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It calls for more research attention on three aspects: (i) application of control and detection unified framework to enhancing the diagnosis capability of feedback control systems, (ii) projection-based fault detection, and complementary and explainable applications of projection- and machine learning-based techniques, and (iii) system performance degradation detection that is of elemental importance for today\u2019s automatic control systems. Some ideas and conceptual schemes are presented and illustrated by means of examples, serving as convincing arguments for research efforts in these aspects. They would contribute to the future development of capable diagnosis systems for functionality safe and cyber secure automatic control systems.<\/jats:p>","DOI":"10.1051\/sands\/2022004","type":"journal-article","created":{"date-parts":[[2022,8,4]],"date-time":"2022-08-04T08:01:04Z","timestamp":1659600064000},"page":"2022004","source":"Crossref","is-referenced-by-count":5,"title":["A note on diagnosis and performance degradation detection in automatic control systems towards functional safety and cyber security"],"prefix":"10.1051","volume":"1","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5149-5918","authenticated-orcid":false,"given":"Steven X.","family":"Ding","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"250","published-online":{"date-parts":[[2022,8,8]]},"reference":[{"key":"R1","doi-asserted-by":"crossref","first-page":"459","DOI":"10.1016\/0005-1098(90)90018-D","volume":"26","author":"Frank","year":"1990","journal-title":"Automatica"},{"key":"R2","doi-asserted-by":"crossref","first-page":"403","DOI":"10.1016\/S0959-1524(97)00016-4","volume":"7","author":"Frank","year":"1997","journal-title":"J Process Contr"},{"key":"R3","doi-asserted-by":"crossref","first-page":"462","DOI":"10.1109\/TII.2012.2214390","volume":"9","author":"Ding","year":"2013","journal-title":"IEEE Trans Ind Inform"},{"key":"R4","doi-asserted-by":"crossref","first-page":"3757","DOI":"10.1109\/TIE.2015.2417501","volume":"62","author":"Gao","year":"2015","journal-title":"IEEE Trans Ind Electron"},{"key":"R5","doi-asserted-by":"crossref","first-page":"636","DOI":"10.1109\/TCST.2009.2026285","volume":"18","author":"Hwang","year":"2010","journal-title":"IEEE Trans Contr Syst Tech"},{"key":"R6","first-page":"1285","volume":"42","author":"Wen","year":"2016","journal-title":"Acta Automat Sin"},{"key":"R7","doi-asserted-by":"crossref","first-page":"2337","DOI":"10.1109\/TIE.2019.2907500","volume":"67","author":"Zhou","year":"2020","journal-title":"IEEE Trans Ind Electron"},{"key":"R8","doi-asserted-by":"crossref","first-page":"394","DOI":"10.1016\/j.arcontrol.2019.04.011","volume":"47","author":"Dibaji","year":"2019","journal-title":"Ann Rev Contr"},{"key":"R9","doi-asserted-by":"crossref","first-page":"1674","DOI":"10.1016\/j.neucom.2017.10.009","volume":"275","author":"Ding","year":"2018","journal-title":"Neurocomputing"},{"key":"R10","first-page":"76","volume":"51","author":"Giraldo","year":"2018","journal-title":"ACM Comput Surv"},{"key":"R11","doi-asserted-by":"crossref","first-page":"2715","DOI":"10.1109\/TAC.2013.2266831","volume":"58","author":"Pasqualetti","year":"2013","journal-title":"IEEE Trans Automat Contr"},{"key":"R12","doi-asserted-by":"crossref","first-page":"5329","DOI":"10.1109\/JSYST.2020.2991258","volume":"14","author":"Tan","year":"2020","journal-title":"IEEE Syst J"},{"key":"R13","doi-asserted-by":"crossref","first-page":"8471","DOI":"10.1109\/JIOT.2019.2919635","volume":"6","author":"Yan","year":"2019","journal-title":"IEEE Internet Things J"},{"key":"R14","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.isatra.2021.01.036","volume":"116","author":"Zhang","year":"2021","journal-title":"ISA Trans"},{"key":"R15","doi-asserted-by":"crossref","first-page":"517","DOI":"10.1109\/JPROC.2020.3034595","volume":"109","author":"Zhou","year":"2021","journal-title":"Proc IEEE"},{"key":"R16","unstructured":"Ding SX. 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