{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T14:08:00Z","timestamp":1761487680791},"reference-count":0,"publisher":"IEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[1997]]},"DOI":"10.1049\/ic:19970280","type":"proceedings-article","created":{"date-parts":[[2006,9,13]],"date-time":"2006-09-13T13:26:25Z","timestamp":1158153985000},"page":"1-1","source":"Crossref","is-referenced-by-count":7,"title":["Preparation by IEC and CIGRE for IEC publication: \u201cIEC 60-2: 1994. High voltage test techniques Part 2. Measuring systems\u201d"],"prefix":"10.1049","volume":"1997","author":[{"given":"R.C.","family":"Hughes","sequence":"first","affiliation":[]}],"member":"265","event":{"name":"IEE Colloquium on NAMAS Accreditation for High Voltage Measurements and Tests","location":"Leatherhead, UK"},"container-title":["IEE Colloquium on NAMAS Accreditation for High Voltage Measurements and Tests"],"original-title":[],"deposited":{"date-parts":[[2018,12,6]],"date-time":"2018-12-06T16:41:25Z","timestamp":1544114485000},"score":1,"resource":{"primary":{"URL":"https:\/\/digital-library.theiet.org\/content\/conferences\/10.1049\/ic_19970280"},"secondary":[{"URL":"http:\/\/ieeexplore.ieee.org\/lpdocs\/epic03\/wrapper.htm?arnumber=598322","label":"Xplore"}]},"subtitle":[],"short-title":[],"issued":{"date-parts":[[1997]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1049\/ic:19970280","relation":{},"subject":[],"published":{"date-parts":[[1997]]}}}