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This is attributed to thermally activated migration of point defects from the implanted volume and subsequent trapping\/annihilation by the pre-existing defects. The obtained results imply that a defect engineering scheme involving formation of a high density of extended defects outside the active volume of a ZnO-based device could be beneficial to enhance the radiation tolerance.<\/jats:p>","DOI":"10.1063\/1.4981808","type":"journal-article","created":{"date-parts":[[2017,4,26]],"date-time":"2017-04-26T13:07:42Z","timestamp":1493212062000},"update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":9,"title":["Effect of buried extended defects on the radiation tolerance of ZnO"],"prefix":"10.1063","volume":"110","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0602-9624","authenticated-orcid":false,"given":"Alexander","family":"Azarov","sequence":"first","affiliation":[{"name":"University of Oslo 1 Department of Physics, Centre for Materials Science and Nanotechnology, , PO Box 1048 Blindern, N-0316 Oslo, Norway"}]},{"given":"Elke","family":"Wendler","sequence":"additional","affiliation":[{"name":"Friedrich-Schiller-Universit\u00e4t Jena 2 Institut f\u00fcr Festk\u00f6rperphysik, , Max-Wien-Platz 1, 07743 Jena, Germany"}]},{"given":"Katharina","family":"Lorenz","sequence":"additional","affiliation":[{"name":"Universidade de Lisboa 3 IPFN, Instituto Superior T\u00e9cnico, , Campus Tecnol\u00f3gico e Nuclear, Estrada Nacional 10, 2695-066 Bobadela LRS, Portugal"}]},{"given":"Edouard","family":"Monakhov","sequence":"additional","affiliation":[{"name":"University of Oslo 1 Department of Physics, Centre for Materials Science and Nanotechnology, , PO Box 1048 Blindern, N-0316 Oslo, Norway"}]},{"given":"Bengt G.","family":"Svensson","sequence":"additional","affiliation":[{"name":"University of Oslo 1 Department of Physics, Centre for Materials Science and Nanotechnology, , PO Box 1048 Blindern, N-0316 Oslo, Norway"}]}],"member":"317","published-online":{"date-parts":[[2017,4,26]]},"reference":[{"key":"2023061716460637000_c1","doi-asserted-by":"publisher","first-page":"1273","DOI":"10.1088\/0034-4885\/63\/8\/203","volume":"63","year":"2000","journal-title":"Rep. 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