{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,26]],"date-time":"2025-09-26T13:14:23Z","timestamp":1758892463040,"version":"3.28.0"},"reference-count":23,"publisher":"Institution of Engineering and Technology (IET)","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IET Comput. Digit. Tech."],"published-print":{"date-parts":[[2007,3,5]]},"DOI":"10.1049\/iet-cdt:20050065","type":"journal-article","created":{"date-parts":[[2007,3,23]],"date-time":"2007-03-23T15:49:14Z","timestamp":1174664954000},"page":"70-76","source":"Crossref","is-referenced-by-count":8,"title":["FPGA-based fault emulation of synchronous sequential circuits"],"prefix":"10.1049","volume":"1","author":[{"given":"P.","family":"Ellervee","sequence":"first","affiliation":[{"name":"Department of Computer Engineering, Tallinn University of Technology, Raja 15, Tallinn, 12618, Estonia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Raik","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Tallinn University of Technology, Raja 15, Tallinn, 12618, Estonia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Tammema\u0308e","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Tallinn University of Technology, Raja 15, Tallinn, 12618, Estonia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.-J.","family":"Ubar","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Tallinn University of Technology, Raja 15, Tallinn, 12618, Estonia"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"265","reference":[{"key":"10.1049\/iet-cdt:20050065_r1","unstructured":"ITRS 2004 roadmap. Available at: http:\/\/public.itrs.net\/"},{"key":"10.1049\/iet-cdt:20050065_r2","first-page":"402","author":"McGeer","year":"1995","journal-title":"Proc. ICCAD\u201995"},{"key":"10.1049\/iet-cdt:20050065_r3","doi-asserted-by":"crossref","first-page":"64","DOI":"10.1109\/MDT.1987.295165","volume":"4","author":"Gelsinger","year":"1987","ISSN":"http:\/\/id.crossref.org\/issn\/0740-7475","issn-type":"print"},{"key":"10.1049\/iet-cdt:20050065_r4","unstructured":"Xilinx Press Release 0273: \u2018Axis systems uses world's largest FPGAs from Xilinx to deliver most efficient verification system in the industry\u2019. Available at: http:\/\/www.xilinx.com\/"},{"key":"10.1049\/iet-cdt:20050065_r5","first-page":"15","author":"Schubert","year":"1999","journal-title":"Proc. IEEE European Test Workshop"},{"key":"10.1049\/iet-cdt:20050065_r6","first-page":"196","author":"Raik","year":"2005","journal-title":"IEEE Norchip Conf., Oulu"},{"key":"10.1049\/iet-cdt:20050065_r7","doi-asserted-by":"crossref","first-page":"110","DOI":"10.1109\/FPGA.1995.477416","author":"Wieler","year":"1995","journal-title":"Proc. IEEE Symp. on FPGAs for Custom Computing Machines"},{"key":"10.1049\/iet-cdt:20050065_r8","first-page":"354","author":"Ellervee","year":"2004","journal-title":"Proc. FPL'04, Antwerp"},{"key":"10.1049\/iet-cdt:20050065_r9","first-page":"173","author":"Sedaghat-Maman","year":"1997","journal-title":"Proc. Rapid System Prototyping"},{"key":"10.1049\/iet-cdt:20050065_r10","first-page":"11","author":"Ellervee","year":"2003","journal-title":"Proc. Norchip\u201903, Riga, Latvia"},{"key":"10.1049\/iet-cdt:20050065_r11","first-page":"182","author":"Abramovici","year":"1997","journal-title":"Proc. FPGAs for Custom Computing Machines"},{"key":"10.1049\/iet-cdt:20050065_r12","first-page":"549","volume":"5","author":"Lu","year":"2003","journal-title":"Proc. ISCAS'03"},{"key":"10.1049\/iet-cdt:20050065_r13","doi-asserted-by":"crossref","first-page":"129","DOI":"10.1109\/OLT.2003.1214379","author":"Alderighi","year":"2003","journal-title":"Proc. 9th IEEE International On-Line Testing Symp. (IOLTS'03)"},{"key":"10.1049\/iet-cdt:20050065_r14","doi-asserted-by":"crossref","first-page":"724","DOI":"10.1109\/43.712103","volume":"17","author":"Hwang","year":"1998","ISSN":"http:\/\/id.crossref.org\/issn\/0278-0070","issn-type":"print"},{"key":"10.1049\/iet-cdt:20050065_r15","first-page":"240","author":"Wieler","year":"1994","journal-title":"Proc. FPL'94"},{"key":"10.1049\/iet-cdt:20050065_r16","first-page":"681","author":"Cheng","year":"1995","journal-title":"Proc. ICCAD'95"},{"key":"10.1049\/iet-cdt:20050065_r17","doi-asserted-by":"crossref","first-page":"801","DOI":"10.1145\/240518.240669","author":"Burgun","year":"1996","journal-title":"Proc. DAC'96"},{"journal-title":"Proc. IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS'04)","year":"2004","author":"Parreira","key":"10.1049\/iet-cdt:20050065_r18"},{"key":"10.1049\/iet-cdt:20050065_r19","first-page":"535","author":"Niermann","year":"1990","journal-title":"Proc. DAC"},{"key":"10.1049\/iet-cdt:20050065_r20","doi-asserted-by":"crossref","unstructured":"Jervan, G., Markus, A., Paomets, P., Raik, J., and Ubar, R.: \u2018Turbo tester: a CAD system for teaching digital test\u2019 in \u2018Microelectronics education\u2019, (Kluwer Academic Publishers 1998), p. 287\u2013290","DOI":"10.1007\/978-94-011-5110-8_66"},{"key":"10.1049\/iet-cdt:20050065_r21","unstructured":"\u2018Turbo Tester\u2019 home page. Available at: http:\/\/www.pld.ttu.ee\/tt"},{"key":"10.1049\/iet-cdt:20050065_r22","first-page":"224","author":"Pradhan","year":"2003","journal-title":"Proc. DATE'03"},{"key":"10.1049\/iet-cdt:20050065_r23","unstructured":"Xilinx, Inc. Available at: http:\/\/www.xilinx.com"}],"container-title":["IET Computers & Digital Techniques"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/digital-library.theiet.org\/content\/journals\/10.1049\/iet-cdt_20050065?crawler=true&mimetype=application\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,12]],"date-time":"2024-11-12T14:58:43Z","timestamp":1731423523000},"score":1,"resource":{"primary":{"URL":"http:\/\/digital-library.theiet.org\/doi\/10.1049\/iet-cdt%3A20050065"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,3,5]]},"references-count":23,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2007,3,5]]}},"alternative-id":["10.1049\/iet-cdt:20050065"],"URL":"https:\/\/doi.org\/10.1049\/iet-cdt:20050065","relation":{},"ISSN":["1751-8601","1751-861X"],"issn-type":[{"type":"print","value":"1751-8601"},{"type":"electronic","value":"1751-861X"}],"subject":[],"published":{"date-parts":[[2007,3,5]]}}}