{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,24]],"date-time":"2026-01-24T06:52:47Z","timestamp":1769237567067,"version":"3.49.0"},"reference-count":12,"publisher":"Wiley","issue":"1","license":[{"start":{"date-parts":[[2001,12,24]],"date-time":"2001-12-24T00:00:00Z","timestamp":1009152000000},"content-version":"vor","delay-in-days":541,"URL":"http:\/\/onlinelibrary.wiley.com\/termsAndConditions#vor"}],"content-domain":{"domain":["onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["Journal of Microscopy"],"published-print":{"date-parts":[[2000,7]]},"abstract":"<jats:p>We describe the current performance of the prototype microcalorimeter energy\u2010dispersive spectrometer (\u00b5cal EDS) developed at NIST for X\u2010ray microanalysis. We show that the low\u2010energy \u00b5cal EDS, designed for operation in the energy range 0.2\u20132\u2003keV, offers significant advantages for low\u2010beam\u2010energy microanalysis. We present several examples in which the prototype \u00b5cal EDS has been used to solve problems in low\u2010voltage microanalysis, including the analysis of tungsten silicide (WSi<jats:sub>2<\/jats:sub>), titanium nitride (TiN) and barium titanate (BaTiO<jats:sub>3<\/jats:sub>) and the measurement of chemical shifts in Fe and C compounds.<\/jats:p>","DOI":"10.1046\/j.1365-2818.2000.00705.x","type":"journal-article","created":{"date-parts":[[2003,3,12]],"date-time":"2003-03-12T06:30:45Z","timestamp":1047450645000},"page":"37-44","update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":25,"title":["Microcalorimeter energy\u2010dispersive spectrometry using a low voltage scanning electron microscope"],"prefix":"10.1111","volume":"199","author":[{"given":"D. A.","family":"Wollman","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. W.","family":"Nam","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G. C.","family":"Hilton","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K. D.","family":"Irwin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N. F.","family":"Bergren","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D. A.","family":"Rudman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. M.","family":"Martinis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D. E.","family":"Newbury","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"311","published-online":{"date-parts":[[2001,12,24]]},"reference":[{"key":"e_1_2_5_2_1","doi-asserted-by":"publisher","DOI":"10.1021\/ac981214q"},{"key":"e_1_2_5_3_1","unstructured":"Fiori C.E.&Swyt C.R.(1994) Desk Top Spectrum Analyzer (DTSA). U.S. Patent 5 299 138."},{"key":"e_1_2_5_4_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4613-0491-3"},{"key":"e_1_2_5_5_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.1709209"},{"key":"e_1_2_5_6_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.113674"},{"key":"e_1_2_5_7_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.367153"},{"key":"e_1_2_5_8_1","doi-asserted-by":"publisher","DOI":"10.1016\/0968-4328(96)00023-6"},{"issue":"2","key":"e_1_2_5_9_1","doi-asserted-by":"crossref","first-page":"881","DOI":"10.1017\/S1431927600011296","article-title":"Low beam energy microanalysis: how useful is it?","volume":"3","author":"Newbury D.E.","year":"1997","journal-title":"Microsc. Microanal"},{"key":"e_1_2_5_10_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-3991(99)00028-5"},{"key":"e_1_2_5_11_1","doi-asserted-by":"publisher","DOI":"10.1046\/j.1365-2818.1997.2670824.x"},{"key":"e_1_2_5_12_1","doi-asserted-by":"publisher","DOI":"10.1063\/1.56867"},{"key":"e_1_2_5_13_1","doi-asserted-by":"publisher","DOI":"10.1016\/S0168-9002(99)01351-0"}],"container-title":["Journal of Microscopy"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/api.wiley.com\/onlinelibrary\/tdm\/v1\/articles\/10.1046%2Fj.1365-2818.2000.00705.x","content-type":"unspecified","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/pdf\/10.1046\/j.1365-2818.2000.00705.x","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,9,27]],"date-time":"2023-09-27T14:19:06Z","timestamp":1695824346000},"score":1,"resource":{"primary":{"URL":"https:\/\/onlinelibrary.wiley.com\/doi\/10.1046\/j.1365-2818.2000.00705.x"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,7]]},"references-count":12,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2000,7]]}},"alternative-id":["10.1046\/j.1365-2818.2000.00705.x"],"URL":"https:\/\/doi.org\/10.1046\/j.1365-2818.2000.00705.x","archive":["Portico"],"relation":{},"ISSN":["0022-2720","1365-2818"],"issn-type":[{"value":"0022-2720","type":"print"},{"value":"1365-2818","type":"electronic"}],"subject":[],"published":{"date-parts":[[2000,7]]},"assertion":[{"value":"2001-12-24","order":2,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}