{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,7]],"date-time":"2025-10-07T05:06:28Z","timestamp":1759813588577,"version":"3.41.2"},"reference-count":29,"publisher":"AIP Publishing","issue":"6","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,3,15]]},"abstract":"<jats:p>Gaseous and liquid xenon particle detectors are being used in a number of applications including dark matter search and neutrino-less double beta decay experiments. Polytetrafluoroethylene (PTFE) is often used in these detectors both as electrical insulator and as a light reflector to improve the efficiency of detection of scintillation photons. However, xenon emits in the vacuum ultraviolet (VUV) wavelength region (\u03bb\u2243175\u2002nm) where the reflecting properties of PTFE are not sufficiently known. In this work, we report on measurements of PTFE reflectance, including its angular distribution, for the xenon scintillation light. Various samples of PTFE, manufactured by different processes (extruded, expanded, skived, and pressed) have been studied. The data were interpreted with a physical model comprising both specular and diffuse reflections. The reflectance obtained for these samples ranges from about 47% to 66% for VUV light. Other fluoropolymers, namely, ethylene tetrafluoroethylene (ETFE), fluorinated ethylene propylene (FEP), and perfluoro-alkoxyalkane (PFA) were also measured.<\/jats:p>","DOI":"10.1063\/1.3318681","type":"journal-article","created":{"date-parts":[[2010,3,17]],"date-time":"2010-03-17T22:15:47Z","timestamp":1268864147000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":35,"title":["Reflectance of polytetrafluoroethylene for xenon scintillation light"],"prefix":"10.1063","volume":"107","author":[{"given":"C.","family":"Silva","sequence":"first","affiliation":[{"name":"University of Coimbra Department of Physics, LIP-Coimbra, , P-3004 516 Coimbra, Portugal"}]},{"given":"J.","family":"Pinto da Cunha","sequence":"additional","affiliation":[{"name":"University of Coimbra Department of Physics, LIP-Coimbra, , P-3004 516 Coimbra, Portugal"}]},{"given":"A.","family":"Pereira","sequence":"additional","affiliation":[{"name":"University of Coimbra Department of Physics, LIP-Coimbra, , P-3004 516 Coimbra, Portugal"}]},{"given":"V.","family":"Chepel","sequence":"additional","affiliation":[{"name":"University of Coimbra Department of Physics, LIP-Coimbra, , P-3004 516 Coimbra, Portugal"}]},{"given":"M. I.","family":"Lopes","sequence":"additional","affiliation":[{"name":"University of Coimbra Department of Physics, LIP-Coimbra, , P-3004 516 Coimbra, Portugal"}]},{"given":"V.","family":"Solovov","sequence":"additional","affiliation":[{"name":"University of Coimbra Department of Physics, LIP-Coimbra, , P-3004 516 Coimbra, Portugal"}]},{"given":"F.","family":"Neves","sequence":"additional","affiliation":[{"name":"University of Coimbra Department of Physics, LIP-Coimbra, , P-3004 516 Coimbra, Portugal"}]}],"member":"317","published-online":{"date-parts":[[2010,3,17]]},"reference":[{"key":"2023070423131834800_c1","doi-asserted-by":"publisher","first-page":"287","DOI":"10.1016\/j.astropartphys.2007.06.002","volume":"28","year":"2007","journal-title":"Astropart. Phys."},{"key":"2023070423131834800_c2","doi-asserted-by":"publisher","first-page":"12","DOI":"10.1016\/S0370-2693(00)00404-4","volume":"480","year":"2000","journal-title":"Phys. Lett. B"},{"key":"2023070423131834800_c3","doi-asserted-by":"publisher","first-page":"279","DOI":"10.1016\/j.nuclphysbps.2006.09.091","volume":"162","year":"2006","journal-title":"Nucl. Phys. B"},{"key":"2023070423131834800_c4","doi-asserted-by":"publisher","first-page":"62","DOI":"10.1016\/S0168-9002(98)00933-4","volume":"420","year":"1999","journal-title":"Nucl. Instrum. Methods Phys. Res. A"},{"key":"2023070423131834800_c5","doi-asserted-by":"publisher","first-page":"544","DOI":"10.1117\/12.344390","volume":"3578","year":"1999","journal-title":"Proc. SPIE"},{"key":"2023070423131834800_c6","doi-asserted-by":"publisher","first-page":"856","DOI":"10.1364\/JOSA.71.000856","volume":"71","year":"1981","journal-title":"J. Opt. Soc. Am."},{"key":"2023070423131834800_c7","doi-asserted-by":"publisher","first-page":"2225","DOI":"10.1364\/AO.24.002225","volume":"24","year":"1985","journal-title":"Appl. Opt."},{"key":"2023070423131834800_c8","doi-asserted-by":"publisher","first-page":"998","DOI":"10.1063\/1.366788","volume":"83","year":"1998","journal-title":"J. Appl. Phys."},{"key":"2023070423131834800_c9","doi-asserted-by":"publisher","first-page":"692","DOI":"10.1016\/j.nima.204.06.168","volume":"535","year":"2004","journal-title":"Nucl. Instrum. Methods Phys. Res. A"},{"key":"2023070423131834800_c10","doi-asserted-by":"publisher","first-page":"2793","DOI":"10.1109\/TNS.2005.862782","volume":"52","year":"2005","journal-title":"IEEE Trans. Nucl. Sci."},{"key":"2023070423131834800_c11","doi-asserted-by":"publisher","first-page":"297","DOI":"10.1016\/0168-583X(92)95113-6","volume":"63","year":"1992","journal-title":"Nucl. Instrum. Methods Phys. Res. B"},{"key":"2023070423131834800_c12","doi-asserted-by":"publisher","first-page":"375","DOI":"10.1007\/s003390051017","volume":"69","year":"1999","journal-title":"Appl. Phys. A: Mater. Sci. Process."},{"volume-title":"Fluoroplastics","year":"2000","key":"2023070423131834800_c13"},{"first-page":"1253","volume-title":"IEEE NSS Conference Record 2008","year":"2008","key":"2023070423131834800_c14"},{"key":"2023070423131834800_c15","doi-asserted-by":"publisher","first-page":"322","DOI":"10.1016\/j.nima.2007.05.166","volume":"580","year":"2007","journal-title":"Nucl. Instrum. Methods Phys. Res. A"},{"key":"2023070423131834800_c16","doi-asserted-by":"publisher","first-page":"2956","DOI":"10.1364\/JOSAA.11.002956","volume":"11","year":"1994","journal-title":"J. Opt. Soc. Am."},{"key":"2023070423131834800_c17","doi-asserted-by":"publisher","first-page":"60","DOI":"10.1007\/s11708-009-0011-3","volume":"3","year":"2009","journal-title":"Front. Energy Power Eng. China"},{"first-page":"239","article-title":"Generalization of Lambert's reflectance model","year":"1994","key":"2023070423131834800_c18"},{"key":"2023070423131834800_c19","doi-asserted-by":"publisher","first-page":"55","DOI":"10.1023\/A:1008017513536","volume":"30","year":"1998","journal-title":"Int. J. Comput. Vis."},{"volume-title":"Geometrical Considerations and Nomenclature for Reflectance","year":"1977","key":"2023070423131834800_c20"},{"key":"2023070423131834800_c21","doi-asserted-by":"publisher","first-page":"668","DOI":"10.1109\/TAP.1967.1138991","volume":"15","year":"1967","journal-title":"IEEE Trans. Antennas Propag."},{"key":"2023070423131834800_c22","doi-asserted-by":"publisher","first-page":"611","DOI":"10.1109\/34.85654","volume":"13","year":"1991","journal-title":"IEEE Trans. Pattern Anal. Mach. Intell."},{"volume-title":"Eurographics Symposium on Rendering","year":"2007","key":"2023070423131834800_c23"},{"key":"2023070423131834800_c24","doi-asserted-by":"publisher","first-page":"1105","DOI":"10.1364\/JOSA.57.001105","volume":"57","year":"1967","journal-title":"J. Opt. Soc. Am."},{"key":"2023070423131834800_c25","doi-asserted-by":"publisher","first-page":"531","DOI":"10.1364\/JOSA.65.000531","volume":"65","year":"1975","journal-title":"J. Opt. Soc. Am."},{"key":"2023070423131834800_c26","doi-asserted-by":"publisher","first-page":"5119","DOI":"10.1364\/AO.46.005119","volume":"46","year":"2007","journal-title":"Appl. Opt."},{"key":"2023070423131834800_c27","doi-asserted-by":"publisher","first-page":"180","DOI":"10.1016\/S0254-0584(00)00353-9","volume":"68","year":"2001","journal-title":"Mater. Chem. Phys."},{"key":"2023070423131834800_c28","doi-asserted-by":"publisher","first-page":"831","DOI":"10.1209\/epl\/i2005-10037-y","volume":"70","year":"2005","journal-title":"Europhys. Lett."},{"key":"2023070423131834800_c29","doi-asserted-by":"publisher","first-page":"2057","DOI":"10.1002\/(SICI)1099-0488(19980915)36:12&lt;2057::AID-POLB5&gt;3.0.CO;2-U","volume":"36","year":"1998","journal-title":"J. Polym. Sci., Part B: Polym. Phys."}],"container-title":["Journal of Applied Physics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.aip.org\/aip\/jap\/article-pdf\/doi\/10.1063\/1.3318681\/13203311\/064902_1_online.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/pubs.aip.org\/aip\/jap\/article-pdf\/doi\/10.1063\/1.3318681\/13203311\/064902_1_online.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,5]],"date-time":"2023-07-05T12:28:27Z","timestamp":1688560107000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.aip.org\/jap\/article\/107\/6\/064902\/370559\/Reflectance-of-polytetrafluoroethylene-for-xenon"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,3,15]]},"references-count":29,"journal-issue":{"issue":"6","published-print":{"date-parts":[[2010,3,15]]}},"URL":"https:\/\/doi.org\/10.1063\/1.3318681","relation":{},"ISSN":["0021-8979","1089-7550"],"issn-type":[{"type":"print","value":"0021-8979"},{"type":"electronic","value":"1089-7550"}],"subject":[],"published-other":{"date-parts":[[2010,3,15]]},"published":{"date-parts":[[2010,3,15]]},"article-number":"064902"}}