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C"],"abstract":"<jats:p>\n                    This study correlates the structural and defect parameters of the solution-processed WO\n                    <jats:sub>\n                      <jats:italic>x<\/jats:italic>\n                    <\/jats:sub>\n                    with RRAMs for PUF applications. The performance metrics, such as uniformity (50%), diffuseness (47.62%), and uniqueness (48%), imply a promising future study.\n                  <\/jats:p>","DOI":"10.1039\/d6tc00804f","type":"journal-article","created":{"date-parts":[[2026,7,13]],"date-time":"2026-07-13T14:08:53Z","timestamp":1783951733000},"page":"14753-14764","update-policy":"https:\/\/doi.org\/10.1039\/rsc_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Correlating the structure and the defects of solution-processed WO\n                    <sub>\n                      <i>x<\/i>\n                    <\/sub>\n                    films with RRAM devices\u2019 performance for PUF applications"],"prefix":"10.1039","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-4522-8218","authenticated-orcid":false,"given":"Syed Jalaluddeen","family":"A.","sequence":"first","affiliation":[{"name":"Department of Materials Science and Metallurgical Engineering, Indian Institute of Technology, Hyderabad, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shivam","family":"Shaw","sequence":"additional","affiliation":[{"name":"Integrated Sensor Systems, Center for Interdisciplinary Programs, Indian Institute of Technology, Hyderabad, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tamil Selvan","family":"R.","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Metallurgical Engineering, Indian Institute of Technology, Hyderabad, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8815-4992","authenticated-orcid":false,"given":"Sushree Sangita","family":"Priyadarsini","sequence":"additional","affiliation":[{"name":"Department of Materials Engineering, Indian Institute of Science, Bangalore, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3952-2952","authenticated-orcid":false,"given":"Subho","family":"Dasgupta","sequence":"additional","affiliation":[{"name":"Department of Materials Engineering, Indian Institute of Science, Bangalore, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Oves","family":"Badami","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology, Hyderabad, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Suresh Kumar","family":"Garlapati","sequence":"additional","affiliation":[{"name":"Department of Materials Science and Metallurgical Engineering, Indian Institute of Technology, Hyderabad, India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"292","published-online":{"date-parts":[[2026]]},"reference":[{"issue":"7","key":"D6TC00804F\/cit1\/1","doi-asserted-by":"publisher","first-page":"429","DOI":"10.1038\/nnano.2008.160","volume":"3","author":"Yang","year":"2008","journal-title":"Nat. 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