{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,17]],"date-time":"2025-10-17T13:53:36Z","timestamp":1760709216702},"reference-count":35,"publisher":"Informa UK Limited","issue":"4","content-domain":{"domain":["www.tandfonline.com"],"crossmark-restriction":true},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2017,10,2]]},"DOI":"10.1080\/00401706.2016.1273139","type":"journal-article","created":{"date-parts":[[2016,12,20]],"date-time":"2016-12-20T16:02:56Z","timestamp":1482249776000},"page":"496-507","update-policy":"http:\/\/dx.doi.org\/10.1080\/tandf_crossmark_01","source":"Crossref","is-referenced-by-count":5,"title":["Statistical Process Control for Latent Quality Characteristics Using the Up-and-Down Test"],"prefix":"10.1080","volume":"59","author":[{"given":"Dongdong","family":"Xiang","sequence":"first","affiliation":[{"name":"School of Statistics, East China Normal University, Shanghai, China"}]},{"given":"Fugee","family":"Tsung","sequence":"additional","affiliation":[{"name":"Department of Industrial Engineering and Logistic Management, Hong Kong University of Science and Technology, Hong Kong"}]},{"given":"Xiaolong","family":"Pu","sequence":"additional","affiliation":[{"name":"School of Statistics, East China Normal University, Shanghai, China"}]}],"member":"301","published-online":{"date-parts":[[2017,5,25]]},"reference":[{"key":"cit0001","doi-asserted-by":"publisher","DOI":"10.1080\/07408179908969854"},{"key":"cit0002","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2002.11980131"},{"key":"cit0003","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2001.11980081"},{"key":"cit0004","first-page":"5.1","volume":"17","author":"Chao M. T.","year":"1999","journal-title":"Proceedings of the 17th Symposium on Explosives and Pyrotechnic"},{"key":"cit0005","first-page":"1","volume":"11","author":"\u2014\u2014\u2014","year":"2001","journal-title":"Statistica Sinica"},{"key":"cit0006","doi-asserted-by":"publisher","DOI":"10.2307\/2531453"},{"key":"cit0007","doi-asserted-by":"crossref","first-page":"340","DOI":"10.1080\/00224065.2014.11917976","volume":"46","author":"Dickinson R.M.","year":"2014","journal-title":"Journal of Quality Technology"},{"key":"cit0008","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1948.10483254"},{"key":"cit0009","doi-asserted-by":"publisher","DOI":"10.1198\/004017006000000318"},{"key":"cit0010","doi-asserted-by":"publisher","DOI":"10.1198\/016214507000001346"},{"key":"cit0011","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2005.11980321"},{"key":"cit0012","doi-asserted-by":"publisher","DOI":"10.1198\/016214505000000556"},{"key":"cit0013","first-page":"473","volume":"19","author":"\u2014\u2014\u2014","year":"2009","journal-title":"Statistical Sinica"},{"key":"cit0014","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4612-1686-5"},{"key":"cit0015","volume-title":"Introduction toMathematical Statistics","author":"Hogg R. V.","year":"2005"},{"key":"cit0016","doi-asserted-by":"publisher","DOI":"10.1093\/biomet\/91.2.461"},{"key":"cit0017","first-page":"1549","volume":"17","author":"Joseph V. R.","year":"2007","journal-title":"Statistica Sinica"},{"key":"cit0018","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.1985.11978941"},{"key":"cit0019","volume-title":"Introduction To Statistical Quality Control","author":"Montgomery D. C.","year":"2009","edition":"6"},{"key":"cit0020","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1249"},{"key":"cit0021","doi-asserted-by":"publisher","DOI":"10.1080\/07408170701744843"},{"key":"cit0022","volume-title":"Introduction to Statistical Process Control","author":"\u2014\u2014\u2014","year":"2014"},{"key":"cit0023","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2011.10005"},{"key":"cit0024","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.1999.11979900"},{"key":"cit0025","doi-asserted-by":"publisher","DOI":"10.1080\/07408170008963928"},{"key":"cit0026","doi-asserted-by":"publisher","DOI":"10.1214\/aoms\/1177729586"},{"key":"cit0027","doi-asserted-by":"publisher","DOI":"10.1002\/nav.21557"},{"key":"cit0028","author":"Voelkel J. G.","year":"1999","journal-title":"Rochester Institute of Technology: Technical Report"},{"key":"cit0029","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.1985.10478213"},{"key":"cit0030","doi-asserted-by":"publisher","DOI":"10.1016\/j.jspi.2013.10.007"},{"key":"cit0031","doi-asserted-by":"crossref","first-page":"321","DOI":"10.1080\/00224065.2004.11980277","volume":"36","author":"Zhang L.","year":"2004","journal-title":"Journal of Quality Technology"},{"key":"cit0032","author":"Zhang W.","year":"2012","journal-title":"2nd International Conference on Electronic and Mechanical Engineering and Information Technology"},{"key":"cit0033","doi-asserted-by":"publisher","DOI":"10.1080\/01621459.2012.682811"},{"key":"cit0034","doi-asserted-by":"publisher","DOI":"10.1002\/qre.867"},{"key":"cit0035","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2010.09095"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/00401706.2016.1273139","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,9,5]],"date-time":"2020-09-05T09:22:16Z","timestamp":1599297736000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/00401706.2016.1273139"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,5,25]]},"references-count":35,"journal-issue":{"issue":"4","published-print":{"date-parts":[[2017,10,2]]}},"alternative-id":["10.1080\/00401706.2016.1273139"],"URL":"https:\/\/doi.org\/10.1080\/00401706.2016.1273139","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,5,25]]},"assertion":[{"value":"The publishing and review policy for this title is described in its Aims & Scope.","order":1,"name":"peerreview_statement","label":"Peer Review Statement"},{"value":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=utch20","URL":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=utch20","order":2,"name":"aims_and_scope_url","label":"Aim & Scope"},{"value":"2015-06-01","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2016-12-01","order":1,"name":"revised","label":"Revised","group":{"name":"publication_history","label":"Publication History"}},{"value":"2017-05-25","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}