{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,11]],"date-time":"2025-12-11T20:11:05Z","timestamp":1765483865486,"version":"3.41.2"},"reference-count":36,"publisher":"AIP Publishing","issue":"2","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2013,1,14]]},"abstract":"<jats:p>Here, we present the x-ray diffraction (XRD) analysis of a pseudo spin valve (P-SV): CoFeB\/MgO\/CoFeB and an exchange bias spin valve (EB-SV): PtMn\/CoFe\/Ru\/CoFeB\/MgO\/CoFeB magnetic tunnel junctions where the composition of CoFeB was (Co52Fe48)75B25. In the P-SV, CoFeB layers crystallized into a highly bcc (001)-oriented CoFe texture while in the EB-SV, CoFeB crystallized into both (001)-oriented and (110)-oriented textures. Moreover, CoFeB crystallized better into the (001)-oriented texture when deposited on MgO than on a Ru layer. The P-SV and EB-SV devices with layer structures equivalent to the XRD samples, showed tunneling magnetoresistance of 240% and 180%, respectively. The Ru and Ta buffer layers annealed at 340\u2009\u00b0C mixed at the interface. The simulated crystalline structure and calculated \u03b8-2\u03b8 profiles, using kinematical theory of x-ray scattering, correlated very well with the experimental profiles and confirmed Ta-Ru intermixing.<\/jats:p>","DOI":"10.1063\/1.4775706","type":"journal-article","created":{"date-parts":[[2013,1,15]],"date-time":"2013-01-15T01:40:00Z","timestamp":1358214000000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":9,"title":["X-ray diffraction analysis and Monte Carlo simulations of CoFeB-MgO based magnetic tunnel junctions"],"prefix":"10.1063","volume":"113","author":[{"given":"J.","family":"Kanak","sequence":"first","affiliation":[{"name":"Department of Electronics, AGH University of Science and Technology 1 , Al. Mickiewicza 30, 30-059 Krak\u00f3w, Poland"}]},{"given":"P.","family":"Wi\u015bniowski","sequence":"additional","affiliation":[{"name":"Department of Electronics, AGH University of Science and Technology 1 , Al. Mickiewicza 30, 30-059 Krak\u00f3w, Poland"}]},{"given":"T.","family":"Stobiecki","sequence":"additional","affiliation":[{"name":"Department of Electronics, AGH University of Science and Technology 1 , Al. Mickiewicza 30, 30-059 Krak\u00f3w, Poland"}]},{"given":"A.","family":"Zaleski","sequence":"additional","affiliation":[{"name":"Department of Electronics, AGH University of Science and Technology 1 , Al. Mickiewicza 30, 30-059 Krak\u00f3w, Poland"},{"name":"Faculty of Physics and Applied Computer Science, AGH University of Science and Technology 2 , al. Mickiewicza 30, 30-059 Krak\u00f3w, Poland"}]},{"given":"W.","family":"Powro\u017anik","sequence":"additional","affiliation":[{"name":"Department of Electronics, AGH University of Science and Technology 1 , Al. Mickiewicza 30, 30-059 Krak\u00f3w, Poland"}]},{"given":"S.","family":"Cardoso","sequence":"additional","affiliation":[{"name":"INESC Microsystems and Nanotechnologies 3 , Rua Alves Redol, 9-1, 1000-029 Lisbon, Portugal"}]},{"given":"P. P.","family":"Freitas","sequence":"additional","affiliation":[{"name":"INESC Microsystems and Nanotechnologies 3 , Rua Alves Redol, 9-1, 1000-029 Lisbon, Portugal"}]}],"member":"317","published-online":{"date-parts":[[2013,1,14]]},"reference":[{"key":"2023080123182091600_c1","doi-asserted-by":"publisher","first-page":"212507","DOI":"10.1063\/1.2742576","volume":"90","year":"2007","journal-title":"Appl. Phys. Lett."},{"key":"2023080123182091600_c2","doi-asserted-by":"publisher","first-page":"3995","DOI":"10.1002\/pssa.200777336","volume":"204","year":"2007","journal-title":"Phys. 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