{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,8]],"date-time":"2025-12-08T22:42:51Z","timestamp":1765233771100,"version":"3.37.3"},"reference-count":21,"publisher":"AIP Publishing","issue":"5","content-domain":{"domain":["pubs.aip.org"],"crossmark-restriction":true},"short-container-title":[],"published-print":{"date-parts":[[2024,5,1]]},"abstract":"<jats:p>Bismuth-antimony alloys are among the most studied topological insulators and also have very promising thermoelectric properties. In addition, in the amorphous state they exhibit superconductivity with critical temperatures in the range 6.0\u20136.4\u2009K. In this work, we have prepared and studied different polycrystalline films of Bi100\u2013xSbx (x\u2009=\u20090, 5, 10, 15), and we have induced, through ion beam irradiation, significant damage in their internal structure with the aim of amorphizing the material. Specifically, we have irradiated Bi ions in the 10\u201330\u2009MeV range, exploiting the capabilities of a 5 MV ion beam accelerator of tandem type. We have characterized the Bi\u2013Sb films before and after irradiation from a morphological and structural point of view and measured their electrical resistivity from room temperature to near 2\u2009K, to evaluate the influence of the preparation method and degree of disorder. We have found that the studied Bi\u2013Sb system always behaves as a small energy gap semiconductor that follows the empirical Meyer\u2013Neldel rule, which correlates the conductivity prefactor with the exponential value of the energy gap.<\/jats:p>","DOI":"10.1063\/10.0025622","type":"journal-article","created":{"date-parts":[[2024,5,17]],"date-time":"2024-05-17T17:50:06Z","timestamp":1715968206000},"page":"389-395","update-policy":"https:\/\/doi.org\/10.1063\/aip-crossmark-policy-page","source":"Crossref","is-referenced-by-count":2,"title":["Low-temperature electrical conductivity of ion-beam irradiated Bi\u2013Sb films"],"prefix":"10.1063","volume":"50","author":[{"ORCID":"https:\/\/orcid.org\/0009-0001-7706-6484","authenticated-orcid":false,"given":"A.","family":"Andrino-G\u00f3mez","sequence":"first","affiliation":[{"name":"Laboratorio de Bajas Temperaturas, Departamento de F\u00edsica de la Materia Condensada, Condensed Matter Physics Center (IFIMAC), Universidad Aut\u00f3noma de Madrid 1 , E-28049 Madrid, Spain"},{"name":"Laboratorio de Microelectr\u00f3nica, Departamento de F\u00edsica Aplicada, Universidad Aut\u00f3noma de Madrid 2 , E-28049 Madrid, Spain"},{"name":"Centro de Micro-An\u00e1lisis de Materiales (CMAM), Universidad Aut\u00f3noma de Madrid 3 , E-28049 Madrid, Spain"},{"name":"Instituto Nicol\u00e1s Cabrera (INC), Universidad Aut\u00f3noma de Madrid 4 , E-28049 Madrid, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0009-0007-3322-0893","authenticated-orcid":false,"given":"M.","family":"Moratalla","sequence":"additional","affiliation":[{"name":"Laboratorio de Bajas Temperaturas, Departamento de F\u00edsica de la Materia Condensada, Condensed Matter Physics Center (IFIMAC), Universidad Aut\u00f3noma de Madrid 1 , E-28049 Madrid, Spain"},{"name":"Centro de Micro-An\u00e1lisis de Materiales (CMAM), Universidad Aut\u00f3noma de Madrid 3 , E-28049 Madrid, Spain"},{"name":"Instituto Nicol\u00e1s Cabrera (INC), Universidad Aut\u00f3noma de Madrid 4 , E-28049 Madrid, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9981-6645","authenticated-orcid":false,"given":"A.","family":"Redondo-Cubero","sequence":"additional","affiliation":[{"name":"Laboratorio de Microelectr\u00f3nica, Departamento de F\u00edsica Aplicada, Universidad Aut\u00f3noma de Madrid 2 , E-28049 Madrid, Spain"},{"name":"Centro de Micro-An\u00e1lisis de Materiales (CMAM), Universidad Aut\u00f3noma de Madrid 3 , E-28049 Madrid, Spain"},{"name":"Instituto Nicol\u00e1s Cabrera (INC), Universidad Aut\u00f3noma de Madrid 4 , E-28049 Madrid, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2335-738X","authenticated-orcid":false,"given":"N.","family":"Gordillo","sequence":"additional","affiliation":[{"name":"Laboratorio de Microelectr\u00f3nica, Departamento de F\u00edsica Aplicada, Universidad Aut\u00f3noma de Madrid 2 , E-28049 Madrid, Spain"},{"name":"Centro de Micro-An\u00e1lisis de Materiales (CMAM), Universidad Aut\u00f3noma de Madrid 3 , E-28049 Madrid, Spain"},{"name":"Instituto Nicol\u00e1s Cabrera (INC), Universidad Aut\u00f3noma de Madrid 4 , E-28049 Madrid, Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2157-9774","authenticated-orcid":false,"given":"M. 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