{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,9]],"date-time":"2026-01-09T18:12:49Z","timestamp":1767982369426,"version":"3.49.0"},"reference-count":49,"publisher":"AIP Publishing","issue":"7","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2009,7,1]]},"abstract":"<jats:p>PoDFluX is a new Monte Carlo ray-tracing program that simulates from first principles x-ray powder diffraction from crystalline materials and x-ray fluorescence from materials with a defined elemental composition. This model has been written primarily for the optimization of miniaturized planetary x-ray diffraction instrumentation but wider applications are certainly possible. A particular strength of the model is the implementation of several variance-reduction techniques for the minimization of execution times. Comparisons of model output with experimental diffraction and fluorescence data show good quantitative agreement.<\/jats:p>","DOI":"10.1063\/1.3160018","type":"journal-article","created":{"date-parts":[[2009,7,10]],"date-time":"2009-07-10T22:59:15Z","timestamp":1247266755000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":10,"title":["PoDFluX: A new Monte Carlo ray-tracing model for powder diffraction and fluorescence"],"prefix":"10.1063","volume":"80","author":[{"given":"Graeme M.","family":"Hansford","sequence":"first","affiliation":[{"name":"University of Leicester Space Research Centre, Department of Physics and Astronomy, , Leicester LE1 7RH, United Kingdom"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"317","published-online":{"date-parts":[[2009,7,10]]},"reference":[{"key":"2023070322320109300_c1","doi-asserted-by":"publisher","first-page":"82","DOI":"10.1016\/S0168-583X(03)01538-6","volume":"213","year":"2004","journal-title":"Nucl. Instrum. Methods Phys. Res. B"},{"key":"2023070322320109300_c2","year":"2008"},{"key":"2023070322320109300_c3","doi-asserted-by":"publisher","first-page":"270","DOI":"10.1109\/TNS.2006.869826","volume":"53","year":"2006","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"2023070322320109300_c4","volume-title":"ITS Version 5.0, The Integrated TIGER Series of Coupled Electron\/Photon Monte Carlo Transport Codes, SAND2004\u20135172","year":"2004"},{"key":"2023070322320109300_c5a","unstructured":"H. Hirayama , Y.Namito , A. F.Bielajew , S. J.Wilderman , and W. R.Nelson , The EGS5 Code System, SLAC Report No. SLAC-R-730, 2009;"},{"key":"2023070322320109300_c5b","unstructured":"KEK Report No. 2005\u20138, 2009."},{"key":"2023070322320109300_c6","doi-asserted-by":"publisher","first-page":"31","DOI":"10.1063\/1.2720455","volume":"896","year":"2007","journal-title":"AIP Conf. Proc."},{"key":"2023070322320109300_c7","volume-title":"FLUKA: A Multi-Particle Transport Code","year":"2008"},{"key":"2023070322320109300_c8","doi-asserted-by":"publisher","first-page":"344","DOI":"10.1016\/0168-9002(94)91906-2","volume":"347","year":"1994","journal-title":"Nucl. Instrum. Methods Phys. Res. A"},{"key":"2023070322320109300_c9","doi-asserted-by":"crossref","DOI":"10.1007\/978-3-540-74561-7","volume-title":"Modern Developments in X-Ray and Neutron Optics","author":"Erko","year":"2008"},{"key":"2023070322320109300_c10","doi-asserted-by":"publisher","first-page":"E735","DOI":"10.1016\/j.physb.2004.03.193","volume":"350","year":"2004","journal-title":"Physica B"},{"key":"2023070322320109300_c11","doi-asserted-by":"publisher","first-page":"1032","DOI":"10.1016\/j.physb.2006.05.329","volume":"385-386","year":"2006","journal-title":"Physica B"},{"key":"2023070322320109300_c12a","doi-asserted-by":"publisher","first-page":"25","DOI":"10.1080\/10448630008233764","volume":"11","year":"2000","journal-title":"Neutron News"},{"key":"2023070322320109300_c12b"},{"key":"2023070322320109300_c13","doi-asserted-by":"publisher","first-page":"109","DOI":"10.1117\/12.559817","volume":"5536","year":"2004","journal-title":"Proc. SPIE"},{"key":"2023070322320109300_c14","doi-asserted-by":"publisher","first-page":"15","DOI":"10.1080\/10448630208218489","volume":"13","year":"2002","journal-title":"Neutron News"},{"key":"2023070322320109300_c15"},{"key":"2023070322320109300_c16","doi-asserted-by":"publisher","first-page":"127","DOI":"10.1016\/j.nima.2007.05.050","volume":"580","year":"2007","journal-title":"Nucl. Instrum. Methods Phys. Res. A"},{"key":"2023070322320109300_c17"},{"key":"2023070322320109300_c18","doi-asserted-by":"publisher","first-page":"192","DOI":"10.4028\/www.scientific.net\/MSF.321-324.192","volume":"321\u2013324","year":"2000","journal-title":"Mat. Sci. Forum"},{"key":"2023070322320109300_c19","year":"2007"},{"key":"2023070322320109300_c20a","year":"2006"},{"key":"2023070322320109300_c20b"},{"key":"2023070322320109300_c21","doi-asserted-by":"publisher","first-page":"255","DOI":"10.1002\/(SICI)1097-4539(199907\/08)28:4&lt;255::AID-XRS347&gt;3.0.CO;2-Y","volume":"28","year":"1999","journal-title":"X-Ray Spectrom."},{"key":"2023070322320109300_c22","volume-title":"An Introduction to Ray Tracing","author":"Glassner","year":"1989"},{"key":"2023070322320109300_c23","volume-title":"Handbook of X-Ray Spectrometry","author":"van Grieken","year":"2002"},{"key":"2023070322320109300_c24","volume-title":"Quantitative X-Ray Spectrometry","year":"1995","edition":"2nd ed."},{"key":"2023070322320109300_c25"},{"key":"2023070322320109300_c26","doi-asserted-by":"publisher","first-page":"1725","DOI":"10.1016\/j.sab.2004.03.014","volume":"59","year":"2004","journal-title":"Spectrochim. Acta, Part B"},{"key":"2023070322320109300_c27","volume-title":"International Tables for Crystallography","author":"Wilson","year":"1992"},{"key":"2023070322320109300_c28","volume-title":"Introduction to X-Ray Powder Diffractometry","year":"1996"},{"key":"2023070322320109300_c29","volume-title":"The Optical Principles of the Diffraction of X-Rays","year":"1962"},{"key":"2023070322320109300_c30","volume-title":"X-Ray Diffraction","year":"1969"},{"key":"2023070322320109300_c31","volume-title":"Elements of X-Ray Diffraction","year":"2001","edition":"3rd ed."},{"key":"2023070322320109300_c32","first-page":"247","volume":"88","year":"2003","journal-title":"Am. Mineral."},{"key":"2023070322320109300_c33","doi-asserted-by":"publisher","first-page":"21","DOI":"10.1002\/(SICI)1097-4539(199601)25:1&lt;21::AID-XRS132&gt;3.0.CO;2-S","volume":"25","year":"1996","journal-title":"X-Ray Spectrom."},{"key":"2023070322320109300_c34","volume-title":"International Tables for Crystallography","author":"Hahn","year":"1995","edition":"4th ed."},{"key":"2023070322320109300_c35","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4613-1059-4","volume-title":"Monte Carlo Transport of Electrons and Photons","author":"Jenkins","year":"1988"},{"key":"2023070322320109300_c36","volume-title":"Elements of X-Ray Crystallography","year":"1968"},{"key":"2023070322320109300_c37","first-page":"1104","volume":"78","year":"1993","journal-title":"Am. Mineral."},{"key":"2023070322320109300_c38","first-page":"1877","volume":"52","year":"1967","journal-title":"Am. Mineral."},{"key":"2023070322320109300_c39","volume-title":"Standard X-Ray Diffraction Powder Patterns","year":"1954"},{"key":"2023070322320109300_c40","doi-asserted-by":"publisher","first-page":"267","DOI":"10.1107\/S0021889886089458","volume":"19","year":"1986","journal-title":"J. Appl. Crystallogr."},{"key":"2023070322320109300_c41","doi-asserted-by":"publisher","first-page":"85","DOI":"10.1127\/0028-3649\/2002\/2002-0085","volume":"2002","year":"2002","journal-title":"Neues Jahrb. Mineral., Monatsh."},{"key":"2023070322320109300_c42","volume-title":"The Calibration Requirements for Spectral Analysis (Definition of RMF and ARF File Formats)","year":"2007"},{"key":"2023070322320109300_c43","doi-asserted-by":"crossref","DOI":"10.1093\/oso\/9780198555773.001.0001","volume-title":"The Rietveld Method","author":"Young","year":"1993"},{"key":"2023070322320109300_c44","doi-asserted-by":"publisher","first-page":"181","DOI":"10.1006\/adnd.1993.1013","volume":"54","year":"1993","journal-title":"At. Data Nucl. Data Tables"},{"key":"2023070322320109300_c45","year":"2008"},{"key":"2023070322320109300_c46","volume-title":"X-Ray Diffraction Procedures for Polycrystalline and Amorphous Materials","year":"1974"}],"container-title":["Review of Scientific Instruments"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.aip.org\/aip\/rsi\/article-pdf\/doi\/10.1063\/1.3160018\/9926151\/073903_1_online.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/pubs.aip.org\/aip\/rsi\/article-pdf\/doi\/10.1063\/1.3160018\/9926151\/073903_1_online.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,15]],"date-time":"2024-03-15T05:06:52Z","timestamp":1710479212000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.aip.org\/rsi\/article\/80\/7\/073903\/352033\/PoDFluX-A-new-Monte-Carlo-ray-tracing-model-for"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009,7,1]]},"references-count":49,"journal-issue":{"issue":"7","published-print":{"date-parts":[[2009,7,1]]}},"URL":"https:\/\/doi.org\/10.1063\/1.3160018","relation":{},"ISSN":["0034-6748","1089-7623"],"issn-type":[{"value":"0034-6748","type":"print"},{"value":"1089-7623","type":"electronic"}],"subject":[],"published-other":{"date-parts":[[2009,7]]},"published":{"date-parts":[[2009,7,1]]},"article-number":"073903"}}