{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,10,19]],"date-time":"2023-10-19T05:18:29Z","timestamp":1697692709552},"reference-count":3,"publisher":"EDP Sciences","license":[{"start":{"date-parts":[[2023,10,18]],"date-time":"2023-10-18T00:00:00Z","timestamp":1697587200000},"content-version":"vor","delay-in-days":290,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["EPJ Web Conf."],"published-print":{"date-parts":[[2023]]},"abstract":"<jats:p>White Light Interferometry, known for its absolute measurement capability and high precision, had its greatest scientific impact towards the end of the 20th century. In this work, it was assembled and characterized a fibre Mach-Zehnder interferometer (MZI) as an interrogator and a fibre Fabry-Perot interferometer (FPI) as a displacement sensor. A measurement bandwidth between 65 \u03bcm and 95 \u03bcm was obtained for FPI cavities close to 2.35 mm, at sampling frequencies between 600 Hz and 1500 Hz. Additionally, a resonant frequency at 550 Hz was achieved, allowing for an interrogation band higher than 135 \u03bcm. It was also determined a minimum absolute resolution of \u00b1 66 nm, corresponding to a relative resolution of \u00b1 9.4\u00d710<jats:sup>-4<\/jats:sup> in relation to the total band.<\/jats:p>","DOI":"10.1051\/epjconf\/202328709039","type":"journal-article","created":{"date-parts":[[2023,10,18]],"date-time":"2023-10-18T12:07:29Z","timestamp":1697630849000},"page":"09039","source":"Crossref","is-referenced-by-count":0,"title":["White Light Interferometry: Absolute and High Precision Measurement for Long-Cavity Fibre Fabry-Perot Sensors"],"prefix":"10.1051","volume":"287","author":[{"given":"Paulo","family":"Robalinho","sequence":"first","affiliation":[]},{"given":"A.","family":"Rodrigues","sequence":"additional","affiliation":[]},{"given":"S.","family":"Novais","sequence":"additional","affiliation":[]},{"given":"A. B. Lobo","family":"Ribeiro","sequence":"additional","affiliation":[]},{"given":"S.","family":"Silva","sequence":"additional","affiliation":[]},{"given":"O.","family":"Fraz\u00e3o","sequence":"additional","affiliation":[]}],"member":"250","published-online":{"date-parts":[[2023,10,18]]},"reference":[{"key":"R1","doi-asserted-by":"crossref","unstructured":"Rao Y.-J., Jackson D. A., Meas. Sci. Technol., 7, (1996)","DOI":"10.1088\/0957-0233\/7\/7\/001"},{"key":"R2","doi-asserted-by":"crossref","unstructured":"Ma J., Zhao M., Huang X., Bae H., Chen Y., Yu M., Optics Express, 24, (2016)","DOI":"10.1364\/OE.24.019008"},{"key":"R3","doi-asserted-by":"crossref","unstructured":"Guo Z., Lv W., Wang W., Chen Q., Zhang X., Chen H., Ma Z., Sensors, 19, (2019)","DOI":"10.3390\/s19071628"}],"container-title":["EPJ Web of Conferences"],"original-title":[],"link":[{"URL":"https:\/\/www.epj-conferences.org\/10.1051\/epjconf\/202328709039\/pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,18]],"date-time":"2023-10-18T12:14:48Z","timestamp":1697631288000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.epj-conferences.org\/10.1051\/epjconf\/202328709039"}},"subtitle":[],"editor":[{"given":"B.","family":"Kibler","sequence":"first","affiliation":[]},{"given":"G.","family":"Millot","sequence":"additional","affiliation":[]},{"given":"P.","family":"Segonds","sequence":"additional","affiliation":[]}],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":3,"alternative-id":["epjconf_eosam2023_09039"],"URL":"https:\/\/doi.org\/10.1051\/epjconf\/202328709039","relation":{},"ISSN":["2100-014X"],"issn-type":[{"value":"2100-014X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023]]}}}