{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,9,22]],"date-time":"2026-09-22T14:00:15Z","timestamp":1790085615168,"version":"4.0.1"},"reference-count":24,"publisher":"AIP Publishing","issue":"9","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2026,9,1]]},"abstract":"<jats:p>Sensitive in-circuit impedance measurement is often limited by the response separation between practical short and open standards after receiving-network, cable, and fixture residuals are included. We present a response-separation-guided line impedance stabilization network (LISN)\u2013probe apparatus for fixed-plane impedance extraction. The calibrated asymmetric LISN\u2013probe combination uses a LISN for isolation and coupling, while the current-probe interface lowers equivalent receiving-port impedance. An equivalent-port model, short\u2013open\u2013load (SOL) calibration at a fixed device-under-test (DUT) plane, and a response-noise-aware local impedance-resolution proxy separate global end point-response contrast from one-standard-deviation noise-equivalent local impedance fluctuation. At 1\u00a0MHz, measured short\u2013open response-separation gains are 24.6 dB over the dual-LISN path and 33.6 dB over the dual-probe-plus-LISN path, corresponding to \u223c17-fold and 48-fold increases in global short\u2013open response ratio. Local fluctuation is evaluated independently through the SOL-inversion Jacobian and measured repeated-DUT-response covariance. Apparatus-level validation is restricted to 0.5\u201310\u00a0MHz. Passive-standard tests show that increased response separation is not a universal accuracy improvement: the LISN\u2013probe method gives 95th-percentile errors of 1.5% and 8.1% for the 255 \u03a9 and 1.5 k\u03a9 standards, while the dual-LISN path is preferable at 5 \u03a9. Probe and LISN fits give normalized root-mean-square errors of 2.72% and 2.62%, respectively. The apparatus also resolves current-dependent magnetic-component impedance changes, with a series-equivalent decomposition quantifying resistance and inductance reductions. Results establish the sensitivity benefit, measurement-performance boundary, and validated frequency range of this fixed-plane apparatus, without claiming a general modal electromagnetic-interference compliance measurement.<\/jats:p>","DOI":"10.1063\/5.0350528","type":"journal-article","created":{"date-parts":[[2026,9,22]],"date-time":"2026-09-22T13:05:56Z","timestamp":1790082356000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":0,"title":["Response-separation-guided line impedance stabilization network\u2013probe apparatus for fixed-plane in-circuit impedance measurement"],"prefix":"10.1063","volume":"97","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-7880-9614","authenticated-orcid":false,"given":"Guozheng","family":"Zhang","sequence":"first","affiliation":[{"name":"Southwest University of Science and Technology , Mianyang 621010,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0456-6063","authenticated-orcid":false,"given":"Yuyu","family":"Zhu","sequence":"additional","affiliation":[{"name":"Southwest University of Science and Technology , Mianyang 621010,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2453-1995","authenticated-orcid":false,"given":"Haoran","family":"Li","sequence":"additional","affiliation":[{"name":"Southwest University of Science and Technology , Mianyang 621010,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jianyao","family":"Ye","sequence":"additional","affiliation":[{"name":"Southwest University of Science and Technology , Mianyang 621010,","place":["China"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"317","published-online":{"date-parts":[[2026,9,22]]},"reference":[{"key":"2026092209054679700_c1","doi-asserted-by":"publisher","first-page":"1157","DOI":"10.1109\/tpel.2012.2209206","article-title":"A high frequency equivalent circuit and parameter extraction procedure for common mode choke in the EMI filter","volume":"28","year":"2013","journal-title":"IEEE Trans. Power Electron."},{"issue":"4","key":"2026092209054679700_c2","doi-asserted-by":"publisher","first-page":"1349","DOI":"10.1109\/TEMC.2019.2941449","article-title":"Novel measurement procedure for switched-mode power supply modal impedances","volume":"62","year":"2020","journal-title":"IEEE Trans. Electromagn. Compat."},{"issue":"23","key":"2026092209054679700_c3","doi-asserted-by":"publisher","first-page":"12497","DOI":"10.3390\/app122312497","article-title":"Enhanced impedance measurement to predict electromagnetic interference attenuation provided by EMI filters in systems with AC\/DC converters","volume":"12","year":"2022","journal-title":"Appl. Sci."},{"issue":"17","key":"2026092209054679700_c4","doi-asserted-by":"publisher","first-page":"3963","DOI":"10.1049\/iet-pel.2020.0493","article-title":"EMI filter design for single-phase grid-connected inverter with noise source impedance consideration","volume":"13","year":"2020","journal-title":"IET Power Electron."},{"issue":"1","key":"2026092209054679700_c5","doi-asserted-by":"publisher","first-page":"45","DOI":"10.1109\/MEMC.2019.8681368","article-title":"EMI filter design of single-phase SiC MOSFET inverter with extracted noise source impedance","volume":"8","year":"2019","journal-title":"IEEE Electromagn. Compat. Mag."},{"issue":"3","key":"2026092209054679700_c6","doi-asserted-by":"publisher","first-page":"862","DOI":"10.1109\/tpel.2004.826520","article-title":"Measurement of noise source impedance of SMPS using a two probes approach","volume":"19","year":"2004","journal-title":"IEEE Trans. Power Electron."},{"key":"2026092209054679700_c7","doi-asserted-by":"publisher","first-page":"820","DOI":"10.1109\/63.867670","article-title":"Measurement of noise source impedance of off-line converters","volume":"15","year":"2000","journal-title":"IEEE Trans. Power Electron."},{"key":"2026092209054679700_c8","doi-asserted-by":"publisher","first-page":"111","DOI":"10.1109\/TPEL.2009.2024675","article-title":"Accurate extraction of noise source impedance of an SMPS under operating conditions","volume":"25","year":"2010","journal-title":"IEEE Trans. Power Electron."},{"key":"2026092209054679700_c9","doi-asserted-by":"publisher","first-page":"110007","DOI":"10.1016\/j.measurement.2021.110007","article-title":"Improved calibration technique for two-probe setup to enhance its in-circuit impedance measurement accuracy","volume":"185","year":"2021","journal-title":"Measurement"},{"key":"2026092209054679700_c10","first-page":"214","volume-title":"An improved dual-probe approach to measure noise source impedance","year":"2010"},{"key":"2026092209054679700_c11","doi-asserted-by":"publisher","first-page":"1000908","DOI":"10.1109\/TIM.2020.3013688","article-title":"Eliminating the effect of probe-to-probe coupling in inductive coupling method for in-circuit impedance measurement","volume":"70","year":"2021","journal-title":"IEEE Trans. Instrum. Meas."},{"key":"2026092209054679700_c12","first-page":"1","article-title":"Two-probe online impedance measurement setup with improved SNR and enhanced ruggedness","year":"2020"},{"issue":"1","key":"2026092209054679700_c13","doi-asserted-by":"publisher","first-page":"2","DOI":"10.1109\/TEMC.2021.3091761","article-title":"Single-probe inductively coupled in-circuit impedance measurement","volume":"64","year":"2022","journal-title":"IEEE Trans. Electromagn. Compat."},{"issue":"3","key":"2026092209054679700_c14","doi-asserted-by":"publisher","first-page":"752","DOI":"10.1109\/TEMC.2020.3025459","article-title":"Proposing an improved DC LISN for measuring conducted EMI noise","volume":"63","year":"2021","journal-title":"IEEE Trans. Electromagn. Compat."},{"issue":"6","key":"2026092209054679700_c15","doi-asserted-by":"publisher","first-page":"4132","DOI":"10.1109\/tpel.2016.2631578","article-title":"A noise source impedance extraction method for operating SMPS using modified LISN and simplified calibration procedure","volume":"32","year":"2017","journal-title":"IEEE Trans. Power Electron."},{"issue":"7","key":"2026092209054679700_c16","doi-asserted-by":"publisher","first-page":"7616","DOI":"10.1109\/TIE.2024.3515271","article-title":"In-circuit impedance extraction of individual components in power converter using capacitive coupling fixture adapters method for electromagnetic interference estimation","volume":"72","year":"2025","journal-title":"IEEE Trans. Ind. Electron."},{"key":"2026092209054679700_c17","doi-asserted-by":"publisher","first-page":"9000310","DOI":"10.1109\/TIM.2024.3509536","article-title":"Modeling of in-circuit impedance measurement for SMPS considering power noise source","volume":"74","year":"2025","journal-title":"IEEE Trans. Instrum. Meas."},{"issue":"8","key":"2026092209054679700_c18","doi-asserted-by":"publisher","first-page":"7821","DOI":"10.1109\/TIE.2023.3239906","article-title":"VNA-based fixture adapters for wideband accurate impedance extraction of single-phase EMI filtering chokes","volume":"70","year":"2023","journal-title":"IEEE Trans. Ind. Electron."},{"key":"2026092209054679700_c19","first-page":"1","article-title":"Extending the usable range of the 2-port shunt through impedance measurement","year":"2016"},{"key":"2026092209054679700_c20","doi-asserted-by":"publisher","first-page":"1442","DOI":"10.1109\/tpwrd.2004.829873","article-title":"Impedance measurement for improved power quality-part 1: The measurement technique","volume":"19","year":"2004","journal-title":"IEEE Trans. Power Delivery"},{"issue":"10","key":"2026092209054679700_c21","doi-asserted-by":"publisher","first-page":"100503","DOI":"10.1149\/1945-7111\/ac9553","article-title":"A statistical design approach on electrochemical impedance spectroscopy of NMC Li-ion battery","volume":"169","year":"2022","journal-title":"J.\u00a0Electrochem. Soc."},{"issue":"10","key":"2026092209054679700_c22","doi-asserted-by":"publisher","first-page":"e202300232","DOI":"10.1002\/elan.202300232","article-title":"Equivalent circuit model for electrochemical impedance spectroscopy of commercial 18650 lithium-ion cell under over-discharge and overcharge conditions","volume":"36","year":"2024","journal-title":"Electroanalysis"},{"issue":"1","key":"2026092209054679700_c23","doi-asserted-by":"publisher","first-page":"297","DOI":"10.17341\/gazimmfd.463280","article-title":"Electrochemical impedance analysis of 18650 lithium-ion and 6HR61 nickel-metal hydride rechargeable batteries","volume":"35","year":"2020","journal-title":"J.\u00a0Fac. Eng. Archit. Gazi Univ."},{"key":"2026092209054679700_c24","doi-asserted-by":"publisher","first-page":"203","DOI":"10.37394\/232017.2024.15.22","article-title":"Unveiling impedance response of commercial coin-type lithium-ion batteries exposed to overcharge and over-discharge through equivalent circuit modeling","volume":"15","year":"2024","journal-title":"WSEAS Trans. Electron."}],"container-title":["Review of Scientific Instruments"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.aip.org\/aip\/rsi\/article-pdf\/doi\/10.1063\/5.0350528\/21147479\/094710_1_5.0350528.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/pubs.aip.org\/aip\/rsi\/article-pdf\/doi\/10.1063\/5.0350528\/21147479\/094710_1_5.0350528.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,22]],"date-time":"2026-09-22T13:05:56Z","timestamp":1790082356000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.aip.org\/rsi\/article\/97\/9\/094710\/3405008\/Response-separation-guided-line-impedance"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,9,1]]},"references-count":24,"journal-issue":{"issue":"9","published-print":{"date-parts":[[2026,9,1]]}},"URL":"https:\/\/doi.org\/10.1063\/5.0350528","relation":{},"ISSN":["0034-6748","1089-7623"],"issn-type":[{"value":"0034-6748","type":"print"},{"value":"1089-7623","type":"electronic"}],"subject":[],"published-other":{"date-parts":[[2026,9]]},"published":{"date-parts":[[2026,9,1]]},"article-number":"094710"}}