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Along with the size reduction into the nanoscale, functional coatings become thinner than a nanometer. With the traditional analysis of the energy band alignment by in situ photoelectron spectroscopy, a critical film thickness is needed to determine the valence band offset. By making use of the Auger parameter, it becomes possible to determine the energy band alignment to coatings, which are only a few \u00c5ngstr\u00f6m thin. This is demonstrated with experimental data of Cu2O on different kinds of substrate materials.<\/jats:p>","DOI":"10.1063\/1.4975644","type":"journal-article","created":{"date-parts":[[2017,2,3]],"date-time":"2017-02-03T13:27:04Z","timestamp":1486128424000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":3,"title":["Energy band alignment at the nanoscale"],"prefix":"10.1063","volume":"110","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2764-3124","authenticated-orcid":false,"given":"Jonas","family":"Deuermeier","sequence":"first","affiliation":[{"name":"Universidade NOVA de Lisboa and CEMOP\/UNINOVA 1 i3N\/CENIMAT, Department of Materials Science, Faculty of Science and Technology, , Campus de Caparica, 2829-516 Caparica, Portugal"},{"name":"Technische Universit\u00e4t Darmstadt 2 Department of Materials and Earth Sciences, , Jovanka-Bontschits-Stra\u00dfe 2, D-64287 Darmstadt, Germany"}]},{"given":"Elvira","family":"Fortunato","sequence":"additional","affiliation":[{"name":"Universidade NOVA de Lisboa and CEMOP\/UNINOVA 1 i3N\/CENIMAT, Department of Materials Science, Faculty of Science and Technology, , Campus de Caparica, 2829-516 Caparica, Portugal"}]},{"given":"Rodrigo","family":"Martins","sequence":"additional","affiliation":[{"name":"Universidade NOVA de Lisboa and CEMOP\/UNINOVA 1 i3N\/CENIMAT, Department of Materials Science, Faculty of Science and Technology, , Campus de Caparica, 2829-516 Caparica, Portugal"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7463-1495","authenticated-orcid":false,"given":"Andreas","family":"Klein","sequence":"additional","affiliation":[{"name":"Technische Universit\u00e4t Darmstadt 2 Department of Materials and Earth Sciences, , Jovanka-Bontschits-Stra\u00dfe 2, D-64287 Darmstadt, Germany"}]}],"member":"317","published-online":{"date-parts":[[2017,2,3]]},"reference":[{"key":"2023061718585901600_c1","doi-asserted-by":"publisher","first-page":"835","DOI":"10.1116\/1.573326","volume":"3","year":"1985","journal-title":"J. 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