{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,22]],"date-time":"2026-10-22T19:06:02Z","timestamp":1792695962988,"version":"4.5.0"},"reference-count":44,"publisher":"Informa UK Limited","issue":"2","content-domain":{"domain":["www.tandfonline.com"],"crossmark-restriction":true},"short-container-title":["International Journal of Parallel, Emergent and Distributed Systems"],"published-print":{"date-parts":[[2021,3,4]]},"DOI":"10.1080\/17445760.2019.1650039","type":"journal-article","created":{"date-parts":[[2019,8,7]],"date-time":"2019-08-07T04:47:40Z","timestamp":1565153260000},"page":"130-143","update-policy":"https:\/\/doi.org\/10.1080\/tandf_crossmark_01","source":"Crossref","is-referenced-by-count":12,"title":["Cross-project defect prediction using data sampling for class imbalance learning: an empirical study"],"prefix":"10.1080","volume":"36","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1609-2475","authenticated-orcid":false,"given":"Lipika","family":"Goel","sequence":"first","affiliation":[{"name":"Amity Institute of Information Technology, Amity University, Noida, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mayank","family":"Sharma","sequence":"additional","affiliation":[{"name":"Amity Institute of Information Technology, Amity University, Noida, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Sunil Kumar","family":"Khatri","sequence":"additional","affiliation":[{"name":"Amity Institute of Information Technology, Amity University, Noida, India"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"D.","family":"Damodaran","sequence":"additional","affiliation":[{"name":"Centre for Reliability, Chennai, India"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"301","published-online":{"date-parts":[[2019,8,6]]},"reference":[{"key":"CIT0001","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2012.03.014"},{"key":"CIT0002","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2009.12.056"},{"key":"CIT0003","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2012.2226152"},{"key":"CIT0004","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2014.2316951"},{"key":"CIT0005","doi-asserted-by":"publisher","DOI":"10.1145\/2568225.2568320"},{"key":"CIT0006","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2011.09.007"},{"key":"CIT0007","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE.2013.6606584"},{"key":"CIT0008","doi-asserted-by":"publisher","DOI":"10.1145\/2499393.2499395"},{"key":"CIT0009","doi-asserted-by":"publisher","DOI":"10.1109\/MSR.2013.6624057"},{"key":"CIT0010","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2013.38"},{"key":"CIT0011","first-page":"5","volume":"74","author":"Singh P","year":"2013","journal-title":"Int J Comput Appl"},{"key":"CIT0012","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2012.20"},{"key":"CIT0013","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2012.10.003"},{"key":"CIT0014","volume-title":"Towards cross-project defect prediction with imbalanced feature sets","author":"He P","year":"2014"},{"key":"CIT0015","doi-asserted-by":"crossref","unstructured":"Panichella RO, De Lucia A. Cross-project defect prediction models: L\u2019Union fait la force. Software Evolution Week \u2013 IEEE Conference on Software Maintenance, Reengineering, and Reverse Engineering (CSMR-WCRE); 2014 Feb 3\u20136; Antwerp, Belgium. IEEE; 2014. p. 164\u2013173.","DOI":"10.1109\/CSMR-WCRE.2014.6747166"},{"key":"CIT0016","doi-asserted-by":"crossref","unstructured":"Dai W, Yang Q, Xue G, et al. Boosting for transfer learning. Proceedings of the 24th international conference on Machine Learning; 2007 Jun 20\u201324; Corvalis (OR). New York (NY): ACM; 2007. p. 193\u2013200.","DOI":"10.1145\/1273496.1273521"},{"key":"CIT0017","doi-asserted-by":"crossref","unstructured":"Mizuno O, Hirata Y. A cross-project evaluation of text-based fault-prone module prediction. 6th International Workshop on Empirical Software Engineering in Practice; 2014 Nov 12\u201313; Osaka, Japan. IEEE; 2014. p. 43\u201348.","DOI":"10.1109\/IWESEP.2014.9"},{"key":"CIT0018","doi-asserted-by":"crossref","unstructured":"Nam J, Kim S. Heterogeneous defect prediction. Proceedings of the 2015 10th Joint Meeting on Foundations of Software Engineering; 2015 Aug 30\u2013Sept 4; Bergamo, Italy. New York (NY): ACM; 2015. p. 508\u2013519.","DOI":"10.1145\/2786805.2786814"},{"key":"CIT0019","doi-asserted-by":"crossref","unstructured":"Jing XY, Wu F, Dong X, et al. Heterogeneous cross company defect prediction by unified metric representation and CCA-based transfer learning. Proceedings of the 2015 10th Joint Meeting on Foundations of Software Engineering; 2015 Aug 30\u2013Sept 4; Bergamo, Italy. New York (NY):ACM; 2015. p. 496\u2013507.","DOI":"10.1145\/2786805.2786813"},{"key":"CIT0020","doi-asserted-by":"publisher","DOI":"10.1007\/s11219-015-9287-1"},{"key":"CIT0021","doi-asserted-by":"publisher","DOI":"10.1016\/j.infsof.2015.01.014"},{"key":"CIT0022","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2013.2259203"},{"key":"CIT0023","doi-asserted-by":"publisher","DOI":"10.1613\/jair.953"},{"key":"CIT0024","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2007.07.040"},{"key":"CIT0025","doi-asserted-by":"publisher","DOI":"10.1109\/32.295895"},{"key":"CIT0026","doi-asserted-by":"publisher","DOI":"10.1145\/1595696.1595713"},{"key":"CIT0027","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2009.191"},{"key":"CIT0028","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-014-9346-4"},{"key":"CIT0029","doi-asserted-by":"publisher","DOI":"10.1145\/2884781.2884839"},{"key":"CIT0030","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2016.2543218"},{"key":"CIT0031","doi-asserted-by":"publisher","DOI":"10.1109\/TSE.2017.2724538"},{"key":"CIT0032","doi-asserted-by":"publisher","DOI":"10.1111\/j.0824-7935.2004.t01-1-00228.x"},{"key":"CIT0033","first-page":"518","volume":"1","author":"Japkowicz N","year":"1995","journal-title":"IJCAI (US)"},{"key":"CIT0034","doi-asserted-by":"publisher","DOI":"10.1109\/TKDE.2006.17"},{"key":"CIT0035","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-009-9124-7"},{"key":"CIT0036","doi-asserted-by":"crossref","unstructured":"Wang S, Chen H, Yao X. Negative correlation learning for classification ensembles. Proceedings of the International Joint Conference on Neural Networks, WCCI; 2010. p. 2893\u20132900.","DOI":"10.1109\/IJCNN.2010.5596702"},{"key":"CIT0037","doi-asserted-by":"crossref","unstructured":"Chawla NV, Lazarevic A, Hall LO, et al. SMOTEBoost: improving prediction of the minority class in boosting. In: Lavrac N, Gamberger D, Todorovski L, et al., editors. Knowledge discovery in databases: PKDD 2003. European Conference on Principles of Data Mining and Knowledge Discovery. Lecture Notes in Computer Science. Vol. 2838. Berlin: Springer; 2003. p. 107\u2013119.","DOI":"10.1007\/978-3-540-39804-2_12"},{"key":"CIT0038","unstructured":"Briand LC, Wuest J, Ikonomovski S, et al. Investigation of quality factors in object-oriented designs: an industrial case study. Proceedings of the 1999 International Conference on Software Engineering (IEEE Cat. No.99CB37002); 1999 May 22\u201322; Los Angeles (CA). IEEE; 1999. p. 345\u2013354."},{"key":"CIT0039","unstructured":"Tang MH, Kao MH, Chen MH. An empirical study on object oriented metrics. Proceedings Sixth International Software Metrics Symposium (Cat. No.PR00403); 1999 Nov 4\u20136; Boca Raton (FL). IEEE; 1999. p. 242\u2013249."},{"key":"CIT0040","doi-asserted-by":"publisher","DOI":"10.1016\/S0164-1212(99)00102-8"},{"key":"CIT0041","doi-asserted-by":"publisher","DOI":"10.1023\/A:1010933404324"},{"key":"CIT0042","doi-asserted-by":"publisher","DOI":"10.3389\/fnbot.2013.00021"},{"key":"CIT0043","doi-asserted-by":"publisher","DOI":"10.1145\/1985793.1985859"},{"key":"CIT0044","doi-asserted-by":"crossref","unstructured":"Ozturk MM, Zengin A. HSDD: a hybrid sampling strategy for class imbalance in defect prediction data sets. Eleventh International Conference on Digital Information Management (ICDIM); 2016 Sept 19\u201321; Porto, Portugal. IEEE; 2016. p. 60\u201369.","DOI":"10.1109\/ICDIM.2016.7829755"}],"container-title":["International Journal of Parallel, Emergent and Distributed Systems"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/17445760.2019.1650039","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,5,6]],"date-time":"2021-05-06T08:14:55Z","timestamp":1620288895000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/17445760.2019.1650039"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,8,6]]},"references-count":44,"journal-issue":{"issue":"2","published-print":{"date-parts":[[2021,3,4]]}},"alternative-id":["10.1080\/17445760.2019.1650039"],"URL":"https:\/\/doi.org\/10.1080\/17445760.2019.1650039","relation":{},"ISSN":["1744-5760","1744-5779"],"issn-type":[{"value":"1744-5760","type":"print"},{"value":"1744-5779","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,8,6]]},"assertion":[{"value":"The publishing and review policy for this title is described in its Aims & Scope.","order":1,"name":"peerreview_statement","label":"Peer Review Statement"},{"value":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=gpaa20","URL":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=gpaa20","order":2,"name":"aims_and_scope_url","label":"Aim & Scope"},{"value":"2019-01-15","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2019-07-26","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2019-08-06","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}