensile strain on the effective mass, deformation potential, and carrier mobility of monolayer MoS\n                    <jats:sub>2<\/jats:sub>\n                    .\n                  <\/jats:p>","DOI":"10.1039\/d6cp03048c","type":"journal-article","created":{"date-parts":[[2026,10,6]],"date-time":"2026-10-06T07:16:53Z","timestamp":1791271013000},"update-policy":"https:\/\/doi.org\/10.1039\/rsc_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Fundamental effect of strain on carrier mobility in monolayer MoS\n                    <sub>2<\/sub>"],"prefix":"10.1039","author":[{"given":"Jiangtao","family":"Zheng","sequence":"first","affiliation":[{"name":"School of Electronic and Electrical Engineering, Zhaoqing University, Zhaoqing, Guangdong, 526061, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jianbo","family":"Jin","sequence":"additional","affiliation":[{"name":"School of Mechanical and Electrical Engineering, Hubei Polytechnic Institute, Xiaogan 432000, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6888-7099","authenticated-orcid":false,"given":"Liucheng","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electronic and Electrical Engineering, Zhaoqing University, Zhaoqing, Guangdong, 526061, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zhiyong","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Electronic and Electrical Engineering, Zhaoqing University, Zhaoqing, Guangdong, 526061, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shengfeng","family":"Zhou","sequence":"additional","affiliation":[{"name":"Institute of advanced wear & corrosion resistance and functional materials, Jinan university, Guangzhou, 510632, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"292","published-online":{"date-parts":[[2026]]},"reference":[{"key":"D6CP03048C\/cit1\/1","doi-asserted-by":"crossref","first-page":"502","DOI":"10.3390\/ma11040502","volume":"11","author":"Pang","year":"2018","journal-title":"Materials"},{"key":"D6CP03048C\/cit2\/1","doi-asserted-by":"crossref","first-page":"29645","DOI":"10.1039\/C9RA06770A","volume":"9","author":"Sojkov\u00e1","year":"2019","journal-title":"RSC Adv."},{"key":"D6CP03048C\/cit3\/1","doi-asserted-by":"crossref","first-page":"2837","DOI":"10.3390\/nano13212837","volume":"13","author":"\u0160pankov\u00e1","year":"2023","journal-title":"Nanomaterials"},{"key":"D6CP03048C\/cit4\/1","doi-asserted-by":"crossref","first-page":"6623","DOI":"10.1021\/acsomega.0c05274","volume":"6","author":"Joseph","year":"2021","journal-title":"ACS Omega"},{"key":"D6CP03048C\/cit5\/1","doi-asserted-by":"crossref","first-page":"4414","DOI":"10.1021\/acsnano.3c10495","volume":"18","author":"Shin","year":"2024","journal-title":"ACS Nano"},{"key":"D6CP03048C\/cit6\/1","doi-asserted-by":"crossref","first-page":"e09170","DOI":"10.1002\/advs.202509170","volume":"12","author":"Sim","year":"2025","journal-title":"Adv. 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