{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,26]],"date-time":"2025-10-26T14:03:07Z","timestamp":1761487387468,"version":"3.41.2"},"reference-count":8,"publisher":"AIP Publishing","issue":"10","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2005,5,15]]},"abstract":"<jats:p>Regular nanosized structures are considered to be promising materials for magnetic information storage media with high density of information. Recently attention was paid to static and dynamic magnetic properties arising from dimensional confinement in such nanostructures. Here we present an investigation of permalloy antidot arrays of different thicknesses. Thin permalloy films of thickness ranging from 10to500nm were deposited on nanoporous Al2O3 membranes with a pore size of 100nm. It was found that additional ferromagnetic resonance peaks appear for film thicknesses below 100nm, while films with larger thicknesses show resonance properties similar to continuous films. A comparison between the films deposited onto Si wafers and porous media was done. An evolution of the domain structures observed in MFM experiments was confirmed by micromagnetic calculations.<\/jats:p>","DOI":"10.1063\/1.1853691","type":"journal-article","created":{"date-parts":[[2005,5,10]],"date-time":"2005-05-10T22:01:38Z","timestamp":1115762498000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":24,"title":["Preparation, structural characterization, and dynamic properties investigation of permalloy antidot arrays"],"prefix":"10.1063","volume":"97","author":[{"given":"Andriy","family":"Vovk","sequence":"first","affiliation":[{"name":"Advanced Materials Research Institute, University of New Orleans , 2000 Lakeshore Dr., New Orleans, Louisiana 70148"}]},{"given":"Leszek","family":"Malkinski","sequence":"additional","affiliation":[{"name":"Advanced Materials Research Institute, University of New Orleans , 2000 Lakeshore Dr., New Orleans, Louisiana 70148"}]},{"given":"Vladimir","family":"Golub","sequence":"additional","affiliation":[{"name":"Advanced Materials Research Institute, University of New Orleans , 2000 Lakeshore Dr., New Orleans, Louisiana 70148"}]},{"given":"Scott","family":"Whittenburg","sequence":"additional","affiliation":[{"name":"Advanced Materials Research Institute, University of New Orleans , 2000 Lakeshore Dr., New Orleans, Louisiana 70148"}]},{"given":"Charles","family":"O\u2019Connor","sequence":"additional","affiliation":[{"name":"Advanced Materials Research Institute, University of New Orleans , 2000 Lakeshore Dr., New Orleans, Louisiana 70148"}]},{"given":"Jin-Seung","family":"Jung","sequence":"additional","affiliation":[{"name":"Department of Chemistry, Kangnung National University , Kangnung 210702, South Korea"}]},{"given":"Suk-Hong","family":"Min","sequence":"additional","affiliation":[{"name":"Department of Metal and Material Engineering, Kangnung National University , Kangnung 210702, South Korea"}]}],"member":"317","published-online":{"date-parts":[[2005,5,12]]},"reference":[{"key":"2023070201100956300_c1","doi-asserted-by":"publisher","first-page":"6322","DOI":"10.1063\/1.372693","volume":"87","year":"2000","journal-title":"J. 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