{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,24]],"date-time":"2025-03-24T06:53:03Z","timestamp":1742799183071,"version":"3.28.0"},"reference-count":31,"publisher":"Institution of Engineering and Technology (IET)","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IET Comput. Digit. Tech."],"published-print":{"date-parts":[[2007,3,5]]},"DOI":"10.1049\/iet-cdt:20060099","type":"journal-article","created":{"date-parts":[[2007,3,23]],"date-time":"2007-03-23T15:49:14Z","timestamp":1174664954000},"page":"77-86","source":"Crossref","is-referenced-by-count":15,"title":["Embedded high-resolution delay measurement system using time amplification"],"prefix":"10.1049","volume":"1","author":[{"given":"M.A.","family":"Abas","sequence":"first","affiliation":[{"name":"School of Electrical, Electronic and Computer Engineering, University of Newcastle upon Tyne, UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Russell","sequence":"additional","affiliation":[{"name":"School of Electrical, Electronic and Computer Engineering, University of Newcastle upon Tyne, UK"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.J.","family":"Kinniment","sequence":"additional","affiliation":[{"name":"School of Electrical, Electronic and Computer Engineering, University of Newcastle upon Tyne, UK"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"265","reference":[{"key":"10.1049\/iet-cdt:20060099_r1","first-page":"619","author":"Sartori","year":"2002","journal-title":"Proc. International Test Conference"},{"key":"10.1049\/iet-cdt:20060099_r2","unstructured":"Russell, G., and Sayers, I.L.: \u2018Advanced simulation and test methodologies for VLSI design\u2019, (Van Nostrand Reinhold (International) 1989)"},{"first-page":"151","year":"1998","author":"Soma","key":"10.1049\/iet-cdt:20060099_r3"},{"first-page":"24","year":"2002","author":"Tabatabaei","key":"10.1049\/iet-cdt:20060099_r4"},{"first-page":"473","year":"2003","author":"Kinniment","key":"10.1049\/iet-cdt:20060099_r5"},{"key":"10.1049\/iet-cdt:20060099_r6","first-page":"1437","volume":"38","author":"Abas","year":"2002"},{"key":"10.1049\/iet-cdt:20060099_r7","unstructured":"Sumner, R.: \u2018Apparatus and method for measuring time intervals with very high resolution\u2019, (US patent #6137749 assigned to Leroy Corporation)"},{"key":"10.1049\/iet-cdt:20060099_r8","first-page":"36","volume":"NS-20","author":"Porat","year":"1976"},{"key":"10.1049\/iet-cdt:20060099_r9","first-page":"887","volume":"28","author":"Rahkonen","year":"1993"},{"key":"10.1049\/iet-cdt:20060099_r10","first-page":"367","volume":"48","author":"Hsu","year":"2001"},{"key":"10.1049\/iet-cdt:20060099_r11","unstructured":"Tabatabaei, S.: \u2018Embedded test circuits and methodologies for mixed-signal ICs\u2019, April, 2000, PhD, University of British Columbia"},{"key":"10.1049\/iet-cdt:20060099_r12","first-page":"771","volume":"47","author":"Noda","year":"2000"},{"key":"10.1049\/iet-cdt:20060099_r13","first-page":"984","volume":"30","author":"Ra\u0308isa\u0308nen-Ruotalainen","year":"1995"},{"key":"10.1049\/iet-cdt:20060099_r14","first-page":"954","volume":"47","author":"Chen","year":"2000"},{"key":"10.1049\/iet-cdt:20060099_r15","first-page":"1218","volume":"23","author":"Johnson","year":"1988"},{"key":"10.1049\/iet-cdt:20060099_r16","first-page":"1738","volume":"52","author":"Xia","year":"2003"},{"first-page":"332","year":"2004","author":"Hsiao","key":"10.1049\/iet-cdt:20060099_r17"},{"key":"10.1049\/iet-cdt:20060099_r18","first-page":"509","volume":"1","author":"Oulmane","year":"2004","journal-title":"Proc. International Symposium on Circuits and Systems"},{"key":"10.1049\/iet-cdt:20060099_r19","first-page":"1658","volume":"32","author":"Moyer","year":"1996"},{"key":"10.1049\/iet-cdt:20060099_r20","first-page":"51","volume":"36","author":"Kalisz","year":"1997"},{"key":"10.1049\/iet-cdt:20060099_r21","first-page":"77","author":"Chan","year":"2002","journal-title":"Proc. Custom Integrated Circuits Conference"},{"key":"10.1049\/iet-cdt:20060099_r22","first-page":"240","volume":"35","author":"Dudek","year":"2000"},{"key":"10.1049\/iet-cdt:20060099_r23","doi-asserted-by":"crossref","first-page":"202","DOI":"10.1109\/4.982426","volume":"37","author":"Kinniment","year":"2002","ISSN":"http:\/\/id.crossref.org\/issn\/0018-9200","issn-type":"print"},{"key":"10.1049\/iet-cdt:20060099_r24","first-page":"1748","volume":"24","author":"Stevens","year":"1989"},{"key":"10.1049\/iet-cdt:20060099_r25","first-page":"326","author":"Xia","year":"2003","journal-title":"Proc. of 12th Asia Test Symposium"},{"key":"10.1049\/iet-cdt:20060099_r26","first-page":"197","author":"Ra\u0308a\u0308isa\u0308nen-Ruotalainen","year":"1997","journal-title":"Proc. of 40th Mid-West Symposium on Circuits and Systems"},{"key":"10.1049\/iet-cdt:20060099_r27","first-page":"415","volume":"152","author":"Levine","year":"2005"},{"key":"10.1049\/iet-cdt:20060099_r28","first-page":"1507","volume":"35","author":"Ra\u0308isa\u0308nen-Ruotalainen","year":"2000"},{"key":"10.1049\/iet-cdt:20060099_r29","first-page":"632","volume":"34","author":"Garleep","year":"1999"},{"key":"10.1049\/iet-cdt:20060099_r30","first-page":"1997","volume":"39","author":"Sung","year":"2004"},{"key":"10.1049\/iet-cdt:20060099_r31","first-page":"218","author":"Xia","year":"2005","journal-title":"IEEE Proc. Symposium on VLSI"}],"container-title":["IET Computers & Digital Techniques"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/digital-library.theiet.org\/content\/journals\/10.1049\/iet-cdt_20060099?crawler=true&mimetype=application\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,12]],"date-time":"2024-11-12T14:58:48Z","timestamp":1731423528000},"score":1,"resource":{"primary":{"URL":"http:\/\/digital-library.theiet.org\/doi\/10.1049\/iet-cdt%3A20060099"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,3,5]]},"references-count":31,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2007,3,5]]}},"alternative-id":["10.1049\/iet-cdt:20060099"],"URL":"https:\/\/doi.org\/10.1049\/iet-cdt:20060099","relation":{},"ISSN":["1751-8601","1751-861X"],"issn-type":[{"type":"print","value":"1751-8601"},{"type":"electronic","value":"1751-861X"}],"subject":[],"published":{"date-parts":[[2007,3,5]]}}}