{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,3]],"date-time":"2025-12-03T17:14:52Z","timestamp":1764782092574},"reference-count":10,"publisher":"Informa UK Limited","issue":"3","content-domain":{"domain":["www.tandfonline.com"],"crossmark-restriction":true},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2017,7,3]]},"DOI":"10.1080\/00401706.2016.1214180","type":"journal-article","created":{"date-parts":[[2016,7,26]],"date-time":"2016-07-26T17:37:22Z","timestamp":1469554642000},"page":"371-380","update-policy":"http:\/\/dx.doi.org\/10.1080\/tandf_crossmark_01","source":"Crossref","is-referenced-by-count":15,"title":["Comparing the Reliability of Related Populations With the Probability of Agreement"],"prefix":"10.1080","volume":"59","author":[{"given":"Nathaniel T.","family":"Stevens","sequence":"first","affiliation":[{"name":"University of San Francisco, San Francisco, California"}]},{"given":"Christine M.","family":"Anderson-Cook","sequence":"additional","affiliation":[{"name":"Los Alamos National Laboratory, Los Alamos, New Mexico"}]}],"member":"301","published-online":{"date-parts":[[2017,4,20]]},"reference":[{"key":"cit0002","doi-asserted-by":"publisher","DOI":"10.3390\/systems3030109"},{"key":"cit0003","volume-title":"Reliability: Probabilistic Models and Statistical Methods","author":"Leemis L. M."},{"key":"cit0005","doi-asserted-by":"crossref","first-page":"71","DOI":"10.1080\/08982112.2010.495259","volume":"23","author":"Lu L.","year":"2011","journal-title":"Quality Engineering"},{"key":"cit0006","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2014.990033"},{"key":"cit0007","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4899-3242-6"},{"key":"cit0008","doi-asserted-by":"publisher","DOI":"10.2165\/00002018-199615040-00001"},{"key":"cit0009","doi-asserted-by":"publisher","DOI":"10.4135\/9781412984805"},{"key":"cit0010","doi-asserted-by":"publisher","DOI":"10.1177\/0962280215601133"},{"key":"cit0011","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2014.11917979"},{"key":"cit0012","doi-asserted-by":"publisher","DOI":"10.1201\/EBK1439808184"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/00401706.2016.1214180","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,28]],"date-time":"2020-08-28T18:27:57Z","timestamp":1598639277000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/00401706.2016.1214180"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4,20]]},"references-count":10,"journal-issue":{"issue":"3","published-print":{"date-parts":[[2017,7,3]]}},"alternative-id":["10.1080\/00401706.2016.1214180"],"URL":"https:\/\/doi.org\/10.1080\/00401706.2016.1214180","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,4,20]]},"assertion":[{"value":"The publishing and review policy for this title is described in its Aims & Scope.","order":1,"name":"peerreview_statement","label":"Peer Review Statement"},{"value":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=utch20","URL":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=utch20","order":2,"name":"aims_and_scope_url","label":"Aim & Scope"},{"value":"2015-10-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2016-04-01","order":1,"name":"revised","label":"Revised","group":{"name":"publication_history","label":"Publication History"}},{"value":"2017-04-20","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}