{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,30]],"date-time":"2025-09-30T10:57:08Z","timestamp":1759229828425,"version":"3.41.2"},"reference-count":16,"publisher":"AIP Publishing","issue":"10","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2005,5,15]]},"abstract":"<jats:p>Exchange coupled Mn51.5Pt48.5\u2215Co90Fe10 bottom-pinned bilayers and synthetic antiferromagnets (SAFs) were prepared by magnetron sputtering. Exchange bias, coercivity, and blocking temperature were determined as a function of the MnPt thickness. Interfacial exchange energy was found to be Jex=0.4erg\u2215cm2 for a Mn51.5Pt48.5(t\u2a7e20nm)\u2215Co90Fe10\u2008(5nm) bilayer. Thermal stability of the bilayers was analyzed by separation of the blocking temperature distribution in (a) width \u0394TB and (b) center temperature TB,center of the distribution. For thick MnPt films \u0394TB is constant but steadily increases for thin films. SAF structures show higher exchange coupling and higher blocking temperatures at thin layer thickness (tMnPt=8.5nm).<\/jats:p>","DOI":"10.1063\/1.1854411","type":"journal-article","created":{"date-parts":[[2005,5,11]],"date-time":"2005-05-11T22:19:51Z","timestamp":1115849991000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":22,"title":["Blocking temperature in exchange coupled MnPt\u2215CoFe bilayers and synthetic antiferromagnets"],"prefix":"10.1063","volume":"97","author":[{"given":"M.","family":"Rickart","sequence":"first","affiliation":[{"name":"INESC Microsystems and Nanotechnology , R. Alves Redol 9, 1000 Lisboa, Portugal"}]},{"given":"A.","family":"Guedes","sequence":"additional","affiliation":[{"name":"INESC Microsystems and Nanotechnology , R. Alves Redol 9, 1000 Lisboa, Portugal"}]},{"given":"J.","family":"Ventura","sequence":"additional","affiliation":[{"name":"IFIMUP , Universidade do Porto, R. Campo Alegre, 4100 Porto, Portugal"}]},{"given":"J. B.","family":"Sousa","sequence":"additional","affiliation":[{"name":"IFIMUP , Universidade do Porto, R. Campo Alegre, 4100 Porto, Portugal"}]},{"given":"P. P.","family":"Freitas","sequence":"additional","affiliation":[{"name":"INESC Microsystems and Nanotechnology , R. Alves Redol 9, 1000 Lisboa, Portugal"}]}],"member":"317","published-online":{"date-parts":[[2005,5,13]]},"reference":[{"key":"2023070201095524100_c1","doi-asserted-by":"publisher","first-page":"4986","DOI":"10.1063\/1.364961","volume":"81","year":"1997","journal-title":"J. Appl. Phys."},{"key":"2023070201095524100_c2","doi-asserted-by":"publisher","first-page":"6810","DOI":"10.1063\/1.367815","volume":"83","year":"1998","journal-title":"J. Appl. 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