{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T20:11:41Z","timestamp":1770408701928,"version":"3.49.0"},"reference-count":5,"publisher":"Informa UK Limited","issue":"4","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2000,11]]},"DOI":"10.1080\/00401706.2000.10485748","type":"journal-article","created":{"date-parts":[[2012,4,24]],"date-time":"2012-04-24T17:16:38Z","timestamp":1335287798000},"page":"444-445","source":"Crossref","is-referenced-by-count":19,"title":["Geostatistics for Engineers and Earth Scientists"],"prefix":"10.1080","volume":"42","author":[{"given":"Ricardo A.","family":"Olea","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"301","published-online":{"date-parts":[[2012,3,12]]},"reference":[{"key":"e_1_2_1_2_1","volume-title":"GSLIB: Geostatistical Software Library and User's Guide,","author":"Deutsch C.","year":"1998","unstructured":"Deutsch , C. and Journel , A. 1998 . GSLIB: Geostatistical Software Library and User's Guide, , 2nd ed. New York : Oxford University Press. .","edition":"2"},{"key":"e_1_2_1_3_1","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-011-4425-4"},{"key":"e_1_2_1_4_1","volume-title":"Mining Geostatistics","author":"Journel A.","year":"1978","unstructured":"Journel , A. and Huijbregts , C. 1978 . Mining Geostatistics London : Academic Press. ."},{"key":"e_1_2_1_5_1","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1998.10485575"},{"key":"e_1_2_1_6_1","doi-asserted-by":"crossref","first-page":"442","DOI":"10.2307\/1270983","article-title":"Editor's Report on Geostatistics and Petroleum Geology (2nd ed.)","volume":"42","author":"Ziegel E.","year":"2000","unstructured":"Ziegel , E. 2000 . Editor's Report on Geostatistics and Petroleum Geology (2nd ed.) . Technometrics , 42 : 442 by M. E. Hohn","journal-title":"Technometrics"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/00401706.2000.10485748","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T09:15:39Z","timestamp":1770369339000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/00401706.2000.10485748"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2000,11]]},"references-count":5,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2000,11]]}},"alternative-id":["10.1080\/00401706.2000.10485748"],"URL":"https:\/\/doi.org\/10.1080\/00401706.2000.10485748","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2000,11]]}}}