{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,6]],"date-time":"2025-10-06T18:59:03Z","timestamp":1759777143650,"version":"3.37.3"},"reference-count":25,"publisher":"Informa UK Limited","issue":"1","funder":[{"name":"Brazilian agencies CNPq","award":["304604\/2015-1","400677\/2014-8"],"award-info":[{"award-number":["304604\/2015-1","400677\/2014-8"]}]},{"name":"CAPES and FAPESP"},{"name":"Government of the Russian Federation","award":["16-02-00821-a"],"award-info":[{"award-number":["16-02-00821-a"]}]},{"name":"FCT\/MEC"},{"DOI":"10.13039\/501100008530","name":"FEDER","doi-asserted-by":"crossref","award":["PT2020"],"award-info":[{"award-number":["PT2020"]}],"id":[{"id":"10.13039\/501100008530","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":["www.tandfonline.com"],"crossmark-restriction":true},"short-container-title":["Ferroelectrics"],"published-print":{"date-parts":[[2018,9,10]]},"DOI":"10.1080\/00150193.2018.1470821","type":"journal-article","created":{"date-parts":[[2019,2,27]],"date-time":"2019-02-27T18:34:56Z","timestamp":1551292496000},"page":"10-18","update-policy":"https:\/\/doi.org\/10.1080\/tandf_crossmark_01","source":"Crossref","is-referenced-by-count":3,"title":["Imprint behavior and polarization relaxation of PLZT thin films"],"prefix":"10.1080","volume":"533","author":[{"given":"E. B.","family":"Araujo","sequence":"first","affiliation":[{"name":"Department of Physics and Chemistry, S\u00e3o Paulo State University, Ilha Solteira, SP, Brazil;"}]},{"given":"M.","family":"Melo","sequence":"additional","affiliation":[{"name":"Department of Physics and Chemistry, S\u00e3o Paulo State University, Ilha Solteira, SP, Brazil;"}]},{"given":"M.","family":"Ivanov","sequence":"additional","affiliation":[{"name":"Department of Materials and Ceramic Engineering &amp; CICECO, University of Aveiro, Aveiro, Portugal;"}]},{"given":"V. Ya.","family":"Shur","sequence":"additional","affiliation":[{"name":"Department of Materials and Ceramic Engineering &amp; CICECO, University of Aveiro, Aveiro, Portugal;"}]},{"given":"A. L.","family":"Kholkin","sequence":"additional","affiliation":[{"name":"Department of Materials and Ceramic Engineering &amp; CICECO, University of Aveiro, Aveiro, Portugal;"},{"name":"Institute of Natural Sciences, Ural Federal University, Ekaterinburg, Russia"}]}],"member":"301","published-online":{"date-parts":[[2019,2,27]]},"reference":[{"key":"CIT0001","doi-asserted-by":"publisher","DOI":"10.1111\/j.1151-2916.1970.tb12105.x-i1"},{"volume-title":"Electronic Ceramics","year":"1988","author":"Haertling G. H.","key":"CIT0002"},{"key":"CIT0003","doi-asserted-by":"publisher","DOI":"10.1007\/s10853-005-5915-7"},{"key":"CIT0004","doi-asserted-by":"publisher","DOI":"10.1111\/j.1151-2916.1999.tb01840.x"},{"key":"CIT0005","doi-asserted-by":"publisher","DOI":"10.1016\/j.susc.2008.04.001"},{"key":"CIT0006","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.45.7520"},{"key":"CIT0007","doi-asserted-by":"publisher","DOI":"10.1063\/1.357316"},{"key":"CIT0008","doi-asserted-by":"publisher","DOI":"10.1007\/s10853-005-5914-8"},{"key":"CIT0009","doi-asserted-by":"publisher","DOI":"10.3390\/ma3114860"},{"key":"CIT0010","doi-asserted-by":"publisher","DOI":"10.1016\/j.materresbull.2014.09.055"},{"key":"CIT0011","doi-asserted-by":"publisher","DOI":"10.1111\/j.1551-2916.2009.03240.x"},{"key":"CIT0012","doi-asserted-by":"publisher","DOI":"10.1063\/1.1942635"},{"key":"CIT0013","doi-asserted-by":"publisher","DOI":"10.1063\/1.4927807"},{"key":"CIT0014","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/16\/11\/020"},{"key":"CIT0015","doi-asserted-by":"publisher","DOI":"10.1088\/0953-8984\/13\/39\/304"},{"key":"CIT0016","doi-asserted-by":"publisher","DOI":"10.1063\/1.2979973"},{"key":"CIT0017","doi-asserted-by":"publisher","DOI":"10.1063\/1.1331654"},{"key":"CIT0018","doi-asserted-by":"publisher","DOI":"10.1063\/1.118583"},{"key":"CIT0019","doi-asserted-by":"publisher","DOI":"10.1063\/1.4960137"},{"key":"CIT0020","doi-asserted-by":"publisher","DOI":"10.1063\/1.1593830"},{"key":"CIT0021","doi-asserted-by":"publisher","DOI":"10.1080\/10584589808208071"},{"key":"CIT0022","doi-asserted-by":"publisher","DOI":"10.1063\/1.2337009"},{"key":"CIT0023","doi-asserted-by":"publisher","DOI":"10.1063\/1.360231"},{"key":"CIT0024","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.7b02099"},{"key":"CIT0025","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-matsci-071312-121632"}],"container-title":["Ferroelectrics"],"original-title":[],"language":"en","link":[{"URL":"https:\/\/www.tandfonline.com\/doi\/pdf\/10.1080\/00150193.2018.1470821","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,3,14]],"date-time":"2019-03-14T15:25:21Z","timestamp":1552577121000},"score":1,"resource":{"primary":{"URL":"https:\/\/www.tandfonline.com\/doi\/full\/10.1080\/00150193.2018.1470821"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9,10]]},"references-count":25,"journal-issue":{"issue":"1","published-online":{"date-parts":[[2019,2,27]]},"published-print":{"date-parts":[[2018,9,10]]}},"alternative-id":["10.1080\/00150193.2018.1470821"],"URL":"https:\/\/doi.org\/10.1080\/00150193.2018.1470821","relation":{},"ISSN":["0015-0193","1563-5112"],"issn-type":[{"type":"print","value":"0015-0193"},{"type":"electronic","value":"1563-5112"}],"subject":[],"published":{"date-parts":[[2018,9,10]]},"assertion":[{"value":"The publishing and review policy for this title is described in its Aims & Scope.","order":1,"name":"peerreview_statement","label":"Peer Review Statement"},{"value":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=gfer20","URL":"http:\/\/www.tandfonline.com\/action\/journalInformation?show=aimsScope&journalCode=gfer20","order":2,"name":"aims_and_scope_url","label":"Aim & Scope"},{"value":"2017-09-05","order":0,"name":"received","label":"Received","group":{"name":"publication_history","label":"Publication History"}},{"value":"2018-02-20","order":1,"name":"revised","label":"Revised","group":{"name":"publication_history","label":"Publication History"}},{"value":"2018-02-20","order":2,"name":"accepted","label":"Accepted","group":{"name":"publication_history","label":"Publication History"}},{"value":"2019-02-27","order":3,"name":"published","label":"Published","group":{"name":"publication_history","label":"Publication History"}}]}}