{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,6]],"date-time":"2025-11-06T15:40:31Z","timestamp":1762443631317},"reference-count":12,"publisher":"EDP Sciences","license":[{"start":{"date-parts":[[2018,9,21]],"date-time":"2018-09-21T00:00:00Z","timestamp":1537488000000},"content-version":"vor","delay-in-days":263,"URL":"http:\/\/creativecommons.org\/licenses\/by\/4.0"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["MATEC Web Conf."],"published-print":{"date-parts":[[2018]]},"abstract":"<jats:p>Shearography found many industrial applications as a non-destructive testing method due to its high spatial resolution and contactless measurements. However, to detect small structural damage, shearography should be enhanced by applying advanced signal processing methods to results of experimental testing. In this paper, the authors present an enhanced method based on the best tree wavelet packet analysis, which allows for extraction of the most informative nodes from the 2D wavelet packet decomposition tree. The proposed method is more effective than typical wavelet transforms due to its ability of adaptive selection of the best basis. The efficiency of the method was verified experimentally on damaged plates. The obtained results clearly show high sensitivity to the introduced small damage, which make the method attractive for industrial applications.<\/jats:p>","DOI":"10.1051\/matecconf\/201820406002","type":"journal-article","created":{"date-parts":[[2018,9,21]],"date-time":"2018-09-21T08:21:01Z","timestamp":1537518061000},"page":"06002","source":"Crossref","is-referenced-by-count":2,"title":["Enhancement of shearography-based damage identification using best tree wavelet packet analysis"],"prefix":"10.1051","volume":"204","author":[{"given":"Andrzej","family":"Katunin","sequence":"first","affiliation":[]},{"given":"Hernani","family":"Lopes","sequence":"additional","affiliation":[]},{"given":"Jos\u00e9 Viriato Ara\u00fajo","family":"dos Santos","sequence":"additional","affiliation":[]}],"member":"250","published-online":{"date-parts":[[2018,9,21]]},"reference":[{"key":"R1","unstructured":"Steinchen W., Yang L., Digital Shearography: Theory and Application of Digital Speckle Pattern Shearing Interferometry, SPIE Press, 2003"},{"key":"R2","doi-asserted-by":"crossref","unstructured":"Hung Y.Y., Displacement and strain measurement, in: R.K. 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