{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T10:25:13Z","timestamp":1749205513941,"version":"3.28.0"},"reference-count":3,"publisher":"Institution of Engineering and Technology (IET)","issue":"19","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Electron. Lett."],"published-print":{"date-parts":[[1995,9,14]]},"DOI":"10.1049\/el:19951126","type":"journal-article","created":{"date-parts":[[2002,7,26]],"date-time":"2002-07-26T11:01:36Z","timestamp":1027681296000},"page":"1617-1618","source":"Crossref","is-referenced-by-count":10,"title":["Cross-correlation between\n            <i>\n              i\n              <sub>DD<\/sub>\n            <\/i>\n            and\n            <i>\n              v\n              <sub>out<\/sub>\n            <\/i>\n            signalsfor testing analogue circuits"],"prefix":"10.1049","volume":"31","author":[{"given":"J.","family":"Machado da Silva","sequence":"first","affiliation":[{"name":"Faculdade de Engenharia da Universidade do Porto - INESC, Prc\u0327. da Repu\u0301blica 90, Porto, P-4000, Portugal"}]},{"given":"J.","family":"Silva Matos","sequence":"additional","affiliation":[{"name":"Faculdade de Engenharia da Universidade do Porto - INESC, Prc\u0327. da Repu\u0301blica 90, Porto, P-4000, Portugal"}]},{"given":"I.M.","family":"Bell","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, University of Hull, Cottingham Road, Hull, HU6 7RX, United Kingdom"}]},{"given":"G.E.","family":"Taylor","sequence":"additional","affiliation":[{"name":"Faculty of Information &amp; Engineering Systems, Leeds Metropolitan University, Carveley Street, Leeds, LS1 3HE, United Kingdom"}]}],"member":"265","reference":[{"key":"10.1049\/el:19951126_r1","first-page":"385","author":"Eckersall","year":"1993","journal-title":"Proc. IEEE European Test Conf."},{"key":"10.1049\/el:19951126_r2","doi-asserted-by":"crossref","first-page":"796","DOI":"10.1109\/43.285252","volume":"13","author":"Milor","year":"1994","ISSN":"http:\/\/id.crossref.org\/issn\/0278-0070","issn-type":"print"},{"key":"10.1049\/el:19951126_r3","doi-asserted-by":"crossref","first-page":"860","DOI":"10.1109\/19.234498","volume":"IM-42","author":"Papakostas","year":"1993","ISSN":"http:\/\/id.crossref.org\/issn\/0018-9456","issn-type":"print"}],"container-title":["Electronics Letters"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/digital-library.theiet.org\/content\/journals\/10.1049\/el_19951126?crawler=true&mimetype=application\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,11,12]],"date-time":"2024-11-12T15:59:15Z","timestamp":1731427155000},"score":1,"resource":{"primary":{"URL":"http:\/\/digital-library.theiet.org\/doi\/10.1049\/el%3A19951126"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1995,9,14]]},"references-count":3,"journal-issue":{"issue":"19","published-print":{"date-parts":[[1995,9,14]]}},"alternative-id":["10.1049\/el:19951126"],"URL":"https:\/\/doi.org\/10.1049\/el:19951126","relation":{},"ISSN":["0013-5194","1350-911X"],"issn-type":[{"type":"print","value":"0013-5194"},{"type":"electronic","value":"1350-911X"}],"subject":[],"published":{"date-parts":[[1995,9,14]]}}}