{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,6]],"date-time":"2026-01-06T15:30:50Z","timestamp":1767713450624,"version":"3.28.0"},"reference-count":11,"publisher":"Institution of Engineering and Technology (IET)","issue":"3","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IET Inf. Secur."],"published-print":{"date-parts":[[2008,9,8]]},"DOI":"10.1049\/iet-ifs:20080038","type":"journal-article","created":{"date-parts":[[2008,8,30]],"date-time":"2008-08-30T02:21:34Z","timestamp":1220062894000},"page":"94-98","source":"Crossref","is-referenced-by-count":72,"title":["When AES blinks: introducing optical side channel"],"prefix":"10.1049","volume":"2","author":[{"given":"J.","family":"Ferrigno","sequence":"first","affiliation":[{"name":"Centre National d'E\u0301tudes Spatiales, 18 av. E\u0301douard Belin, Toulouse, 310 55, France"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Hlava\u0301c\u030c","sequence":"additional","affiliation":[{"name":"Department of Algebra, Charles University in Prague, Sokolovska\u0301 83, 186 75, Prague, 8, Czech Republic"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"265","reference":[{"key":"10.1049\/iet-ifs:20080038_r1","doi-asserted-by":"crossref","first-page":"388","DOI":"10.1007\/3-540-48405-1_25","author":"Kocher","year":"1999","journal-title":"CRYPTO'99: Proc. 19th Annual Int. Cryptology Conf."},{"key":"10.1049\/iet-ifs:20080038_r2","first-page":"251","author":"Gandolfi","year":"2001","journal-title":"Cryptographic Hardware and Embedded Systems\u2013CHES2001, Third Int. Workshop"},{"key":"10.1049\/iet-ifs:20080038_r3","first-page":"104","author":"Kocher","year":"1996","journal-title":"CRYPTO'96: Proc. 16th Annual Int. Cryptology Conf."},{"key":"10.1049\/iet-ifs:20080038_r4","unstructured":"Microchip: PIC16F84A Data Sheet http:\/\/ww1.microchip.com\/downloads\/en\/devicedoc\/35007b.pdf"},{"author":"Barnett","key":"10.1049\/iet-ifs:20080038_r5"},{"key":"10.1049\/iet-ifs:20080038_r6","unstructured":"International Organization for Standardization: ISO\/IEC 7816 -Identification cards \u2013 Integrated circuit(s) with contacts, http:\/\/www.iso.org\/iso\/iso_catalogue\/catalogue_ tc\/catalogue_detail.htm?csnumber=38770"},{"key":"10.1049\/iet-ifs:20080038_r7","unstructured":"Ultratec: TEC Note #1 Selected area polishing (SAP) of semiconductor devices \u2013 F.A.Q, http:\/\/www.ultratecusa.com\/PDFlibrary\/Selected%20Area%20Polishing%20-%20FAQ.pdf"},{"key":"10.1049\/iet-ifs:20080038_r8","doi-asserted-by":"crossref","first-page":"495","DOI":"10.1109\/ESSDERC.2002.194976","author":"Stellari","year":"2002","journal-title":"ESSDERC'02: Proc. 32nd European Solid-State Device Research Conf."},{"key":"10.1049\/iet-ifs:20080038_r9","first-page":"370","author":"Vallett","year":"2004","journal-title":"Microelectronics Failure Analysis"},{"journal-title":"European Symp. Reliability of Electron Devices, Failure Physics and Analysis","year":"2004","author":"Desplats","key":"10.1049\/iet-ifs:20080038_r10"},{"key":"10.1049\/iet-ifs:20080038_r11","doi-asserted-by":"crossref","first-page":"R23","DOI":"10.1063\/1.350466","volume":"71","author":"Ko\u0308lzer","year":"1992","ISSN":"http:\/\/id.crossref.org\/issn\/0021-8979","issn-type":"print"}],"container-title":["IET Information Security"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/digital-library.theiet.org\/content\/journals\/10.1049\/iet-ifs_20080038?crawler=true&mimetype=application\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,12]],"date-time":"2024-11-12T14:19:57Z","timestamp":1731421197000},"score":1,"resource":{"primary":{"URL":"http:\/\/digital-library.theiet.org\/doi\/10.1049\/iet-ifs%3A20080038"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,9,8]]},"references-count":11,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2008,9,8]]}},"alternative-id":["10.1049\/iet-ifs:20080038"],"URL":"https:\/\/doi.org\/10.1049\/iet-ifs:20080038","relation":{},"ISSN":["1751-8709","1751-8717"],"issn-type":[{"type":"print","value":"1751-8709"},{"type":"electronic","value":"1751-8717"}],"subject":[],"published":{"date-parts":[[2008,9,8]]}}}