{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,2]],"date-time":"2025-11-02T16:24:03Z","timestamp":1762100643718,"version":"3.41.2"},"reference-count":10,"publisher":"AIP Publishing","issue":"15","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2007,4,9]]},"abstract":"<jats:p>As a promising lead-free ferroelectric material, Na0.5Bi0.5TiO3 (NBT) was synthesized as thin films via a classic 2-methoxyethanol sol-gel route and chemical solution deposition method. Perovskite structure with random orientation of crystallites has been obtained on platinized silicon wafer at low temperature (460\u00b0C). Piezoelectric activity in such films was detected using electrical analysis. X-ray diffraction and piezoresponse force microscopy (PFM) have been used to analyze NBT thin films with different microstructures and properties dependent on fabrication and annealing processes.<\/jats:p>","DOI":"10.1063\/1.2721843","type":"journal-article","created":{"date-parts":[[2007,4,10]],"date-time":"2007-04-10T22:10:49Z","timestamp":1176243049000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":30,"title":["Piezoforce microscopy study of lead-free perovskite Na0.5Bi0.5TiO3 thin films"],"prefix":"10.1063","volume":"90","author":[{"given":"F.","family":"R\u00e9mondi\u00e8re","sequence":"first","affiliation":[{"name":"Institut \u201cJo\u017eef Stefan\u201d Electronic Ceramics Department, , Jamova 39, 1000 Ljubljana, Slovenija"}]},{"given":"A.","family":"Wu","sequence":"additional","affiliation":[{"name":"University of Aveiro Department of Ceramics and Glass Engineering-Center for Research in Ceramic and Composite Materials (CICECO), , 3810-193 Aveiro, Portugal"}]},{"given":"P. M.","family":"Vilarinho","sequence":"additional","affiliation":[{"name":"University of Aveiro Department of Ceramics and Glass Engineering-Center for Research in Ceramic and Composite Materials (CICECO), , 3810-193 Aveiro, Portugal"}]},{"given":"J. P.","family":"Mercurio","sequence":"additional","affiliation":[{"name":"Universit\u00e9 de Limoges Science des Proc\u00e9d\u00e9s C\u00e9ramiques et de Traitements de Surface (SPCTS), UMR CNRS 6638, Facult\u00e9 des Sciences et Techniques, , 123 Avenue Albert Thomas, 87060 Limoges Cedex, France"}]}],"member":"317","published-online":{"date-parts":[[2007,4,10]]},"reference":[{"key":"2023062501353058700_c1","first-page":"2651","volume":"2","year":"1961","journal-title":"Sov. Phys. Solid State"},{"key":"2023062501353058700_c2","doi-asserted-by":"publisher","first-page":"798","DOI":"10.1063\/1.1732613","volume":"36","year":"1962","journal-title":"J. Chem. Phys."},{"key":"2023062501353058700_c3","doi-asserted-by":"publisher","first-page":"5722","DOI":"10.1143\/JJAP.40.5722","volume":"40","year":"2001","journal-title":"Jpn. J. Appl. Phys., Part 1"},{"key":"2023062501353058700_c4","doi-asserted-by":"crossref","first-page":"5293","DOI":"10.1021\/cm035222l","volume":"16","year":"2004","journal-title":"Chem. Mater."},{"key":"2023062501353058700_c5","doi-asserted-by":"publisher","first-page":"804","DOI":"10.1063\/1.1771808","volume":"85","year":"2004","journal-title":"Appl. Phys. Lett."},{"key":"2023062501353058700_c6","doi-asserted-by":"crossref","first-page":"136","DOI":"10.1016\/j.jcrysgro.2005.06.038","volume":"284","year":"2005","journal-title":"J. Cryst. Growth"},{"key":"2023062501353058700_c7","doi-asserted-by":"crossref","first-page":"1691","DOI":"10.1016\/j.actamat.2005.12.005","volume":"54","year":"2006","journal-title":"Acta Mater."},{"key":"2023062501353058700_c8","doi-asserted-by":"publisher","first-page":"A38","DOI":"10.1088\/0957-4484\/8\/3A\/008","volume":"8","year":"1997","journal-title":"Nanotechnology"},{"key":"2023062501353058700_c9","doi-asserted-by":"publisher","first-page":"014102","DOI":"10.1103\/PhysRevB.69.014102","volume":"69","year":"2004","journal-title":"Phys. Rev. B"},{"key":"2023062501353058700_c10","doi-asserted-by":"publisher","first-page":"7480","DOI":"10.1063\/1.365350","volume":"81","year":"1997","journal-title":"J. Appl. Phys."}],"container-title":["Applied Physics Letters"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.aip.org\/aip\/apl\/article-pdf\/doi\/10.1063\/1.2721843\/13172046\/152905_1_online.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/pubs.aip.org\/aip\/apl\/article-pdf\/doi\/10.1063\/1.2721843\/13172046\/152905_1_online.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,25]],"date-time":"2023-06-25T05:56:56Z","timestamp":1687672616000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.aip.org\/apl\/article\/90\/15\/152905\/166327\/Piezoforce-microscopy-study-of-lead-free"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007,4,9]]},"references-count":10,"journal-issue":{"issue":"15","published-print":{"date-parts":[[2007,4,9]]}},"URL":"https:\/\/doi.org\/10.1063\/1.2721843","relation":{},"ISSN":["0003-6951","1077-3118"],"issn-type":[{"type":"print","value":"0003-6951"},{"type":"electronic","value":"1077-3118"}],"subject":[],"published-other":{"date-parts":[[2007,4,9]]},"published":{"date-parts":[[2007,4,9]]},"article-number":"152905"}}