{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,2]],"date-time":"2025-11-02T16:23:27Z","timestamp":1762100607871,"version":"3.41.2"},"reference-count":16,"publisher":"AIP Publishing","issue":"5","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2007,1,29]]},"abstract":"<jats:p>Ba Nd 2 Ti 5 O 14 (BNT) films 12\u201352\u03bcm thick were fabricated on platinum metallic foils by electrophoretic deposition (EPD). 52-\u03bcm-thick BNT film exhibits a dielectric constant and a loss tangent of 107 and 0.0006 (Q of 1600) at 1MHz, respectively. Variation in permittivity is less than 0.02% at a bias voltage \u00b18kV\u2215cm. Change of film permittivity with temperature (30\u2013120\u00b0C) is below +58.5ppm\u2215\u00b0C, pointing to a good thermal stability. Preliminary microwave measurements indicate that the losses are not significantly increased up to the gigahertz regime. EPD derived BNT thick films on metallic foils are attractive candidates for microwave communication devices.<\/jats:p>","DOI":"10.1063\/1.2435334","type":"journal-article","created":{"date-parts":[[2007,2,4]],"date-time":"2007-02-04T00:59:52Z","timestamp":1170550792000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":20,"title":["Low dielectric loss BaNd2Ti5O14 thick films prepared by an electrophoretic deposition technique"],"prefix":"10.1063","volume":"90","author":[{"given":"Zhi","family":"Fu","sequence":"first","affiliation":[{"name":"University of Aveiro Department of Ceramics and Glass Engineering, CICECO, , 3810-193 Aveiro, Portugal"}]},{"given":"Aiying","family":"Wu","sequence":"additional","affiliation":[{"name":"University of Aveiro Department of Ceramics and Glass Engineering, CICECO, , 3810-193 Aveiro, Portugal"}]},{"given":"P. M.","family":"Vilarinho","sequence":"additional","affiliation":[{"name":"University of Aveiro Department of Ceramics and Glass Engineering, CICECO, , 3810-193 Aveiro, Portugal"}]},{"given":"A. I.","family":"Kingon","sequence":"additional","affiliation":[{"name":"North Carolina State University Materials Research Center, , Raleigh, North Carolina 27695-7919"}]},{"given":"R.","family":"W\u00f6rdenweber","sequence":"additional","affiliation":[{"name":"Institute of Thin-films and Interfaces Division Superconductivity and High Frequency Sensors, , Forschungszentrum J\u00fclich GmbH, 52425 J\u00fclich, Germany"}]}],"member":"317","published-online":{"date-parts":[[2007,2,2]]},"reference":[{"key":"2023070304381729300_c1","first-page":"197","volume":"13","year":"2002","journal-title":"J. Mater. Sci.: Mater. Electron."},{"key":"2023070304381729300_c2","doi-asserted-by":"publisher","first-page":"1396","DOI":"10.1063\/1.119088","volume":"70","year":"1997","journal-title":"Appl. Phys. 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