{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,6]],"date-time":"2026-03-06T11:17:41Z","timestamp":1772795861246,"version":"3.50.1"},"reference-count":16,"publisher":"Informa UK Limited","issue":"2","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["International Journal of Computer Integrated Manufacturing"],"published-print":{"date-parts":[[2002,1]]},"DOI":"10.1080\/09511920110035283","type":"journal-article","created":{"date-parts":[[2002,7,26]],"date-time":"2002-07-26T15:31:10Z","timestamp":1027697470000},"page":"97-108","source":"Crossref","is-referenced-by-count":11,"title":["A computer model for time-based tolerance design with response surface methodology"],"prefix":"10.1080","volume":"15","author":[{"given":"Angus","family":"Jeang","sequence":"first","affiliation":[]},{"given":"Shao-Wen","family":"Tsai","sequence":"additional","affiliation":[]},{"given":"Huan-Chung","family":"Li","sequence":"additional","affiliation":[]},{"given":"Chih-Kuang","family":"Hsieh","sequence":"additional","affiliation":[]}],"member":"301","reference":[{"key":"CIT0001","doi-asserted-by":"publisher","DOI":"10.1115\/1.2916933"},{"key":"CIT0002","first-page":"49","volume":"3","author":"CHASE K. W.","year":"1990","journal-title":"Manufacturing Review"},{"key":"CIT0003","doi-asserted-by":"publisher","DOI":"10.1016\/0278-6125(91)90034-Y"},{"key":"CIT0004","doi-asserted-by":"crossref","unstructured":"FENG, C. X. and KUSLAK, A. 1994.Design of tolerance for quality. Design Theory and Methodology, ASME19\u201328. New York","DOI":"10.1115\/DETC1994-0003"},{"key":"CIT0006","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(90)90122-B"},{"key":"CIT0007","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4899-4465-8","volume-title":"Process Capability Indices","author":"KOTZ S.","year":"1993"},{"key":"CIT0008","volume-title":"Design and Analysis of Experiments,","author":"MONTGOMERY D. C.","year":"1991","edition":"3"},{"key":"CIT0009","doi-asserted-by":"publisher","DOI":"10.1016\/0378-3758(94)00035-T"},{"key":"CIT0010","doi-asserted-by":"publisher","DOI":"10.1080\/03610929108830509"},{"key":"CIT0011","unstructured":"MYERS, R. H. and MONTGOMERY, D. C. 1995.Response Surface Methodology-Process and Product Optimization Using Designed Experiments, 318\u2013321. New York: Wiley."},{"key":"CIT0012","volume-title":"Quality Engineering Using Robust Design","author":"PHADKE M. S.","year":"1989"},{"key":"CIT0013","doi-asserted-by":"publisher","DOI":"10.1214\/ss\/1177012413"},{"key":"CIT0014","doi-asserted-by":"publisher","DOI":"10.1115\/1.3428175"},{"key":"CIT0015","doi-asserted-by":"publisher","DOI":"10.1115\/1.3438222"},{"key":"CIT0016","unstructured":"TAGUCHI, G. 1989.Introduction to Quality Engineering, 21\u201322. White Plains, New York: Asian Productivity Organization Unipub."},{"key":"CIT0018","doi-asserted-by":"publisher","DOI":"10.1080\/03610929108830510"}],"container-title":["International Journal of Computer Integrated Manufacturing"],"original-title":[],"language":"en","link":[{"URL":"http:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/09511920110035283","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,5,16]],"date-time":"2021-05-16T19:17:24Z","timestamp":1621192644000},"score":1,"resource":{"primary":{"URL":"http:\/\/www.tandfonline.com\/doi\/abs\/10.1080\/09511920110035283"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2002,1]]},"references-count":16,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2002,1]]}},"alternative-id":["10.1080\/09511920110035283"],"URL":"https:\/\/doi.org\/10.1080\/09511920110035283","relation":{},"ISSN":["0951-192X","1362-3052"],"issn-type":[{"value":"0951-192X","type":"print"},{"value":"1362-3052","type":"electronic"}],"subject":[],"published":{"date-parts":[[2002,1]]}}}