{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T05:28:28Z","timestamp":1731475708011,"version":"3.28.0"},"reference-count":14,"publisher":"Institution of Engineering and Technology (IET)","issue":"3","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IET Comput. Digit. Tech."],"published-print":{"date-parts":[[2007,5]]},"DOI":"10.1049\/iet-cdt:20060129","type":"journal-article","created":{"date-parts":[[2007,5,11]],"date-time":"2007-05-11T16:23:22Z","timestamp":1178900602000},"page":"207-212","source":"Crossref","is-referenced-by-count":4,"title":["On-chip evaluation, compensation and storage of scan diagnosis data"],"prefix":"10.1049","volume":"1","author":[{"given":"F.","family":"Poehl","sequence":"first","affiliation":[{"name":"Infineon Technologies AG, Am Campeon 1\u201312, Neubiberg, 85579, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Beck","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG, Am Campeon 1\u201312, Neubiberg, 85579, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Arnold","sequence":"additional","affiliation":[{"name":"Infineon Technologies AG, Am Campeon 1\u201312, Neubiberg, 85579, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Rzeha","sequence":"additional","affiliation":[{"name":"University of Potsdam, August-Bebel-Strasse 89, Potsdam, 14482, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Rabenalt","sequence":"additional","affiliation":[{"name":"University of Potsdam, August-Bebel-Strasse 89, Potsdam, 14482, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Goessel","sequence":"additional","affiliation":[{"name":"University of Potsdam, August-Bebel-Strasse 89, Potsdam, 14482, Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"265","reference":[{"key":"10.1049\/iet-cdt:20060129_r1","first-page":"181","author":"Rehani","year":"2004","journal-title":"Proc. Int. Test Conf"},{"key":"10.1049\/iet-cdt:20060129_r2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.21"},{"key":"10.1049\/iet-cdt:20060129_r3","first-page":"42","volume":"6","author":"Jackson","year":"2005"},{"key":"10.1049\/iet-cdt:20060129_r4","first-page":"748","author":"Keller","year":"2001","journal-title":"Proc. Int. Test Conf"},{"key":"10.1049\/iet-cdt:20060129_r5","doi-asserted-by":"crossref","first-page":"538","DOI":"10.1109\/TEST.2001.966672","author":"Hsu","year":"2001","journal-title":"Proc. Int. Test Conf"},{"key":"10.1049\/iet-cdt:20060129_r6","doi-asserted-by":"crossref","first-page":"301","DOI":"10.1109\/TEST.2002.1041773","author":"Rajski","year":"2002","journal-title":"Proc. Int. Test Conf"},{"key":"10.1049\/iet-cdt:20060129_r7","doi-asserted-by":"crossref","first-page":"311","DOI":"10.1109\/TEST.2002.1041774","author":"Mitra","year":"2002","journal-title":"Proc. Int. Test Conf"},{"key":"10.1049\/iet-cdt:20060129_r8","first-page":"727","author":"Wohl","year":"2003","journal-title":"Proc. Int. Test Conf"},{"key":"10.1049\/iet-cdt:20060129_r9","first-page":"498","author":"Mrugalski","year":"2004","journal-title":"Proc. Int. Test Conf"},{"journal-title":"Proc. Int. Test Conf","year":"2005","author":"Leininger","key":"10.1049\/iet-cdt:20060129_r10"},{"key":"10.1049\/iet-cdt:20060129_r11","first-page":"193","author":"Hora","year":"2002","journal-title":"Proc. Eur. Test Workshop"},{"journal-title":"Proc. Int. Test Conf","year":"2005","author":"Arnold","key":"10.1049\/iet-cdt:20060129_r12"},{"key":"10.1049\/iet-cdt:20060129_r13","first-page":"83","author":"Saluja","year":"1983","journal-title":"Proc. Int. Test Conf"},{"key":"10.1049\/iet-cdt:20060129_r14","first-page":"1211","author":"Poehl","year":"2003","journal-title":"Proc. Int. Test Conf"}],"container-title":["IET Computers & Digital Techniques"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/digital-library.theiet.org\/content\/journals\/10.1049\/iet-cdt_20060129?crawler=true&mimetype=application\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,12]],"date-time":"2024-11-12T14:53:09Z","timestamp":1731423189000},"score":1,"resource":{"primary":{"URL":"http:\/\/digital-library.theiet.org\/doi\/10.1049\/iet-cdt%3A20060129"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,5]]},"references-count":14,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2007,5]]}},"alternative-id":["10.1049\/iet-cdt:20060129"],"URL":"https:\/\/doi.org\/10.1049\/iet-cdt:20060129","relation":{},"ISSN":["1751-8601","1751-861X"],"issn-type":[{"type":"print","value":"1751-8601"},{"type":"electronic","value":"1751-861X"}],"subject":[],"published":{"date-parts":[[2007,5]]}}}