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C"],"abstract":"<jats:p>\n                    A metal\u2013TMO interlayer\u2013semiconductor (MTIS) contact using a sputtered MoO\n                    <jats:sub>\n                      <jats:italic>X<\/jats:italic>\n                    <\/jats:sub>\n                    interlayer achieves ultra-low contact resistivity, significantly boosting the performance of p-type SnO TFTs.\n                  <\/jats:p>","DOI":"10.1039\/d6tc01357k","type":"journal-article","created":{"date-parts":[[2026,7,23]],"date-time":"2026-07-23T08:25:27Z","timestamp":1784795127000},"page":"15674-15684","update-policy":"https:\/\/doi.org\/10.1039\/rsc_crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Achieving ultra-low contact resistivity and boosting the performance of P-type SnO-TFTs with metal\u2013TMO interlayer\u2013semiconductor contact using transition metal oxides"],"prefix":"10.1039","volume":"14","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-7367-6083","authenticated-orcid":false,"given":"Jongyoun","family":"Park","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Korea University, Seoul 02841, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-1488-5106","authenticated-orcid":false,"given":"Sungjoo","family":"Song","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Systems Engineering, Korea University, Seoul 02841, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5899-2853","authenticated-orcid":false,"given":"Seung Hwan","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electronics and Computer Engineering, Chonnam National University, 77 YongBong-Ro, Buk-gu, Gwangju, 61186, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jeong-Kyu","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Stanford University, Stanford, CA 94305, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tae-Hang","family":"Ahn","sequence":"additional","affiliation":[{"name":"Department of Semiconductor Engineering, Korea University, Seoul 02841, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9446-5981","authenticated-orcid":false,"given":"Hyun-Yong","family":"Yu","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Korea University, Korea University, Seoul 02841, Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"292","published-online":{"date-parts":[[2026]]},"reference":[{"key":"D6TC01357K\/cit1\/1","doi-asserted-by":"publisher","first-page":"6230","DOI":"10.1021\/acsami.8b18860","volume":"11","author":"Kim","year":"2019","journal-title":"ACS Appl. 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