{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T05:27:43Z","timestamp":1731475663020,"version":"3.28.0"},"reference-count":31,"publisher":"Institution of Engineering and Technology (IET)","issue":"6","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IET Comput. Digit. Tech."],"published-print":{"date-parts":[[2008,11,3]]},"DOI":"10.1049\/iet-cdt:20070048","type":"journal-article","created":{"date-parts":[[2008,10,22]],"date-time":"2008-10-22T22:12:14Z","timestamp":1224713534000},"page":"445-460","source":"Crossref","is-referenced-by-count":1,"title":["Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols"],"prefix":"10.1049","volume":"2","author":[{"given":"T.","family":"Bengtsson","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, School of Engineering, Jo\u0308nko\u0308ping University, Sweden"}]},{"given":"S.","family":"Kumar","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering and Computer Science, School of Engineering, Jo\u0308nko\u0308ping University, Sweden"}]},{"given":"R.-J.","family":"Ubar","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Tallinn University of Technology, Estonia"}]},{"given":"A.","family":"Jutman","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Tallinn University of Technology, Estonia"}]},{"given":"Z.","family":"Peng","sequence":"additional","affiliation":[{"name":"Department of Computer and Information Science, Linko\u0308ping University, Sweden"}]}],"member":"265","reference":[{"key":"10.1049\/iet-cdt:20070048_r1","doi-asserted-by":"crossref","first-page":"28","DOI":"10.1109\/VTEST.1998.670845","author":"Nordholz","year":"1998","journal-title":"Proc. VLSI Test Symp."},{"key":"10.1049\/iet-cdt:20070048_r2","first-page":"1902","volume":"51","author":"Naeemi","year":"2004"},{"key":"10.1049\/iet-cdt:20070048_r3","first-page":"1725","volume":"24","author":"Pamunuwa","year":"2003"},{"key":"10.1049\/iet-cdt:20070048_r4","unstructured":"Micheli, G.D., and Benini, L.: \u2018Networks on chips\u2019, (Morgan Kaufmann 2006)"},{"key":"10.1049\/iet-cdt:20070048_r5","first-page":"IV-892","volume":"4","author":"Liu","year":"2003"},{"key":"10.1049\/iet-cdt:20070048_r6","doi-asserted-by":"crossref","unstructured":"Nurmi, J., Tenhunen, H., Isoaho, J., and Jantsch, A.: \u2018Interconnectcentric design for advanced SoC and NoC\u2019, (Kluwer Academic Publishers 2004)","DOI":"10.1007\/b117241"},{"key":"10.1049\/iet-cdt:20070048_r7","doi-asserted-by":"crossref","first-page":"442","DOI":"10.1109\/92.805751","volume":"7","author":"Ismail","year":"1999","ISSN":"http:\/\/id.crossref.org\/issn\/1063-8210","issn-type":"print"},{"key":"10.1049\/iet-cdt:20070048_r8","first-page":"1355","volume":"23","author":"Bai","year":"2004"},{"key":"10.1049\/iet-cdt:20070048_r9","first-page":"329","volume":"25","author":"Sinha","year":"2002"},{"key":"10.1049\/iet-cdt:20070048_r10","doi-asserted-by":"crossref","first-page":"873","DOI":"10.1145\/309847.310091","author":"Hemani","year":"1999","journal-title":"Proc. DAC99"},{"key":"10.1049\/iet-cdt:20070048_r11","doi-asserted-by":"crossref","first-page":"30","DOI":"10.1109\/VTS.2006.22","author":"Grecu","year":"2006","journal-title":"Proc. VLSI Test Symp."},{"key":"10.1049\/iet-cdt:20070048_r12","doi-asserted-by":"crossref","first-page":"619","DOI":"10.1145\/337292.337597","author":"Bai","year":"2000","journal-title":"Proc. Design Automation Conf."},{"journal-title":"Proc. Int. Conf. Mixed Design of Integrated Circuits and Systems","year":"2005","author":"Bengtsson","key":"10.1049\/iet-cdt:20070048_r13"},{"journal-title":"Proc. DSD","year":"2006","author":"Bengtsson","key":"10.1049\/iet-cdt:20070048_r14"},{"key":"10.1049\/iet-cdt:20070048_r15","doi-asserted-by":"crossref","first-page":"221","DOI":"10.1109\/NORCHP.2006.329215","author":"Bengtsson","year":"2006","journal-title":"Proc. Norchip, Linko\u0308ping"},{"key":"10.1049\/iet-cdt:20070048_r16","first-page":"128","author":"Cota","year":"2003","journal-title":"Proc. VLSI Test Symp."},{"journal-title":"Proc. Int. Test Conf.","year":"2005","author":"Amory","key":"10.1049\/iet-cdt:20070048_r17"},{"key":"10.1049\/iet-cdt:20070048_r18","doi-asserted-by":"crossref","first-page":"74","DOI":"10.1109\/MCOM.2003.1232240","volume":"41","author":"Vermeulen","year":"2003","ISSN":"http:\/\/id.crossref.org\/issn\/0163-6804","issn-type":"print"},{"key":"10.1049\/iet-cdt:20070048_r19","doi-asserted-by":"crossref","first-page":"404","DOI":"10.1109\/MDT.2005.108","volume":"22","author":"Pande","year":"2005","ISSN":"http:\/\/id.crossref.org\/issn\/0740-7475","issn-type":"print"},{"key":"10.1049\/iet-cdt:20070048_r20","first-page":"297","author":"Cuviello","year":"1999","journal-title":"Proc. IEEE\/ACM Int. Conf. Computer-Aided Design"},{"key":"10.1049\/iet-cdt:20070048_r21","doi-asserted-by":"crossref","first-page":"172","DOI":"10.1109\/ASYNC.2006.16","author":"Beigne\u0301","year":"2006","journal-title":"Proc. Int. Symp. Asynchronous Circuits and Systems"},{"key":"10.1049\/iet-cdt:20070048_r22","first-page":"1384","volume":"13","author":"Efthymiou","year":"2005"},{"key":"10.1049\/iet-cdt:20070048_r23","doi-asserted-by":"crossref","first-page":"100","DOI":"10.1109\/VTS.2006.41","author":"Stewart","year":"2006","journal-title":"Proc. VLSI Test Symp."},{"key":"10.1049\/iet-cdt:20070048_r24","first-page":"70","volume":"35","author":"Benini","year":"2002"},{"key":"10.1049\/iet-cdt:20070048_r25","first-page":"117","author":"Kumar","year":"2002","journal-title":"Proc. Computer Society Annual Symp. VLSI"},{"key":"10.1049\/iet-cdt:20070048_r26","unstructured":"Pamunuwa, D.: \u2018Modelling and analysis of interconnects for deep submicron SoC\u2019, 2003, PhD, Royal Institute of Technology Stockholm"},{"key":"10.1049\/iet-cdt:20070048_r27","doi-asserted-by":"crossref","unstructured":"Jantsch, A., and Tenhunen, H.: \u2018Networks on chip\u2019, (Kluwer Academic Publishers 2003)","DOI":"10.1007\/b105353"},{"key":"10.1049\/iet-cdt:20070048_r28","doi-asserted-by":"crossref","first-page":"285","DOI":"10.1109\/NORCHP.2005.1597045","author":"Bengtsson","year":"2005","journal-title":"Proc. Norchip"},{"first-page":"434","year":"2005","author":"Murali","key":"10.1049\/iet-cdt:20070048_r29"},{"first-page":"68","year":"1961","author":"Berger","key":"10.1049\/iet-cdt:20070048_r30"},{"key":"10.1049\/iet-cdt:20070048_r31","doi-asserted-by":"crossref","first-page":"2","DOI":"10.1109\/ETSYM.2004.1347572","author":"Jutman","year":"2004","journal-title":"Proc. European Test Symp."}],"container-title":["IET Computers & Digital Techniques"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/digital-library.theiet.org\/content\/journals\/10.1049\/iet-cdt_20070048?crawler=true&mimetype=application\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,12]],"date-time":"2024-11-12T14:38:00Z","timestamp":1731422280000},"score":1,"resource":{"primary":{"URL":"http:\/\/digital-library.theiet.org\/doi\/10.1049\/iet-cdt%3A20070048"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,11,3]]},"references-count":31,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2008,11,3]]}},"alternative-id":["10.1049\/iet-cdt:20070048"],"URL":"https:\/\/doi.org\/10.1049\/iet-cdt:20070048","relation":{},"ISSN":["1751-8601","1751-861X"],"issn-type":[{"type":"print","value":"1751-8601"},{"type":"electronic","value":"1751-861X"}],"subject":[],"published":{"date-parts":[[2008,11,3]]}}}