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This approach integrates the complete vdP switching architecture directly into the printed circuit board of the sample holder, thereby eliminating the need for external switching circuits, auxiliary control software, and standalone measurement instruments. By keeping the entire measurement signal path within the PPMS environment, the method significantly reduces noise pickup, enabling resistance measurements from 4 \u03bc\u03a9 to 4 M\u03a9 over the full PPMS temperature range (1.8\u2013400\u00a0K) and magnetic fields up to 9\u00a0T. The performance of the system was validated through Hall-coefficient measurements on a high-purity germanium single crystal, yielding temperature-dependent behavior in excellent agreement with the literature. Importantly, all measurement configurations are executed through the native interface of the PPMS (MultiVu), transforming Hall-effect experiments into a simplified, self-contained, and highly reproducible workflow. 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