{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T11:20:54Z","timestamp":1767093654110,"version":"3.48.0"},"reference-count":25,"publisher":"IOP Publishing","issue":"1","license":[{"start":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T00:00:00Z","timestamp":1767052800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/"},{"start":{"date-parts":[[2025,12,30]],"date-time":"2025-12-30T00:00:00Z","timestamp":1767052800000},"content-version":"tdm","delay-in-days":0,"URL":"https:\/\/iopscience.iop.org\/info\/page\/text-and-data-mining"}],"content-domain":{"domain":["iopscience.iop.org"],"crossmark-restriction":false},"short-container-title":["Nanotechnology"],"published-print":{"date-parts":[[2026,1,9]]},"abstract":"<jats:title>Abstract<\/jats:title>\n                  <jats:p>\n                    Tellurium (Te) has recently gained attention due to its unique one-dimensional helical chain crystal structure and promising optoelectronic and thermoelectric properties. In this study, we investigate the influence of substrate temperature (296 K\u2013326 K) on the structural and electrical characteristics of \u223c20\u202fnm Te films deposited via vacuum thermal evaporation on Si\/SiO\n                    <jats:sub>\u2082<\/jats:sub>\n                    substrates. Morphological analysis using atomic force microscopy and high-resolution transmission electron microscopy revealed correlation between the substrate temperature and the changes in the structure from trapezoidal to elongated stick-like features. X-ray diffraction and Raman spectroscopy demonstrated that the Te chains were predominantly oriented parallel to the substrate surface at\n                    <jats:italic>T<\/jats:italic>\n                    <jats:sub>S<\/jats:sub>\n                    = 326 K. The chain length and packing density were dependent on\n                    <jats:italic>T<\/jats:italic>\n                    <jats:sub>S<\/jats:sub>\n                    . Spatially resolved current-voltage measurements show a strong temperature-dependent decrease of the in-plane charge transport, whereas higher-temperature films were characterized by an increased lateral resistance. Scanning Kelvin probe microscopy measurements further reveal surface potential differences of \u223c0.6\u202fV between samples. These results demonstrate that small variations in substrate temperature can significantly modulate nanoscale morphology and electrical transport, providing a route to engineer Te-based thin-film devices with tailored performance.\n                  <\/jats:p>","DOI":"10.1088\/1361-6528\/ae2a3f","type":"journal-article","created":{"date-parts":[[2025,12,9]],"date-time":"2025-12-09T22:48:08Z","timestamp":1765320488000},"page":"015602","update-policy":"https:\/\/doi.org\/10.1088\/crossmark-policy","source":"Crossref","is-referenced-by-count":0,"title":["Dependence of structure and electrical properties on growth temperature in PVD tellurium nano-thin films"],"prefix":"10.1088","volume":"37","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0275-9603","authenticated-orcid":true,"given":"Virginijus","family":"Bukauskas","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Viktorija","family":"Strazdien\u0117","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8418-2619","authenticated-orcid":true,"given":"Tomas","family":"Daugalas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Audru\u017eis","family":"Mironas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vladimir","family":"Astachov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4632-9229","authenticated-orcid":true,"given":"Graham J","family":"Hickman","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Dominic","family":"Eberl-Craske","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0018-5036","authenticated-orcid":true,"given":"Sandra","family":"Stanionyt\u0117","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vidas","family":"Pak\u0161tas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Martynas","family":"Talaikis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ar\u016bnas","family":"\u0160etkus","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"266","published-online":{"date-parts":[[2025,12,30]]},"reference":[{"key":"nanoae2a3fbib1","doi-asserted-by":"publisher","DOI":"10.1002\/adma.202408969","type":"journal-article","article-title":"Electronics and optoelectronics based on Tellurium","volume":"36","author":"Zha","year":"2024","journal-title":"Adv. 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Published by IOP Publishing Ltd","name":"copyright_information","label":"Copyright Information"},{"value":"2025-09-26","name":"date_received","label":"Date Received","group":{"name":"publication_dates","label":"Publication dates"}},{"value":"2025-12-09","name":"date_accepted","label":"Date Accepted","group":{"name":"publication_dates","label":"Publication dates"}},{"value":"2025-12-30","name":"date_epub","label":"Online publication date","group":{"name":"publication_dates","label":"Publication dates"}}]}}