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Its large stretching to lower frequencies is found to be caused by the inner dynamics of the material dielectric response when becoming governed, over higher temperatures, by the material\u2013electrode interface properties.<\/jats:p>","DOI":"10.1063\/1.127102","type":"journal-article","created":{"date-parts":[[2002,7,26]],"date-time":"2002-07-26T13:31:59Z","timestamp":1027690319000},"page":"735-737","update-policy":"http:\/\/dx.doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":6,"title":["Dynamics of resonance phenomenon and negative capacitances in the dielectric response of materials"],"prefix":"10.1063","volume":"77","author":[{"given":"Jean-Claude","family":"M\u2019Peko","sequence":"first","affiliation":[{"name":"Department Materials Science, Faculty of Physics, University of Havana, San Lazaro y L, Vedado, C. 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