{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,16]],"date-time":"2025-10-16T06:59:26Z","timestamp":1760597966400},"reference-count":0,"publisher":"Informa UK Limited","issue":"2","content-domain":{"domain":["www.tandfonline.com"],"crossmark-restriction":true},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2020,4,2]]},"DOI":"10.1080\/00401706.2020.1744909","type":"journal-article","created":{"date-parts":[[2020,5,7]],"date-time":"2020-05-07T19:17:49Z","timestamp":1588879069000},"page":"1-285","update-policy":"http:\/\/dx.doi.org\/10.1080\/tandf_crossmark_01","source":"Crossref","is-referenced-by-count":6,"title":["Statistical Intervals: A Guide for Practitioners and Researchers (2nd ed.)"],"prefix":"10.1080","volume":"62","author":[{"given":"Lu","family":"Lu","sequence":"first","affiliation":[{"name":"University of South Florida"}]}],"member":"301","published-online":{"date-parts":[[2020,5,7]]},"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/00401706.2020.1744909","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,5,7]],"date-time":"2020-05-07T19:18:09Z","timestamp":1588879089000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/00401706.2020.1744909"}},"subtitle":["by William Q. Meeker, Gerald J. Hahn, and Luis A. Escobar. Hoboken, NJ: Wiley, 2017, xxxv + 579 pp., $87.22, ISBN: 978-0-471-68717-7."],"short-title":[],"issued":{"date-parts":[[2020,4,2]]},"references-count":0,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2020,4,2]]}},"alternative-id":["10.1080\/00401706.2020.1744909"],"URL":"https:\/\/doi.org\/10.1080\/00401706.2020.1744909","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,4,2]]},"assertion":[{"value":"The publishing and review policy for this title is described in its Aims & Scope.","order":1,"name":"peerreview_statement","label":"Peer Review Statement"},{"value":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=utch20","URL":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=utch20","order":2,"name":"aims_and_scope_url","label":"Aim & Scope"},{"value":"2020-05-07","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}