{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T17:46:00Z","timestamp":1782927960163,"version":"3.54.5"},"reference-count":27,"publisher":"Institution of Engineering and Technology (IET)","issue":"1","license":[{"start":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T00:00:00Z","timestamp":1772150400000},"content-version":"vor","delay-in-days":57,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"tdm","delay-in-days":0,"URL":"http:\/\/doi.wiley.com\/10.1002\/tdm_license_1.1"}],"funder":[{"DOI":"10.13039\/501100003392","name":"Natural Science Foundation of Fujian Province","doi-asserted-by":"publisher","award":["2022J05290"],"award-info":[{"award-number":["2022J05290"]}],"id":[{"id":"10.13039\/501100003392","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["ietresearch.onlinelibrary.wiley.com"],"crossmark-restriction":true},"short-container-title":["IET Circuits, Devices &amp;amp; Systems"],"published-print":{"date-parts":[[2026,1]]},"abstract":"<jats:p>\n                    As widely used in arithmetic circuits (such as a ripple carry adder [RCA]), approximate computing intentionally introduces errors in the design; however, approximate circuits can also experience errors due to external and physical phenomena (such as cosmic rays or a stuck\u2010at). These errors can be analyzed by their functional nature. This article examines the impact of a single functional error (SFE) in both an approximate cell as well as the entire RCA. The study analyzes exact and approximate cell designs using a state transition diagram\u2010based approach to understand the relationships between different types of functional error and the expected behavior in all possible scenarios. The article also proposes a probabilistic analysis for an exact RCA, which aligns well with simulation results for several metrics, such as the error rate (ER). Additionally, an error analysis is conducted on the RCA by considering the number of approximate cells and the location of the single erroneous cell. The results and modeling analysis of the exact RCA show that the ER and the mean error distance (MED) for Carry in (\n                    <jats:italic>C<\/jats:italic>\n                    <jats:sub>in<\/jats:sub>\n                    )\u2009=\u20090 are higher than for\n                    <jats:italic>C<\/jats:italic>\n                    <jats:sub>in<\/jats:sub>\n                    \u2009=\u20091; furthermore, the MED for an approximate RCA in the presence of an SFE is higher than for the exact RCA. These findings indicate that an approximate RCA affected by an SFE incurs a significantly degraded accuracy as related to the approximate cell type. Finally, the article provides a binary tree\u2010based analysis to support the comprehensive simulation results for the RCA\u2019s ER using different approximate cells.\n                  <\/jats:p>","DOI":"10.1049\/cds2\/9917935","type":"journal-article","created":{"date-parts":[[2026,3,8]],"date-time":"2026-03-08T20:34:29Z","timestamp":1773002069000},"update-policy":"https:\/\/doi.org\/10.1002\/crossmark_policy","source":"Crossref","is-referenced-by-count":0,"title":["Analysis and Evaluation of Approximate Ripple\u2010Carry Adders in the Presence of a Single Functional Error (SFE)"],"prefix":"10.1049","volume":"2026","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3678-8429","authenticated-orcid":false,"given":"Junqi","family":"Huang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5033-3095","authenticated-orcid":false,"given":"T. Nandha","family":"Kumar","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2768-134X","authenticated-orcid":false,"given":"Haider A. F.","family":"Almurib","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3152-3245","authenticated-orcid":false,"given":"Fabrizio","family":"Lombardi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"265","published-online":{"date-parts":[[2026,2,27]]},"reference":[{"key":"e_1_2_11_1_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2803622"},{"key":"e_1_2_11_2_2","doi-asserted-by":"crossref","unstructured":"YelluP. BoskovN. KinsyM. A. andYuQ. Security Threats in Approximate Computing Systems Great Lakes Symposium on VLSI 2019 (GLSVLSI \u201919) 2019 ACM 387\u2013392 https:\/\/doi.org\/10.1145\/3299874.3319453.","DOI":"10.1145\/3299874.3319453"},{"key":"e_1_2_11_3_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2902415"},{"key":"e_1_2_11_4_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2012.2217962"},{"key":"e_1_2_11_5_2","doi-asserted-by":"crossref","unstructured":"AlmuribH. A. KumarT. N. andLombardiF. Inexact Designs for Approximate Low Power Addition by Cell Replacement 2016 Design Automation & Test in Europe Conference & Exhibition (DATE) 2016 IEEE 660\u2013665.","DOI":"10.3850\/9783981537079_0042"},{"key":"e_1_2_11_6_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.suscom.2021.100529"},{"key":"e_1_2_11_7_2","doi-asserted-by":"crossref","unstructured":"YangZ. HanJ. andLombardiF. Transmission Gate-Based Approximate Adders for Inexact Computing Proceedings of the 2015 IEEE\/ACM International Symposium on Nanoscale Architectures (NANOARCH \u030115) 2015 IEEE 145\u2013150 https:\/\/doi.org\/10.1109\/NANOARCH.2015.7180603 2-s2.0-84949558782.","DOI":"10.1109\/NANOARCH.2015.7180603"},{"key":"e_1_2_11_8_2","doi-asserted-by":"crossref","unstructured":"YangZ. JainA. LiangJ. HanJ. andLombardiF. Approximate XOR\/XNOR-Based Adders for Inexact Computing 13th IEEE International Conference on Nanotechnology 2013 IEEE 690\u2013693 https:\/\/doi.org\/10.1109\/NANO.2013.6720793 2-s2.0-84894167125.","DOI":"10.1109\/NANO.2013.6720793"},{"key":"e_1_2_11_9_2","first-page":"362","article-title":"Approximate Adder Design Using CPL Logic for Image Compression","volume":"3","author":"Nanu D.","year":"2014","journal-title":"International Journal of Innovative Research and Development"},{"key":"e_1_2_11_10_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.compeleceng.2020.106761"},{"key":"e_1_2_11_11_2","doi-asserted-by":"publisher","DOI":"10.1587\/elex.16.20190043"},{"key":"e_1_2_11_12_2","doi-asserted-by":"crossref","unstructured":"RamasamyM. NarmadhaG. andDeivasigamaniS. Carry Based Approximate Full Adder for Low Power Approximate Computing 2019 7th International Conference on Smart Computing & Communications (ICSCC) 2019 IEEE 1\u20134 https:\/\/doi.org\/10.1109\/ICSCC.2019.8843644 2-s2.0-85073229705.","DOI":"10.1109\/ICSCC.2019.8843644"},{"key":"e_1_2_11_13_2","doi-asserted-by":"publisher","DOI":"10.1080\/21681724.2016.1138507"},{"key":"e_1_2_11_14_2","doi-asserted-by":"publisher","DOI":"10.1145\/3131274"},{"key":"e_1_2_11_15_2","doi-asserted-by":"crossref","unstructured":"MannepalliY. KoredeV. B. andRaoM. Novel Approximate Multiplier Designs for Edge Detection Application Proceedings of the 2021 on Great Lakes Symposium on VLSI 2021 ACM 371\u2013377 https:\/\/doi.org\/10.1145\/3453688.3461482.","DOI":"10.1145\/3453688.3461482"},{"key":"e_1_2_11_16_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3056337"},{"key":"e_1_2_11_17_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3184928"},{"key":"e_1_2_11_18_2","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2022.3145362"},{"key":"e_1_2_11_19_2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2016.2640296"},{"key":"e_1_2_11_20_2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3120073"},{"key":"e_1_2_11_21_2","volume-title":"Reliability Aware Intelligent Memory Management (RAIMM)","author":"Rout S. S.","year":"2014"},{"key":"e_1_2_11_22_2","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.125"},{"key":"e_1_2_11_23_2","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2017.2781186"},{"key":"e_1_2_11_24_2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2016.2605382"},{"key":"e_1_2_11_25_2","volume-title":"Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits","author":"Bushnell M.","year":"2004"},{"key":"e_1_2_11_26_2","doi-asserted-by":"crossref","unstructured":"JunqiH. KumarT. N. AbbasH. andLombardiF. Commutative Approximate Adders: Analysis and Evaluation 2021 IEEE\/ACM International Symposium on Nanoscale Architectures (NANOARCH) AB 2021 IEEE 1\u20136 https:\/\/doi.org\/10.1109\/NANOARCH53687.2021.9642233.","DOI":"10.1109\/NANOARCH53687.2021.9642233"},{"key":"e_1_2_11_27_2","doi-asserted-by":"crossref","unstructured":"HuangJ. ThulasiramanN. K. AlmuribH. andLombardiF. Analysis of Approximate Adders With Single Functional Error 2024 TechRxivhttps:\/\/doi.org\/10.36227\/techrxiv.170420873.33149305\/v1.","DOI":"10.36227\/techrxiv.170420873.33149305\/v1"}],"container-title":["IET Circuits, Devices &amp; Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/ietresearch.onlinelibrary.wiley.com\/doi\/pdf\/10.1049\/cds2\/9917935","content-type":"application\/pdf","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/ietresearch.onlinelibrary.wiley.com\/doi\/full-xml\/10.1049\/cds2\/9917935","content-type":"application\/xml","content-version":"vor","intended-application":"text-mining"},{"URL":"https:\/\/ietresearch.onlinelibrary.wiley.com\/doi\/pdf\/10.1049\/cds2\/9917935","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,1]],"date-time":"2026-07-01T16:58:53Z","timestamp":1782925133000},"score":1,"resource":{"primary":{"URL":"https:\/\/ietresearch.onlinelibrary.wiley.com\/doi\/10.1049\/cds2\/9917935"}},"subtitle":[],"editor":[{"given":"Siew-Kei","family":"Lam","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"editor"}]}],"short-title":[],"issued":{"date-parts":[[2026,1]]},"references-count":27,"journal-issue":{"issue":"1","published-print":{"date-parts":[[2026,1]]}},"alternative-id":["10.1049\/cds2\/9917935"],"URL":"https:\/\/doi.org\/10.1049\/cds2\/9917935","archive":["Portico"],"relation":{},"ISSN":["1751-858X","1751-8598"],"issn-type":[{"value":"1751-858X","type":"print"},{"value":"1751-8598","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,1]]},"assertion":[{"value":"2025-08-30","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-01-06","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2026-02-27","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}],"article-number":"9917935"}}