{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,20]],"date-time":"2025-12-20T22:32:25Z","timestamp":1766269945312},"reference-count":17,"publisher":"AIP Publishing","issue":"5","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2002,5,1]]},"abstract":"<jats:p>An optical fiber interferometer for measuring the d33 coefficient of piezoelectric samples is described. Its configuration is based on the Mach\u2013Zehnder interferometer, and a double incidence on the thin-film samples successfully suppresses the undesirable bending effect of the substrate. Detection of the small displacement is based on an active homodyne scheme. Results are reported for a bulk piezoelectric transducer (PZT) sample and a PZT thin-film incorporated in a microactuator.<\/jats:p>","DOI":"10.1063\/1.1463713","type":"journal-article","created":{"date-parts":[[2002,7,26]],"date-time":"2002-07-26T14:24:57Z","timestamp":1027693497000},"page":"2073-2078","update-policy":"http:\/\/dx.doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":18,"title":["Optical fiber interferometer for measuring the d33 coefficient of piezoelectric thin films with compensation of substrate bending"],"prefix":"10.1063","volume":"73","author":[{"given":"J. R.","family":"Fernandes","sequence":"first","affiliation":[{"name":"Universidade de Tr\u00e1s-os-Montes e Alto-Douro, Departamento de F\u0131\u0301sica, Quinta dos Prados, Apartado 202, 5001-911\u2009Vila Real, Portugal"},{"name":"INESC Porto, Unidade de Optoelectr\u00f3nica e Sistemas Electr\u00f3nicos, Rua do Campo Alegre, 687, 4169-007\u2009Porto, Portugal"}]},{"given":"F. A.","family":"de S\u00e1","sequence":"additional","affiliation":[{"name":"Centro de F\u0131\u0301sica do Porto, Rua do Campo Alegre, 687, 4169-007\u2009Porto, Portugal"},{"name":"INESC Porto, Unidade de Optoelectr\u00f3nica e Sistemas Electr\u00f3nicos, Rua do Campo Alegre, 687, 4169-007\u2009Porto, Portugal"}]},{"given":"J. L.","family":"Santos","sequence":"additional","affiliation":[{"name":"Universidade do Porto, Faculdade de Ci\u00eancias, Departamento de F\u0131\u0301sica, Rua do Campo Alegre, 687, 4169-007\u2009Porto, Portugal"},{"name":"INESC Porto, Unidade de Optoelectr\u00f3nica e Sistemas Electr\u00f3nicos, Rua do Campo Alegre, 687, 4169-007\u2009Porto, Portugal"}]},{"given":"E.","family":"Joanni","sequence":"additional","affiliation":[{"name":"Universidade de Tr\u00e1s-os-Montes e Alto-Douro, Departamento de F\u0131\u0301sica, Quinta dos Prados, Apartado 202, 5001-911\u2009Vila Real, Portugal"},{"name":"INESC Porto, Unidade de Optoelectr\u00f3nica e Sistemas Electr\u00f3nicos, Rua do Campo Alegre, 687, 4169-007\u2009Porto, Portugal"}]}],"member":"317","reference":[{"key":"2024020700251764500_r1"},{"key":"2024020700251764500_r2","first-page":"221","volume":"11","year":"2000","journal-title":"Semiconductor Fabtech"},{"key":"2024020700251764500_r3"},{"key":"2024020700251764500_r4","doi-asserted-by":"crossref","first-page":"1764","DOI":"10.1063\/1.357693","volume":"76","year":"1994","journal-title":"J. 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