{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T15:03:59Z","timestamp":1754147039410,"version":"3.41.2"},"reference-count":22,"publisher":"AIP Publishing","issue":"7","funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["12475212","12235014"],"award-info":[{"award-number":["12475212","12235014"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2025,7,1]]},"abstract":"<jats:p>Laser-driven plasma diagnostics commonly rely on high-resolution monochromatic x-ray imaging using \u03b1-quartz (211) spherical crystals at an 88.7\u00b0 Bragg angle for the Cu K\u03b1 characteristic line. However, the performance of this imaging approach is constrained by astigmatism-induced resolution limits (&amp;lt;10\u00a0\u03bcm) and background noise interference. To overcome this, we developed a toroidal crystal system utilizing the fourth-order diffraction of an Si (111) crystal with a Bragg angle of 79.33\u00b0, effectively addressing the astigmatism problem associated with traditional spherical crystals and considerably reducing background noise caused by suprathermal electrons. This system demonstrated a spatial resolution of 3\u201310\u00a0\u03bcm across a 2\u00a0mm field of view (FOV) in offline x-ray experiments. Calibrated tests at the XingGuang III laser facility further confirmed its high signal-to-noise-ratio imaging performance, achieving a spatial resolution of 4\u201310\u00a0\u03bcm within a 400\u00a0\u03bcm FOV. Overall, this study establishes a novel x-ray imaging technique based on a toroidal crystal system, enhancing the quality and reliability of Cu K\u03b1 line imaging for laser-driven plasma diagnostics.<\/jats:p>","DOI":"10.1063\/5.0270802","type":"journal-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T12:37:01Z","timestamp":1752842221000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":0,"title":["High-resolution monochromatic backlit imaging of the Cu K\u03b1 characteristic line using a toroidal crystal system for plasma diagnostics"],"prefix":"10.1063","volume":"96","author":[{"given":"Ke","family":"Dong","sequence":"first","affiliation":[{"name":"MOE Key Laboratory of Advanced Micro-Structured Materials, School of Physics Science and Engineering, Tongji University 1 , Shanghai 200092,","place":["China"]},{"name":"Institute of Precision Optical Engineering, School of Physics Science and 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