{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T19:05:00Z","timestamp":1776279900926,"version":"3.50.1"},"reference-count":38,"publisher":"Informa UK Limited","issue":"8","funder":[{"DOI":"10.13039\/100007763","name":"Engineering Laboratory","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007763","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":["www.tandfonline.com"],"crossmark-restriction":true},"short-container-title":["International Journal of Production Research"],"published-print":{"date-parts":[[2017,4,18]]},"DOI":"10.1080\/00207543.2016.1237791","type":"journal-article","created":{"date-parts":[[2016,10,11]],"date-time":"2016-10-11T10:41:25Z","timestamp":1476182485000},"page":"2304-2319","update-policy":"https:\/\/doi.org\/10.1080\/tandf_crossmark_01","source":"Crossref","is-referenced-by-count":20,"title":["Estimation and monitoring of key performance indicators of manufacturing systems using the multi-output Gaussian process"],"prefix":"10.1080","volume":"55","author":[{"given":"Raed","family":"Kontar","sequence":"first","affiliation":[{"name":"Department of Industrial and Systems Engineering, University of Wisconsin-Madison, Madison, WI, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shiyu","family":"Zhou","sequence":"additional","affiliation":[{"name":"Department of Industrial and Systems Engineering, University of Wisconsin-Madison, Madison, WI, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"John","family":"Horst","sequence":"additional","affiliation":[{"name":"National Institute of Standards and Technology, Gaithersburg, MD, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"301","published-online":{"date-parts":[[2016,10,11]]},"reference":[{"key":"CIT0001","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2006.873400"},{"key":"CIT0002","unstructured":"Balsamo, S., V. de Nitto Person\u00e9, and R. Onvural. 2013. Analysis of Queueing Networks with Blocking. New York: Springer Science and Business Media."},{"key":"CIT0003","first-page":"217","volume":"17","author":"Boyle P.","year":"2004","journal-title":"Advances in Neural Information Processing Systems"},{"key":"CIT0004","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2010.521806"},{"key":"CIT0005","doi-asserted-by":"publisher","DOI":"10.1287\/opre.50.6.1032.349"},{"key":"CIT0006","volume-title":"ISSM 2005 IEEE International Symposium on Semiconductor Manufacturing","author":"Chien C. F.","year":"2005"},{"key":"CIT0007","volume-title":"Complex data Modelling and Computationally Intensive Statistical Methods for Estimation and Predictions","author":"Cicorella P.","year":"2013"},{"key":"CIT0008","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2014.11917956"},{"key":"CIT0009","doi-asserted-by":"publisher","DOI":"10.1023\/A:1009614003692"},{"key":"CIT0010","doi-asserted-by":"publisher","DOI":"10.1109\/66.4371"},{"key":"CIT0011","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0657-9"},{"key":"CIT0012","doi-asserted-by":"publisher","DOI":"10.1109\/66.964327"},{"key":"CIT0013","doi-asserted-by":"publisher","DOI":"10.1016\/S0360-8352(00)00013-9"},{"key":"CIT0014","volume-title":"Applied Multivariate Statistical Analysis","author":"Johnson R. A.","year":"2002"},{"key":"CIT0015","doi-asserted-by":"publisher","DOI":"10.1017\/S0305004100036094"},{"key":"CIT0016","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1979.1094270"},{"key":"CIT0017","doi-asserted-by":"publisher","DOI":"10.1287\/mnsc.39.3.322"},{"key":"CIT0018","doi-asserted-by":"publisher","DOI":"10.1007\/s11004-006-9072-6"},{"key":"CIT0019","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-7892-5"},{"key":"CIT0020","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-010-0397-0"},{"key":"CIT0021","doi-asserted-by":"publisher","DOI":"10.1080\/07408170208928868"},{"key":"CIT0022","doi-asserted-by":"crossref","first-page":"430","DOI":"10.1109\/ASMC.1997.630775","volume-title":"Proceedings of the 1997 IEEE\/SEMI Advanced Semiconductor Manufacturing Conference","author":"Raddon A.","year":"1997"},{"key":"CIT0023","doi-asserted-by":"crossref","unstructured":"Rasmussen, C. E. 2006. Gaussian Processes for Machine Learning. Cambridge, MA: MIT Press.","DOI":"10.7551\/mitpress\/3206.001.0001"},{"key":"CIT0024","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMM.245.173"},{"key":"CIT0025","doi-asserted-by":"publisher","DOI":"10.1080\/00207548108956652"},{"key":"CIT0026","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2007.906348"},{"key":"CIT0027","volume-title":"Spatial Objective Analysis: With Applications in Atmospheric Science","author":"Thi\u00e9baux H. J.","year":"1987"},{"key":"CIT0028","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-3758(97)00162-6"},{"key":"CIT0029","doi-asserted-by":"publisher","DOI":"10.1198\/1061860043498"},{"key":"CIT0030","doi-asserted-by":"publisher","DOI":"10.1109\/66.4384"},{"key":"CIT0031","doi-asserted-by":"publisher","DOI":"10.1287\/mnsc.35.11.1341"},{"key":"CIT0032","doi-asserted-by":"publisher","DOI":"10.1080\/07408170801971502"},{"key":"CIT0033","first-page":"118","volume-title":"Information Systems for Crisis Response and Management (ISCRAM)","author":"Xu X. L.","year":"2011"},{"key":"CIT0034","doi-asserted-by":"publisher","DOI":"10.1080\/10429247.2003.11415191"},{"key":"CIT0035","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijmachtools.2007.07.011"},{"key":"CIT0036","doi-asserted-by":"publisher","DOI":"10.1002\/qre.v30.4"},{"key":"CIT0037","doi-asserted-by":"publisher","DOI":"10.1080\/0740817X.2015.1027455"},{"key":"CIT0038","doi-asserted-by":"publisher","DOI":"10.2307\/2532508"}],"container-title":["International Journal of Production Research"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/00207543.2016.1237791","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,28]],"date-time":"2020-08-28T19:50:05Z","timestamp":1598644205000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/00207543.2016.1237791"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10,11]]},"references-count":38,"journal-issue":{"issue":"8","published-print":{"date-parts":[[2017,4,18]]}},"alternative-id":["10.1080\/00207543.2016.1237791"],"URL":"https:\/\/doi.org\/10.1080\/00207543.2016.1237791","relation":{},"ISSN":["0020-7543","1366-588X"],"issn-type":[{"value":"0020-7543","type":"print"},{"value":"1366-588X","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,10,11]]},"assertion":[{"value":"The publishing and review policy for this title is described in its Aims & Scope.","order":1,"name":"peerreview_statement","label":"Peer Review Statement"},{"value":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=tprs20","URL":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=tprs20","order":2,"name":"aims_and_scope_url","label":"Aim & Scope"},{"value":"2016-02-28","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2016-09-06","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2016-10-11","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}