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The sensitivity of the interferometer is significantly improved in comparison with previously reported system. The interferometer is shown to resolve small displacements without using a lock-in technique. An example of the interferometric capabilities is demonstrated with experimental results on electric field, frequency, and time dependences of piezoelectric response for quartz and Pb(Zr,Ti)O3 thin film.<\/jats:p>","DOI":"10.1063\/1.1147000","type":"journal-article","created":{"date-parts":[[2002,7,26]],"date-time":"2002-07-26T12:32:13Z","timestamp":1027686733000},"page":"1935-1941","update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":367,"title":["Interferometric measurements of electric field-induced displacements in piezoelectric thin films"],"prefix":"10.1063","volume":"67","author":[{"given":"A. 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