{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T06:43:46Z","timestamp":1775803426957,"version":"3.50.1"},"reference-count":35,"publisher":"AIP Publishing","issue":"5","funder":[{"DOI":"10.13039\/501100001807","name":"Funda\u00e7\u00e3o de Amparo \u00e0 Pesquisa do Estado de S\u00e3o Paulo","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001807","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002322","name":"Coordena\u00e7\u00e3o de Aperfei\u00e7oamento de Pessoal de N\u00edvel Superior","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002322","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003593","name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["304604\/2015-1"],"award-info":[{"award-number":["304604\/2015-1"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003593","name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["400677\/2014-8"],"award-info":[{"award-number":["400677\/2014-8"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2016,8,7]]},"abstract":"<jats:p>Polycrystalline lanthanum lead zirconate titanate (PLZT) thin films were deposited on Pt\/TiO2\/SiO2\/Si substrates to study the effects of the thickness and grain size on their structural and piezoresponse properties at nanoscale. Thinner PLZT films show a slight (100)-orientation tendency that tends to random orientation for the thicker film, while microstrain and crystallite size increases almost linearly with increasing thickness. Piezoresponse force microscopy and autocorrelation function technique were used to demonstrate the existence of local self-polarization effect and to study the thickness dependence of correlation length. The obtained results ruled out the bulk mechanisms and suggest that Schottky barriers near the film-substrate are likely responsible for a build-in electric field in the films. Larger correlation length evidence that this build-in field increases the number of coexisting polarization directions in larger grains leading to an alignment of macrodomains in thinner films.<\/jats:p>","DOI":"10.1063\/1.4960137","type":"journal-article","created":{"date-parts":[[2016,8,2]],"date-time":"2016-08-02T17:00:35Z","timestamp":1470157235000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":23,"title":["Thickness effect on the structure, grain size, and local piezoresponse of self-polarized lead lanthanum zirconate titanate thin films"],"prefix":"10.1063","volume":"120","author":[{"given":"M.","family":"Melo","sequence":"first","affiliation":[{"name":"UNESP\u2014Univ. Estadual Paulista 1 Departamento de F\u00edsica e Qu\u00edmica, Faculdade de Engenharia de Ilha Solteira, , 15385-000 Ilha Solteira, SP, Brazil"}]},{"given":"E. B.","family":"Ara\u00fajo","sequence":"additional","affiliation":[{"name":"UNESP\u2014Univ. Estadual Paulista 1 Departamento de F\u00edsica e Qu\u00edmica, Faculdade de Engenharia de Ilha Solteira, , 15385-000 Ilha Solteira, SP, Brazil"}]},{"given":"V. V.","family":"Shvartsman","sequence":"additional","affiliation":[{"name":"University Duisburg-Essen 2 Institute for Materials Science, , 45141 Essen, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6970-7798","authenticated-orcid":false,"given":"V. Ya.","family":"Shur","sequence":"additional","affiliation":[{"name":"Ural Federal University 3 Institute of Natural Sciences, , 620000 Ekaterinburg, Russia"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3432-7610","authenticated-orcid":false,"given":"A. L.","family":"Kholkin","sequence":"additional","affiliation":[{"name":"Ural Federal University 3 Institute of Natural Sciences, , 620000 Ekaterinburg, Russia"},{"name":"University of Aveiro 4 Department of Physics and CICECO\u2014Aveiro Institute of Materials, , 3810-193 Aveiro, Portugal"}]}],"member":"317","published-online":{"date-parts":[[2016,8,2]]},"reference":[{"key":"2023070317580545600_c1","article-title":"Electro-optic ceramics and devices","volume-title":"Electronic Ceramics","author":"Levinson","year":"1988"},{"key":"2023070317580545600_c2","doi-asserted-by":"publisher","first-page":"25","DOI":"10.1080\/00150198708008208","volume":"75","year":"1987","journal-title":"Ferroelectrics"},{"key":"2023070317580545600_c3","doi-asserted-by":"publisher","first-page":"4137","DOI":"10.1016\/S1359-6454(96)00062-6","volume":"44","year":"1996","journal-title":"Acta Mater."},{"key":"2023070317580545600_c4","doi-asserted-by":"publisher","first-page":"797","DOI":"10.1111\/j.1151-2916.1999.tb01840.x","volume":"82","year":"1999","journal-title":"J. Am. Ceram. Soc."},{"key":"2023070317580545600_c5","doi-asserted-by":"publisher","first-page":"1820","DOI":"10.1109\/JLT.2003.815511","volume":"21","year":"2003","journal-title":"J. Lightwave Technol."},{"key":"2023070317580545600_c6","doi-asserted-by":"publisher","first-page":"557","DOI":"10.1016\/j.ceramint.2013.05.139","volume":"40","year":"2014","journal-title":"Ceram. Int."},{"key":"2023070317580545600_c7","doi-asserted-by":"publisher","first-page":"1427","DOI":"10.1109\/LED.2013.2282393","volume":"34","year":"2013","journal-title":"IEEE Electron Devices Lett."},{"key":"2023070317580545600_c8","doi-asserted-by":"publisher","first-page":"26","DOI":"10.1016\/j.materresbull.2014.09.055","volume":"61","year":"2015","journal-title":"Mater. Res. Bull."},{"key":"2023070317580545600_c9","doi-asserted-by":"publisher","first-page":"151","DOI":"10.1107\/S0365110X67000234","volume":"22","year":"1967","journal-title":"Acta Crystallogr."},{"key":"2023070317580545600_c10","doi-asserted-by":"publisher","first-page":"210","DOI":"10.1107\/S0021889801002242","volume":"34","year":"2001","journal-title":"J. Appl. Cryst."},{"key":"2023070317580545600_c11","doi-asserted-by":"publisher","first-page":"79","DOI":"10.1107\/S0021889887087090","volume":"20","year":"1987","journal-title":"J. Appl. Crystallogr."},{"key":"2023070317580545600_c12","doi-asserted-by":"publisher","first-page":"36","DOI":"10.1107\/S0021889898009856","volume":"32","year":"1999","journal-title":"J. Appl. Cryst."},{"key":"2023070317580545600_c13","doi-asserted-by":"publisher","first-page":"1629","DOI":"10.1111\/j.1551-2916.2009.03240.x","volume":"92","year":"2009","journal-title":"J. Am. Ceram. Soc."},{"key":"2023070317580545600_c14","doi-asserted-by":"publisher","first-page":"2007","DOI":"10.1016\/j.jpcs.2006.05.034","volume":"67","year":"2006","journal-title":"J. Phys. Chem. Solids"},{"key":"2023070317580545600_c15","doi-asserted-by":"publisher","first-page":"114103","DOI":"10.1063\/1.3518516","volume":"108","year":"2010","journal-title":"J. Appl. Phys."},{"key":"2023070317580545600_c16","doi-asserted-by":"publisher","first-page":"1143","DOI":"10.1016\/j.apsusc.2006.01.048","volume":"253","year":"2006","journal-title":"Appl. Surf. Sci."},{"key":"2023070317580545600_c17","doi-asserted-by":"publisher","first-page":"2976","DOI":"10.1016\/j.jallcom.2010.11.177","volume":"509","year":"2011","journal-title":"J. Alloys Compd."},{"key":"2023070317580545600_c18","doi-asserted-by":"publisher","first-page":"1987","DOI":"10.1016\/j.susc.2008.04.001","volume":"602","year":"2008","journal-title":"Surf. Sci."},{"key":"2023070317580545600_c19","doi-asserted-by":"publisher","first-page":"2587","DOI":"10.1088\/0957-4484\/16\/11\/020","volume":"16","year":"2005","journal-title":"Nanotechnology"},{"key":"2023070317580545600_c20","doi-asserted-by":"publisher","first-page":"074110","DOI":"10.1063\/1.2979973","volume":"104","year":"2008","journal-title":"J. Appl. Phys."},{"key":"2023070317580545600_c21","doi-asserted-by":"publisher","first-page":"1377","DOI":"10.1063\/1.1331654","volume":"89","year":"2001","journal-title":"J. Appl. Phys."},{"key":"2023070317580545600_c22","doi-asserted-by":"publisher","first-page":"525","DOI":"10.1080\/10584589808208071","volume":"22","year":"1998","journal-title":"Integr. Ferroelectr."},{"key":"2023070317580545600_c23","doi-asserted-by":"publisher","first-page":"8755","DOI":"10.1088\/0953-8984\/13\/39\/304","volume":"13","year":"2001","journal-title":"J. Phys.: Condens. Matter"},{"key":"2023070317580545600_c24","doi-asserted-by":"publisher","first-page":"728","DOI":"10.1063\/1.1593830","volume":"83","year":"2003","journal-title":"Appl. Phys. Lett."},{"key":"2023070317580545600_c25","doi-asserted-by":"publisher","first-page":"1214","DOI":"10.1134\/S106378340606062X","volume":"48","year":"2006","journal-title":"Phys. Solid State"},{"key":"2023070317580545600_c26","doi-asserted-by":"publisher","first-page":"82","DOI":"10.1111\/j.1151-2916.1973.tb12363.x","volume":"56","year":"1973","journal-title":"J. Am. Ceram. Soc."},{"key":"2023070317580545600_c27","doi-asserted-by":"publisher","first-page":"051607","DOI":"10.1063\/1.2337009","volume":"100","year":"2006","journal-title":"J. Appl. Phys."},{"key":"2023070317580545600_c28","doi-asserted-by":"publisher","first-page":"187206","DOI":"10.1063\/1.4801961","volume":"113","year":"2013","journal-title":"J. Appl. Phys."},{"key":"2023070317580545600_c29","doi-asserted-by":"publisher","first-page":"18","DOI":"10.1080\/00150193.2016.1166421","volume":"498","year":"2016","journal-title":"Ferroelectrics"},{"key":"2023070317580545600_c30","doi-asserted-by":"publisher","first-page":"4686","DOI":"10.1103\/PhysRevB.62.4686","volume":"62","year":"2000","journal-title":"Phys. Rev. B"},{"key":"2023070317580545600_c31","doi-asserted-by":"publisher","first-page":"7109","DOI":"10.1088\/0022-3727\/40\/22\/037","volume":"40","year":"2007","journal-title":"J. Phys. D: Appl. Phys."},{"key":"2023070317580545600_c32","doi-asserted-by":"publisher","first-page":"56933","DOI":"10.1039\/C4RA08280J","volume":"4","year":"2014","journal-title":"RSC Adv."},{"key":"2023070317580545600_c33","doi-asserted-by":"publisher","first-page":"423","DOI":"10.1146\/annurev-matsci-071312-121632","volume":"43","year":"2013","journal-title":"Annu. Rev. Mater. Res."},{"key":"2023070317580545600_c34","doi-asserted-by":"publisher","first-page":"129","DOI":"10.1007\/s10853-005-5954-0","volume":"41","year":"2006","journal-title":"J. Mater. Sci."},{"key":"2023070317580545600_c35","doi-asserted-by":"publisher","first-page":"R367","DOI":"10.1088\/0953-8984\/15\/9\/202","volume":"15","year":"2003","journal-title":"J. Phys.: Condens. Matter"}],"container-title":["Journal of Applied Physics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/pubs.aip.org\/aip\/jap\/article-pdf\/doi\/10.1063\/1.4960137\/14822521\/054101_1_online.pdf","content-type":"application\/pdf","content-version":"vor","intended-application":"syndication"},{"URL":"https:\/\/pubs.aip.org\/aip\/jap\/article-pdf\/doi\/10.1063\/1.4960137\/14822521\/054101_1_online.pdf","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,3]],"date-time":"2023-07-03T21:01:58Z","timestamp":1688418118000},"score":1,"resource":{"primary":{"URL":"https:\/\/pubs.aip.org\/jap\/article\/120\/5\/054101\/344855\/Thickness-effect-on-the-structure-grain-size-and"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,8,2]]},"references-count":35,"journal-issue":{"issue":"5","published-print":{"date-parts":[[2016,8,7]]}},"URL":"https:\/\/doi.org\/10.1063\/1.4960137","relation":{},"ISSN":["0021-8979","1089-7550"],"issn-type":[{"value":"0021-8979","type":"print"},{"value":"1089-7550","type":"electronic"}],"subject":[],"published-other":{"date-parts":[[2016,8,7]]},"published":{"date-parts":[[2016,8,2]]},"article-number":"054101"}}