{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T16:00:36Z","timestamp":1761580836534,"version":"3.41.2"},"reference-count":21,"publisher":"AIP Publishing","issue":"22","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2010,11,29]]},"abstract":"<jats:p>Metal oxide-polymer diodes require electroforming before they act as nonvolatile resistive switching memory diodes. Here we investigate the early stages of the electroforming process in Al\/Al2O3\/poly(spirofluorene)\/Ba\/Al diodes using quasistatic capacitance-voltage measurements. In the initial stage, electrons are injected into the polymer and then deeply trapped near the poly(spirofluorene)-Al2O3 interface. For bias voltages below 6 V, the number of trapped electrons is found to be CoxideV\/q with Coxide as the geometrical capacitance of the oxide layer. This implies a density of traps for the electrons at the polymer-metal oxide interface larger than 3\u00d71017\u2002m\u22122.<\/jats:p>","DOI":"10.1063\/1.3520517","type":"journal-article","created":{"date-parts":[[2010,12,1]],"date-time":"2010-12-01T00:15:23Z","timestamp":1291162523000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":17,"title":["Trapping of electrons in metal oxide-polymer memory diodes in the initial stage of electroforming"],"prefix":"10.1063","volume":"97","author":[{"given":"Benjamin F.","family":"Bory","sequence":"first","affiliation":[{"name":"Eindhoven University of Technology 1 Molecular Materials and Nanosystems, , P.O. Box 513, 5600 MB Eindhoven, The Netherlands"}]},{"given":"Stefan C. J.","family":"Meskers","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology 1 Molecular Materials and Nanosystems, , P.O. Box 513, 5600 MB Eindhoven, The Netherlands"}]},{"given":"Ren\u00e9 A. J.","family":"Janssen","sequence":"additional","affiliation":[{"name":"Eindhoven University of Technology 1 Molecular Materials and Nanosystems, , P.O. Box 513, 5600 MB Eindhoven, The Netherlands"}]},{"given":"Henrique L.","family":"Gomes","sequence":"additional","affiliation":[{"name":"Universidade do Algarve 2 Center of Electronics Optoelectronics and Telecommunications (CEOT), , Campus de Gambelas, 8005-139 Faro, Portugal"}]},{"given":"Dago M.","family":"de Leeuw","sequence":"additional","affiliation":[{"name":"Philips Research Laboratories 3 , Professor Holstlaan 4, 5656 AA Eindhoven, The Netherlands"}]}],"member":"317","published-online":{"date-parts":[[2010,11,30]]},"reference":[{"key":"2023070300151785500_c1","doi-asserted-by":"publisher","first-page":"094504","DOI":"10.1063\/1.2364036","volume":"100","year":"2006","journal-title":"J. Appl. 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