{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,27]],"date-time":"2026-05-27T12:00:42Z","timestamp":1779883242132,"version":"3.53.1"},"reference-count":34,"publisher":"AIP Publishing","issue":"10","funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["21727804"],"award-info":[{"award-number":["21727804"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["11604085"],"award-info":[{"award-number":["11604085"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["21625301"],"award-info":[{"award-number":["21625301"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,10,1]]},"abstract":"<jats:p>Dissociative electron attachment (DEA) of a molecular target XY, e\u2212 + XY \u2192 XY\u2212 \u2192 X + Y\u2212, is an important process in plasma, atmosphere, interstellar space, and ionizing radiation. DEA dynamics, i.e., the formation and fragmentation of an electron\u2013molecule resonant complex, can be unveiled by measuring the product Y\u2212 with the velocity map imaging (VMI) technique. However, it is still challenging to achieve a high-resolution VMI measurement. Recently, we developed a high-resolution DEA apparatus that combined the VMI technique with a trochoidal electron monochromator. The energy spread (around 500\u00a0meV) of thermally emitted incident electrons can be reduced remarkably, but the monochromatized electrons become diffuse again in energy when being pulsed with an electric pulse applied on the grid electrode because the electron beam must be pulsed in the VMI measurement. Now this long-standing technical contradiction is settled by introducing a parallel resistance-capacitor circuit to the electrode of an electron gun. A delay-line detector is used for the VMI measurement, which allows the three-dimensional velocity or momentum images of multiple anionic yields to be recorded efficiently. Our high-resolution VMI apparatus works at a pulse frequency of 5\u00a0kHz and an energy spread of about 120\u2013150\u00a0meV, and its credible performances are exhibited by the measurements of the DEA processes of CO(a3\u03a0) and NO2.<\/jats:p>","DOI":"10.1063\/5.0229674","type":"journal-article","created":{"date-parts":[[2024,10,10]],"date-time":"2024-10-10T12:41:28Z","timestamp":1728564088000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":4,"title":["High-resolution anionic velocity map imaging apparatus for dissociative electron attachment dynamics study"],"prefix":"10.1063","volume":"95","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-8623-1916","authenticated-orcid":false,"given":"Jingchen","family":"Xie","sequence":"first","affiliation":[{"name":"Department of Chemical Physics, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), University of Science and Technology of China 1 , Hefei 230026,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9792-6218","authenticated-orcid":false,"given":"Xiao-Fei","family":"Gao","sequence":"additional","affiliation":[{"name":"Department of Chemical Physics, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), University of Science and Technology of China 1 , Hefei 230026,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-1462-5498","authenticated-orcid":false,"given":"Mengyuan","family":"Fan","sequence":"additional","affiliation":[{"name":"Department of Chemical Physics, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), University of Science and Technology of China 1 , Hefei 230026,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Hao","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Chemical Physics, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), University of Science and Technology of China 1 , Hefei 230026,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Bin","family":"Wu","sequence":"additional","affiliation":[{"name":"Department of Chemical Physics, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), University of Science and Technology of China 1 , Hefei 230026,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2836-6277","authenticated-orcid":false,"given":"Shan Xi","family":"Tian","sequence":"additional","affiliation":[{"name":"Department of Chemical Physics, Collaborative Innovation Center of Chemistry for Energy Materials (iChEM), University of Science and Technology of China 1 , Hefei 230026,","place":["China"]},{"name":"Hefei National Research Center for Physical Sciences at Microscale, University of Science and Technology of China 2 , Hefei 230026,","place":["China"]},{"name":"Hefei National Laboratory, University of Science and Technology of China 3 , Hefei 230088,","place":["China"]},{"name":"State Key Laboratory of Molecular Reaction Dynamics, Dalian Institute of Chemical Physics, Chinese Academy of Sciences 4 , Dalian 116023,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"317","published-online":{"date-parts":[[2024,10,10]]},"reference":[{"key":"2024101012325633800_c1","volume-title":"Electron-Molecule Interactions and Their Applications","author":"Christophorou","year":"1984"},{"key":"2024101012325633800_c2","doi-asserted-by":"publisher","first-page":"1658","DOI":"10.1126\/science.287.5458.1658","volume":"287","year":"2000","journal-title":"Science"},{"key":"2024101012325633800_c3","doi-asserted-by":"publisher","first-page":"1765","DOI":"10.1021\/acs.chemrev.6b00480","volume":"117","year":"2017","journal-title":"Chem. Rev."},{"key":"2024101012325633800_c4","doi-asserted-by":"publisher","first-page":"258","DOI":"10.1038\/nchem.2427","volume":"8","year":"2016","journal-title":"Nat. Chem."},{"key":"2024101012325633800_c5","doi-asserted-by":"publisher","first-page":"3477","DOI":"10.1063\/1.1148310","volume":"68","year":"1997","journal-title":"Rev. Sci. Instrum."},{"key":"2024101012325633800_c6","doi-asserted-by":"publisher","first-page":"053107","DOI":"10.1063\/1.1899404","volume":"76","year":"2005","journal-title":"Rev. Sci. Instrum."},{"key":"2024101012325633800_c7","doi-asserted-by":"publisher","first-page":"023106","DOI":"10.1063\/1.3685244","volume":"83","year":"2012","journal-title":"Rev. Sci. Instrum."},{"key":"2024101012325633800_c8","doi-asserted-by":"publisher","first-page":"013108","DOI":"10.1063\/1.3678328","volume":"83","year":"2012","journal-title":"Rev. Sci. Instrum."},{"key":"2024101012325633800_c9","doi-asserted-by":"publisher","first-page":"033104","DOI":"10.1063\/1.4794093","volume":"84","year":"2013","journal-title":"Rev. Sci. Instrum."},{"key":"2024101012325633800_c10","doi-asserted-by":"publisher","first-page":"1899","DOI":"10.1103\/physreva.2.1899","volume":"2","year":"1970","journal-title":"Phys. Rev. A"},{"key":"2024101012325633800_c11","doi-asserted-by":"publisher","first-page":"353","DOI":"10.1016\/0022-2860(92)80091-u","volume":"266","year":"1992","journal-title":"J.\u00a0Mol. Struct."},{"key":"2024101012325633800_c12","doi-asserted-by":"publisher","first-page":"1415","DOI":"10.1088\/0953-4075\/34\/8\/307","volume":"34","year":"2001","journal-title":"J.\u00a0Phys. B: At. Mol. Opt. Phys."},{"key":"2024101012325633800_c13","doi-asserted-by":"publisher","first-page":"15","DOI":"10.1016\/j.ijms.2007.11.004","volume":"271","year":"2008","journal-title":"Int. J. Mass Spectrom."},{"key":"2024101012325633800_c14","doi-asserted-by":"publisher","first-page":"032703","DOI":"10.1103\/physreva.99.032703","volume":"99","year":"2019","journal-title":"Phys. Rev. A"},{"key":"2024101012325633800_c15","doi-asserted-by":"publisher","first-page":"052010","DOI":"10.1088\/1742-6596\/1412\/5\/052010","volume":"1412","year":"2020","journal-title":"J.\u00a0Phys.: Conf. Ser."},{"key":"2024101012325633800_c16","doi-asserted-by":"publisher","first-page":"052705","DOI":"10.1103\/physreva.99.052705","volume":"99","year":"2019","journal-title":"Phys. Rev. A"},{"key":"2024101012325633800_c17","doi-asserted-by":"publisher","first-page":"138","DOI":"10.1088\/0022-3735\/9\/2\/024","volume":"9","year":"1976","journal-title":"J.\u00a0Phys. E: Sci. Instr."},{"key":"2024101012325633800_c18","doi-asserted-by":"publisher","first-page":"865","DOI":"10.1116\/1.569615","volume":"15","year":"1978","journal-title":"J.\u00a0Vac. Sci. Technol."},{"key":"2024101012325633800_c19","doi-asserted-by":"publisher","first-page":"423","DOI":"10.1063\/1.1684534","volume":"41","year":"1970","journal-title":"Rev. Sci. Instrum."},{"key":"2024101012325633800_c20","doi-asserted-by":"publisher","first-page":"3935","DOI":"10.1088\/0953-4075\/39\/18\/022","volume":"39","year":"2006","journal-title":"J.\u00a0Phys. B: At., Mol. Opt. Phys."},{"key":"2024101012325633800_c21","doi-asserted-by":"publisher","first-page":"348","DOI":"10.1109\/23.12740","volume":"35","year":"1988","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"2024101012325633800_c22","doi-asserted-by":"publisher","first-page":"244","DOI":"10.1016\/s0168-9002(01)01839-3","volume":"477","year":"2002","journal-title":"Nucl. Instrum. Methods Phys. Res., Sect. A"},{"key":"2024101012325633800_c23","doi-asserted-by":"publisher","first-page":"3543","DOI":"10.1021\/acs.jpca.2c02564","volume":"126","year":"2022","journal-title":"J.\u00a0Phys. Chem. A"},{"key":"2024101012325633800_c24","doi-asserted-by":"publisher","first-page":"598","DOI":"10.1021\/acs.jpclett.2c03697","volume":"14","year":"2023","journal-title":"J.\u00a0Phys. Chem. Lett."},{"key":"2024101012325633800_c25","doi-asserted-by":"publisher","first-page":"181101","DOI":"10.1063\/5.0151914","volume":"158","year":"2023","journal-title":"J.\u00a0Chem. Phys."},{"key":"2024101012325633800_c26","doi-asserted-by":"publisher","first-page":"209","DOI":"10.1016\/s1387-3806(00)00378-x","volume":"205","year":"2001","journal-title":"Int. J. Mass Spectrom."},{"key":"2024101012325633800_c27","doi-asserted-by":"publisher","first-page":"284","DOI":"10.1016\/j.icarus.2017.01.037","volume":"288","year":"2017","journal-title":"Icarus"},{"key":"2024101012325633800_c28","doi-asserted-by":"publisher","first-page":"374","DOI":"10.1086\/173732","volume":"422","year":"1994","journal-title":"Astrophys. J."},{"key":"2024101012325633800_c29","doi-asserted-by":"publisher","first-page":"032712","DOI":"10.1103\/physreva.79.032712","volume":"79","year":"2009","journal-title":"Phys. Rev. A"},{"key":"2024101012325633800_c30","doi-asserted-by":"publisher","first-page":"185201","DOI":"10.1088\/1361-6455\/ac2c8b","volume":"54","year":"2021","journal-title":"J.\u00a0Phys. B: At. Mol. Opt. Phys."},{"key":"2024101012325633800_c31","doi-asserted-by":"publisher","first-page":"3610","DOI":"10.1063\/1.1147067","volume":"67","year":"1996","journal-title":"Rev. Sci. Instrum."},{"key":"2024101012325633800_c32","doi-asserted-by":"publisher","first-page":"393","DOI":"10.1016\/0370-1573(95)00022-4","volume":"264","year":"1996","journal-title":"Phys. Rep."},{"key":"2024101012325633800_c33","doi-asserted-by":"publisher","first-page":"062707","DOI":"10.1103\/physreva.82.062707","volume":"82","year":"2010","journal-title":"Phys. Rev. A"},{"key":"2024101012325633800_c34","doi-asserted-by":"publisher","first-page":"587","DOI":"10.1007\/s100530050385","volume":"7","year":"1999","journal-title":"Eur. Phys. J. D"}],"container-title":["Review of Scientific Instruments"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.aip.org\/aip\/rsi\/article-pdf\/doi\/10.1063\/5.0229674\/20202895\/103202_1_5.0229674.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/pubs.aip.org\/aip\/rsi\/article-pdf\/doi\/10.1063\/5.0229674\/20202895\/103202_1_5.0229674.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,10,10]],"date-time":"2024-10-10T12:41:31Z","timestamp":1728564091000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.aip.org\/rsi\/article\/95\/10\/103202\/3316198\/High-resolution-anionic-velocity-map-imaging"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,10,1]]},"references-count":34,"journal-issue":{"issue":"10","published-print":{"date-parts":[[2024,10,1]]}},"URL":"https:\/\/doi.org\/10.1063\/5.0229674","relation":{},"ISSN":["0034-6748","1089-7623"],"issn-type":[{"value":"0034-6748","type":"print"},{"value":"1089-7623","type":"electronic"}],"subject":[],"published-other":{"date-parts":[[2024,10,1]]},"published":{"date-parts":[[2024,10,1]]},"article-number":"103202"}}