{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,31]],"date-time":"2026-01-31T03:55:47Z","timestamp":1769831747022,"version":"3.49.0"},"reference-count":29,"publisher":"Informa UK Limited","issue":"2","funder":[{"name":"Office of the Secretary of Defense, Directorate of Operational Test and Evaluation","award":["FA8075-14-D-0019"],"award-info":[{"award-number":["FA8075-14-D-0019"]}]},{"name":"Test Resource Management Center"},{"name":"Science of Test research program","award":["FA807518F1525"],"award-info":[{"award-number":["FA807518F1525"]}]}],"content-domain":{"domain":["www.tandfonline.com"],"crossmark-restriction":true},"short-container-title":["Technometrics"],"published-print":{"date-parts":[[2025,4,3]]},"DOI":"10.1080\/00401706.2024.2431119","type":"journal-article","created":{"date-parts":[[2024,12,5]],"date-time":"2024-12-05T13:34:11Z","timestamp":1733405651000},"page":"283-292","update-policy":"https:\/\/doi.org\/10.1080\/tandf_crossmark_01","source":"Crossref","is-referenced-by-count":3,"title":["Profile Monitoring via Eigenvector Perturbation"],"prefix":"10.1080","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3029-5773","authenticated-orcid":false,"given":"Takayuki","family":"Iguchi","sequence":"first","affiliation":[{"name":"Department of Statistics, Florida State University","place":["Tallahassee"]}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8196-7229","authenticated-orcid":false,"given":"Andr\u00e9s F.","family":"Barrientos","sequence":"additional","affiliation":[{"name":"Department of Statistics, Florida State University","place":["Tallahassee"]}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3977-3601","authenticated-orcid":false,"given":"Eric","family":"Chicken","sequence":"additional","affiliation":[{"name":"Department of Statistics, Florida State University","place":["Tallahassee"]}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Debajyoti","family":"Sinha","sequence":"additional","affiliation":[{"name":"Department of Statistics, Florida State University","place":["Tallahassee"]}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"301","published-online":{"date-parts":[[2025,1,7]]},"reference":[{"key":"e_1_3_3_2_1","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1071"},{"key":"e_1_3_3_3_1","doi-asserted-by":"publisher","DOI":"10.1080\/23737484.2022.2087121"},{"key":"e_1_3_3_4_1","doi-asserted-by":"publisher","DOI":"10.1109\/70.488941"},{"key":"e_1_3_3_5_1","doi-asserted-by":"publisher","DOI":"10.1561\/2200000079"},{"key":"e_1_3_3_6_1","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2009.11917773"},{"key":"e_1_3_3_7_1","doi-asserted-by":"publisher","DOI":"10.1002\/qre.878"},{"key":"e_1_3_3_8_1","doi-asserted-by":"publisher","DOI":"10.1080\/00207540802662888"},{"key":"e_1_3_3_9_1","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2008.11917709"},{"key":"e_1_3_3_10_1","doi-asserted-by":"publisher","DOI":"10.1137\/0707001"},{"key":"e_1_3_3_11_1","unstructured":"Dua D. and Graff C. (2017) \u201cUCI Machine Learning Repository \u201d Irvine CA: University of California School of Information and Computer Science. Available at http:\/\/archive.ics.uci.edu\/ml."},{"key":"e_1_3_3_12_1","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.1991.11979302"},{"key":"e_1_3_3_13_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2011.12.009"},{"key":"e_1_3_3_14_1","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2825"},{"key":"e_1_3_3_15_1","unstructured":"Iguchi T. Barrientos A. F. Chicken E. and Sinha D. (2022) \u201cProfile Monitoring via Eigenvector Perturbation \u201d arXiv preprint arXiv:2205.15422."},{"key":"e_1_3_3_16_1","doi-asserted-by":"publisher","DOI":"10.1213\/01.ane.0000204385.01983.61"},{"key":"e_1_3_3_17_1","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.1999.10485932"},{"key":"e_1_3_3_18_1","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2000.11980027"},{"key":"e_1_3_3_19_1","doi-asserted-by":"publisher","DOI":"10.3150\/19-BEJ1183"},{"key":"e_1_3_3_20_1","doi-asserted-by":"publisher","DOI":"10.1002\/qre.2385"},{"key":"e_1_3_3_21_1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cie.2018.10.008"},{"key":"e_1_3_3_22_1","doi-asserted-by":"publisher","DOI":"10.1002\/qre.1657"},{"key":"e_1_3_3_23_1","doi-asserted-by":"publisher","DOI":"10.5705\/ss.202019.0052"},{"key":"e_1_3_3_24_1","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2017.1361340"},{"key":"e_1_3_3_25_1","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2010.08188"},{"key":"e_1_3_3_26_1","doi-asserted-by":"publisher","DOI":"10.1080\/00224065.2014.11917965"},{"key":"e_1_3_3_27_1","doi-asserted-by":"publisher","DOI":"10.1080\/00401706.2017.1375993"},{"key":"e_1_3_3_28_1","doi-asserted-by":"publisher","DOI":"10.1002\/qre.858"},{"key":"e_1_3_3_29_1","doi-asserted-by":"publisher","DOI":"10.1080\/08982112.2019.1582779"},{"key":"e_1_3_3_30_1","doi-asserted-by":"publisher","DOI":"10.1198\/004017008000000433"}],"container-title":["Technometrics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/00401706.2024.2431119","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,7]],"date-time":"2025-05-07T18:02:38Z","timestamp":1746640958000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/00401706.2024.2431119"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1,7]]},"references-count":29,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2025,4,3]]}},"alternative-id":["10.1080\/00401706.2024.2431119"],"URL":"https:\/\/doi.org\/10.1080\/00401706.2024.2431119","relation":{},"ISSN":["0040-1706","1537-2723"],"issn-type":[{"value":"0040-1706","type":"print"},{"value":"1537-2723","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1,7]]},"assertion":[{"value":"The publishing and review policy for this title is described in its Aims & Scope.","order":1,"name":"peerreview_statement","label":"Peer Review Statement"},{"value":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=utch20","URL":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=utch20","order":2,"name":"aims_and_scope_url","label":"Aim & Scope"},{"value":"2022-07-19","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2024-09-23","order":1,"name":"revised","label":"Revised","group":{"name":"publication_history","label":"Publication History"}},{"value":"2024-10-29","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2025-01-07","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}