{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,30]],"date-time":"2026-06-30T11:04:01Z","timestamp":1782817441747,"version":"3.54.5"},"reference-count":43,"publisher":"Informa UK Limited","issue":"17","funder":[{"DOI":"10.13039\/501100001868","name":"National Science Council Taiwan","doi-asserted-by":"publisher","award":["NSC 100-2628-E-007 -017-MY3"],"award-info":[{"award-number":["NSC 100-2628-E-007 -017-MY3"]}],"id":[{"id":"10.13039\/501100001868","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001868","name":"National Science Council Taiwan","doi-asserted-by":"publisher","award":["NSC102-2622-E-007-013"],"award-info":[{"award-number":["NSC102-2622-E-007-013"]}],"id":[{"id":"10.13039\/501100001868","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["www.tandfonline.com"],"crossmark-restriction":true},"short-container-title":["International Journal of Production Research"],"published-print":{"date-parts":[[2017,9,2]]},"DOI":"10.1080\/00207543.2015.1109153","type":"journal-article","created":{"date-parts":[[2015,11,17]],"date-time":"2015-11-17T17:59:30Z","timestamp":1447783170000},"page":"5095-5107","update-policy":"https:\/\/doi.org\/10.1080\/tandf_crossmark_01","source":"Crossref","is-referenced-by-count":81,"title":["Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement"],"prefix":"10.1080","volume":"55","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3328-4946","authenticated-orcid":false,"given":"Chen-Fu","family":"Chien","sequence":"first","affiliation":[{"name":"Department of Industrial Engineering & Engineering Management, National Tsing Hua University, Hsinchu, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Chiao-Wen","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering & Engineering Management, National Tsing Hua University, Hsinchu, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shih-Chung","family":"Chuang","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering & Engineering Management, National Tsing Hua University, Hsinchu, Taiwan"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"301","published-online":{"date-parts":[[2015,11,17]]},"reference":[{"key":"CIT0001","volume-title":"Outliers in Statistical Data","author":"Barnett V.","year":"1994","edition":"3"},{"key":"CIT0002","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"CIT0003","doi-asserted-by":"publisher","DOI":"10.1016\/j.dss.2008.07.008"},{"key":"CIT0004","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2009.2028215"},{"key":"CIT0005","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2014.2356555"},{"key":"CIT0006","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-005-0016-7"},{"key":"CIT0007","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-009-0298-2"},{"key":"CIT0008","doi-asserted-by":"publisher","DOI":"10.1080\/10170660209509189"},{"key":"CIT0009","doi-asserted-by":"publisher","DOI":"10.1080\/0020754031000087256"},{"key":"CIT0010","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2006.04.014"},{"key":"CIT0011","doi-asserted-by":"publisher","DOI":"10.1504\/EJIE.2011.041616"},{"key":"CIT0012","doi-asserted-by":"publisher","DOI":"10.1080\/00207543.2012.737943"},{"key":"CIT0013","doi-asserted-by":"publisher","DOI":"10.1016\/j.cor.2014.05.009"},{"key":"CIT0015","volume-title":"Pattern Recognition: A Statistical Approach","author":"Devijver P. A.","year":"1982"},{"key":"CIT0016","doi-asserted-by":"publisher","DOI":"10.1007\/s10115-006-0043-5"},{"key":"CIT0017","doi-asserted-by":"publisher","DOI":"10.1162\/153244303322753616"},{"key":"CIT0018","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-015-3994-4"},{"key":"CIT0019","doi-asserted-by":"publisher","DOI":"10.1023\/B:AIRE.0000045502.10941.a9"},{"key":"CIT0020","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijpe.2006.05.015"},{"issue":"1","key":"CIT0021","doi-asserted-by":"crossref","first-page":"79","DOI":"10.3233\/IDA-2004-8105","volume":"8","author":"Hu T.","year":"2004","journal-title":"Intelligent Data Analysis"},{"key":"CIT0022","doi-asserted-by":"publisher","DOI":"10.1007\/s007780050006"},{"key":"CIT0023","doi-asserted-by":"publisher","DOI":"10.1016\/S0031-3203(99)00041-2"},{"key":"CIT0024","doi-asserted-by":"publisher","DOI":"10.1080\/00207540600596874"},{"key":"CIT0025","doi-asserted-by":"publisher","DOI":"10.1109\/66.492810"},{"key":"CIT0026","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2007.906142"},{"key":"CIT0027","doi-asserted-by":"publisher","DOI":"10.1007\/s10115-009-0242-y"},{"key":"CIT0028","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2012.11.009"},{"key":"CIT0029","doi-asserted-by":"publisher","DOI":"10.1109\/34.990133"},{"issue":"8","key":"CIT0030","first-page":"114","volume":"38","author":"Moore G. E.","year":"1965","journal-title":"Electronics Magazine"},{"key":"CIT0031","doi-asserted-by":"publisher","DOI":"10.2307\/2344614"},{"key":"CIT0032","doi-asserted-by":"publisher","DOI":"10.1016\/0377-2217(96)83599-5"},{"key":"CIT0033","volume-title":"Robust Regression and Outlier Detection","author":"Rousseeuw P.","year":"1996","edition":"3"},{"key":"CIT0034","doi-asserted-by":"publisher","DOI":"10.1016\/j.jbi.2008.12.012"},{"key":"CIT0035","doi-asserted-by":"publisher","DOI":"10.1080\/07408170902966344"},{"key":"CIT0036","doi-asserted-by":"publisher","DOI":"10.1109\/66.728550"},{"key":"CIT0037","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2002.804901"},{"key":"CIT0038","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-5273(00)00045-1"},{"key":"CIT0039","author":"Turkey J. W.","year":"1977","journal-title":"Exploratory Data Analysis."},{"key":"CIT0040","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2010.08.011"},{"key":"CIT0041","doi-asserted-by":"publisher","DOI":"10.1080\/07408170600733236"},{"key":"CIT0042","doi-asserted-by":"publisher","DOI":"10.1080\/02772240600610822"},{"issue":"4","key":"CIT0043","doi-asserted-by":"crossref","first-page":"376","DOI":"10.1080\/00224065.1999.11979944","volume":"31","author":"Woodall W. H.","year":"1993","journal-title":"Journal of Quality Technology"},{"key":"CIT0044","doi-asserted-by":"publisher","DOI":"10.1007\/s10115-010-0306-z"}],"container-title":["International Journal of Production Research"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/00207543.2015.1109153","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,30]],"date-time":"2020-08-30T06:39:27Z","timestamp":1598769567000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/00207543.2015.1109153"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,11,17]]},"references-count":43,"journal-issue":{"issue":"17","published-print":{"date-parts":[[2017,9,2]]}},"alternative-id":["10.1080\/00207543.2015.1109153"],"URL":"https:\/\/doi.org\/10.1080\/00207543.2015.1109153","relation":{},"ISSN":["0020-7543","1366-588X"],"issn-type":[{"value":"0020-7543","type":"print"},{"value":"1366-588X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2015,11,17]]},"assertion":[{"value":"The publishing and review policy for this title is described in its Aims & Scope.","order":1,"name":"peerreview_statement","label":"Peer Review Statement"},{"value":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=tprs20","URL":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=tprs20","order":2,"name":"aims_and_scope_url","label":"Aim & Scope"},{"value":"2014-12-08","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2015-10-09","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2015-11-17","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}