{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,3,3]],"date-time":"2024-03-03T09:34:54Z","timestamp":1709458494602},"reference-count":28,"publisher":"AIP Publishing","issue":"12","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2008,12,1]]},"abstract":"<jats:p>The temperature dependence of the surface resistance RS(T) of a high-quality 600-nm thick YBa2Cu2O7\u2212\u03c3 epitaxial film, deposited on a MgO single-crystal substrate, has been investigated. The measurements were performed in the temperature range from Tc to 2K using a new technique\u2014the application of a sapphire hemispherical resonator with whispering gallery mode in the 8-mm wavelength range (Ka band). The new measurement technique makes it possible to reach high measurement sensitivity for RS(T) (to 10\u03bc\u03a9) at low temperatures. A linear dependence of RS(T) was obtained in the range 2\u201315K, in agreement with d-wave symmetry of the order parameter. The value found in the present work for the residual resistance Rres=RS(T\u21920) shows that the microwave properties of the film are close to those of single-crystals and, apparently, the internal properties of the superconductor determine Rres. Analysis of the published data shows that Rres(\u03c9)\u223c\u03c93\u22152 for YBa2Cu3O7\u2212\u03c3 single crystals and films, and the nature of the residual microwave resistance remains unknown.<\/jats:p>","DOI":"10.1063\/1.3029749","type":"journal-article","created":{"date-parts":[[2008,12,15]],"date-time":"2008-12-15T15:07:45Z","timestamp":1229353665000},"page":"977-981","update-policy":"http:\/\/dx.doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":13,"title":["On the low-temperature microwave response of a YBa2Cu3O7\u2212\u03c3 epitaxial film determined by a new measurement technique"],"prefix":"10.1063","volume":"34","author":[{"given":"A. A.","family":"Barannik","sequence":"first","affiliation":[{"name":"A. Ya. Usikov Institute of Radiophysics and Electronics of the National Academy of Sciences of Ukraine , ul. Akad. Proskury, 12 Kharkov 61805, Ukraine"}]},{"given":"S. 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