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Conductance shows an Ohmic-to-trap-limited crossover, while interfacial O-ion-mediated charge transfer is confirmed by DFT.\n                  <\/jats:p>","DOI":"10.1039\/d6mh01142j","type":"journal-article","created":{"date-parts":[[2026,9,17]],"date-time":"2026-09-17T17:23:24Z","timestamp":1789665804000},"update-policy":"https:\/\/doi.org\/10.1039\/rsc_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Interfacial gating of nano-ampere resistive switching in Si\/SiO\n                    <sub>\n                      <i>x<\/i>\n                    <\/sub>\n                    \/ZnO heterostructures for energy-efficient electronics"],"prefix":"10.1039","author":[{"given":"Satyasiban","family":"Dash","sequence":"first","affiliation":[{"name":"Department of Physics, Nanoscale Physics Laboratory, Indian Institute of Technology Madras, Chennai 600036, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2020-3812","authenticated-orcid":false,"given":"Prahallad","family":"Padhan","sequence":"additional","affiliation":[{"name":"Department of Physics, Nanoscale Physics Laboratory, Indian Institute of Technology Madras, Chennai 600036, India"},{"name":"Functional Oxides Research Group, Indian Institute of Technology Madras, Chennai 600036, India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"292","published-online":{"date-parts":[[2026]]},"reference":[{"key":"D6MH01142J\/cit1\/1","doi-asserted-by":"crossref","first-page":"5584","DOI":"10.1021\/acs.chemrev.4c00845","volume":"125","author":"Ielmini","year":"2025","journal-title":"Chem. 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